Testing And Diagnosis Of Analog Circuits And Systems
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Testing And Diagnosis Of Analog Circuits And Systems
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Author : Ruey-wen Liu
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Testing And Diagnosis Of Analog Circuits And Systems written by Ruey-wen Liu and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.
IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.
Testing And Diagnosis Of Analog Circuits And Systems
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Author : 3Island Press
language : en
Publisher:
Release Date : 1991-04-30
Testing And Diagnosis Of Analog Circuits And Systems written by 3Island Press and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-04-30 with categories.
Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits
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Author : Yichuang Sun
language : en
Publisher: IET
Release Date : 2008-05-30
Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits written by Yichuang Sun and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-05-30 with Technology & Engineering categories.
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Fault Diagnosis Of Analog Integrated Circuits
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Author : Prithviraj Kabisatpathy
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-11-07
Fault Diagnosis Of Analog Integrated Circuits written by Prithviraj Kabisatpathy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-11-07 with Technology & Engineering categories.
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Lecture Notes In Analog Electronics
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Author : Vančo B. Litovski
language : en
Publisher: Springer Nature
Release Date : 2025-01-17
Lecture Notes In Analog Electronics written by Vančo B. Litovski and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-01-17 with Technology & Engineering categories.
Prof. Vančo Litovski was born in 1947 in Rakita, South Macedonia, Greece. He graduated from the Faculty of Electronic Engineering in Niš in 1970 and obtained his M.Sc. in 1974 and his Ph.D. in 1977. He was appointed as a teaching assistant at the Faculty of Electronic Engineering in 1970 and became a full professor at the same faculty in 1987. He was elected as a visiting professor (honoris causa) at the University of Southampton in 1999. From 1987 until 1990, he was a consultant to the CEO of Ei and was the head of the Chair of Electronics at the Faculty of Electronic Engineering in Niš for 12 years. From 2015 to 2017, he was a researcher at the University of Bath.. He received several awards including from the Faculty of Electronic Engineering (Charter in 1980, Charter in 1985, and a Special Recognition in 1995) and the University of Niš (Plaque 1985).
Dsp Based Testing Of Analog And Mixed Signal Circuits
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Author : Matthew Mahoney
language : en
Publisher: John Wiley & Sons
Release Date : 1987-05-11
Dsp Based Testing Of Analog And Mixed Signal Circuits written by Matthew Mahoney and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987-05-11 with Science categories.
Answers the commonly asked questions about how digital signal processing-based machines work and what role DSP plays in the process. It shows you how DSP performs in real-test situations and uses mathematical concepts rather than derivations. The text addresses difficult test problems and their solutions resulting from the union of automatic test equipment (ATE) and DSP. The author establishes a philosophy of DSP-based testing describing how to think, how to approach a problem, how to create a solution, and how to determine if it really works properly.
Fault Diagnosis Of Analog Integrated Circuits
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Author : Prithviraj Kabisatpathy
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-01-13
Fault Diagnosis Of Analog Integrated Circuits written by Prithviraj Kabisatpathy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-13 with Technology & Engineering categories.
System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort. Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
Computer Aided Design Of Analog Integrated Circuits And Systems
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Author : Rob A. Rutenbar
language : en
Publisher: John Wiley & Sons
Release Date : 2002-05-06
Computer Aided Design Of Analog Integrated Circuits And Systems written by Rob A. Rutenbar and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-05-06 with Technology & Engineering categories.
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Research Perspectives And Case Studies In System Test And Diagnosis
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Author : John W. Sheppard
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Research Perspectives And Case Studies In System Test And Diagnosis written by John W. Sheppard and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
"System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is ¿any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail . System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the same problems and occasional disagreement between authors as to definitions or the importance of factors. ... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge ofthat science...”. From the Preface
Ieee Transactions On Circuits And Systems
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Author :
language : en
Publisher:
Release Date : 2005
Ieee Transactions On Circuits And Systems written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with Electric circuits categories.