Research Perspectives And Case Studies In System Test And Diagnosis

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Research Perspectives And Case Studies In System Test And Diagnosis

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Author : John W. Sheppard
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Research Perspectives And Case Studies In System Test And Diagnosis written by John W. Sheppard and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

"System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is ¿any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail . System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the same problems and occasional disagreement between authors as to definitions or the importance of factors. ... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge ofthat science...”. From the Preface

Intelligent Knowledge Based Systems

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Author : Cornelius T. Leondes
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-04-28

Intelligent Knowledge Based Systems written by Cornelius T. Leondes and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-04-28 with Computers categories.

For most of our history the wealth of a nation was limited by the size and stamina of the work force. Today, national wealth is measured in intellectual capital. Nations possessing skillful people in such diverse areas as science, medicine, business, and engineering produce innovations that drive the nation to a higher quality of life. To better utilize these valuable resources, intelligent, knowledge-based systems technology has evolved at a rapid and significantly expanding rate. Reflecting the most fascinating AI-based research and its broad practical applications, intelligent, knowledge-based systems technology is being utilized by nations to improve their medical care, advance their engineering technology, and increase their manufacturing productivity, as well as play a significant role in a very wide variety of other areas of activity of substantive significance. Today, in the beginning of the 21st century, it is difficult to imagine the development of the modern world without extensive use of the AI information technology that is rapidly transforming the global, knowledge- based economy as well as entire societies. The breadth of the major application areas of intelligent, knowledge-based systems technology is very impressive. These include, among other areas: Agriculture, Business, Chemistry, Communications, Computer Systems, Education, Electronics, Engineering, Environment, Geology, Image Processing, Information Management, Law, Manufacturing, Mathematics, Medicine, Meteorology, Military, Mining, Power Systems, Science, Space Technology, and Transportation. The great breadth and expanding significance of this field on the international scene require a multi-volume, major reference work for an adequately substantive treatment of the subject, "Intelligent Knowledge-Based Systems: Business and Technology in The New Millennium." This work consists of the following distinctly titled and well integrated volumes. Volume I. Knowledge-Based Systems; Volume II. Information Technology; Volume III.Expert and Agent Systems; Volume IV.Intelligent Systems; Volume V.Neural Networks. This five-volume set clearly manifests the great significance of these key technologies for the new economies of the new millennium. The Volumes: Volume 1, Knowledge-Based Systems, addresses the basic question of how accumulated data and staff expertise from business operations can be abstracted into useful knowledge, and how such knowledge can be applied to ongoing operations. The wide range of areas represented includes product innovation and design, intelligent database exploitation, and business model analysis. (Eleven chapters) Volume 2, Information Technology, addresses the important question of how data should be stored and used to maximize its overall value. Case studies examine a wide variety of application areas including product development, manufacturing, product management, and product pricing. (Ten chapters) Volume 3, Expert and Agent Systems, considers such application areas as image databases, business process monitoring, e-commerce, and production planning and scheduling, offering a wide range of perspectives and business-function concentrations to stimulate readers' innovative thought. (Ten chapters) Volume 4, Intelligent Systems, discusses applications in such areas as mission-critical functions, business forecasting, medical patient care, and product design and development. (Nine chapters) Volume 5, Neural Networks, Fuzzy Theory, and Genetic Algorithm Techniques, explores applications in such areas as bioinformatics, product life-cycle cost estimating, product development, computer-aided design, product assembly, and facility location. (Ten chapters) The discussions in these volumes provide a wealth of practical ideas intended to foster innovation in thought and, consequently, in the further development of technology. Together, they comprise a significant and uniquely comprehensive reference source for research workers, practitioners, computer scientists, academics, students, and others on the international scene for years to come.

Embedded Processor Based Self Test

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Author : Dimitris Gizopoulos
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09

Embedded Processor Based Self Test written by Dimitris Gizopoulos and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Computers categories.

Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.

Introduction To Advanced System On Chip Test Design And Optimization

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Author : Erik Larsson
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-03-30

Introduction To Advanced System On Chip Test Design And Optimization written by Erik Larsson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-03-30 with Technology & Engineering categories.

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Boundary Scan Interconnect Diagnosis

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Author : José T. de Sousa
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-28

Boundary Scan Interconnect Diagnosis written by José T. de Sousa and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-28 with Technology & Engineering categories.

Boundary-Scan Interconnect Diagnosis explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. Its importance has to do with designing complex electronic systems using pre-designed intellectual property (IP) cores, which is becoming increasingly popular nowadays. Since tests for pre-designed cores can be supplied with the cores themselves, the only additional tests that need to be developed to test and diagnose the entire system are those for wire interconnects between the cores. Besides the trivial solutions that are often used to solve this problem, there are many more methods that enable significant optimizations of test vector length and/or diagnostic resolution. The book surveys all existing methods of this kind and proposes new ones. In the new approach circuit and interconnect faults are carefully modeled, and graph techniques are applied to solve the problem. The original feature of the new method is the fact that it can be adjusted to provide shorter test sequences and/or greater diagnostic resolution. The effectiveness of existing and proposed methods is then evaluated using real electronic assemblies and published statistical data for an actual manufacturing process from HP.

Soc System On A Chip Testing For Plug And Play Test Automation

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Author : Krishnendu Chakrabarty
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17

Soc System On A Chip Testing For Plug And Play Test Automation written by Krishnendu Chakrabarty and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Technology & Engineering categories.

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Verification By Error Modeling

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Author : Katarzyna Radecka
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-17

Verification By Error Modeling written by Katarzyna Radecka and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-17 with Technology & Engineering categories.

1. DESIGN FLOW Integrated circuit (IC) complexity is steadily increasing. ICs incorporating hundreds of millions of transistors, mega-bit memories, complicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be “imminently doable” by Intel fellow J. Crawford at Microprocessor Forum in October 2002 [40]. Obviously, designing such complex circuits poses real challenges to engineers. Certainly, no relief comes from the competitive marketplace, with increasing demands for a very narrow window of time (time-to-market) in engineering a ready product. Therefore, a systematic and well-structured approach to designing ICs is a must. Although there are no widely adhered standards for a design flow, most companies have their own established practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefully specified. Ideally, these parameters would not change during the design process. In practice, initial phases of preparing a design specification are susceptible to potential errors, as it is very difficult to grasp all the details in a complex design.

Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits

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Author : M. Bushnell
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11

Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits written by M. Bushnell and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Test Resource Partitioning For System On A Chip

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Author : Vikram Iyengar
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Test Resource Partitioning For System On A Chip written by Vikram Iyengar and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic. SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume. Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.

Fault Injection Techniques And Tools For Embedded Systems Reliability Evaluation

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Author : Alfredo Benso
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-15

Fault Injection Techniques And Tools For Embedded Systems Reliability Evaluation written by Alfredo Benso and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-15 with Technology & Engineering categories.

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance.