Thermal Resistance Measurements On Power Transistors
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Thermal Resistance Measurements On Power Transistors
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Author : Sherwin Rubin
language : en
Publisher:
Release Date : 1979
Thermal Resistance Measurements On Power Transistors written by Sherwin Rubin and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with Power transistors categories.
Thermal Resistance Measurements On Power Transistors
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Author : Sherwin Rubin
language : en
Publisher:
Release Date : 1979
Thermal Resistance Measurements On Power Transistors written by Sherwin Rubin and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with Power transistors categories.
Nbs Special Publication
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Author :
language : en
Publisher:
Release Date : 1979
Nbs Special Publication written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with Weights and measures categories.
Safe Operating Area Limits For Power Transistors
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Author : David L. Blackburn
language : en
Publisher:
Release Date : 1977
Safe Operating Area Limits For Power Transistors written by David L. Blackburn and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1977 with Power transistors categories.
A Technique For Measuring The Surface Temperature Of Transistors By Means Of Fluorescent Phosphor
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Author : David J. Brenner
language : en
Publisher:
Release Date : 1971
A Technique For Measuring The Surface Temperature Of Transistors By Means Of Fluorescent Phosphor written by David J. Brenner and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1971 with Transistors categories.
Theory And Practice Of Thermal Transient Testing Of Electronic Components
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Author : Marta Rencz
language : en
Publisher: Springer Nature
Release Date : 2023-01-23
Theory And Practice Of Thermal Transient Testing Of Electronic Components written by Marta Rencz and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-01-23 with Technology & Engineering categories.
This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book presents the theoretical background of creating structure functions from the measured results with mathematical details. It then shows how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and calibrating simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The particular problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide bandgap materials, and LEDs, are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.
Nbs Special Publication
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Author :
language : en
Publisher:
Release Date : 1964
Nbs Special Publication written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1964 with Cast-iron categories.
Methods Of Measurement For Semiconductor Materials Process Control And Devices
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Author : United States. National Bureau of Standards
language : en
Publisher:
Release Date : 1973
Methods Of Measurement For Semiconductor Materials Process Control And Devices written by United States. National Bureau of Standards and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1973 with Semiconductors categories.
Junction To Case Thermal Resistance Of A Silicon Carbide Bipolar Junction Transistor Measured
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Author : National Aeronautics and Space Administration (NASA)
language : en
Publisher: Createspace Independent Publishing Platform
Release Date : 2018-06-24
Junction To Case Thermal Resistance Of A Silicon Carbide Bipolar Junction Transistor Measured written by National Aeronautics and Space Administration (NASA) and has been published by Createspace Independent Publishing Platform this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-06-24 with categories.
Junction temperature of a prototype SiC-based bipolar junction transistor (BJT) was estimated by using the base-emitter voltage (V(sub BE)) characteristic for thermometry. The V(sub BE) was measured as a function of the base current (I(sub B)) at selected temperatures (T), all at a fixed collector current (I(sub C)) and under very low duty cycle pulse conditions. Under such conditions, the average temperature of the chip was taken to be the same as that of the temperature-controlled case. At increased duty cycle such as to substantially heat the chip, but same I(sub C) pulse height, the chip temperature was identified by matching the V(sub BE) to the thermometry curves. From the measured average power, the chip-to-case thermal resistance could be estimated, giving a reasonable value. A tentative explanation for an observed bunching with increasing temperature of the calibration curves may relate to an increasing dopant atom ionization. A first-cut analysis, however, does not support this. Niedra, Janis M. Glenn Research Center NASA/CR-2006-214258, E-15541
Catalog Of National Bureau Of Standards Publications 1966 1976 Citations And Abstracts
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Author :
language : en
Publisher:
Release Date : 1978
Catalog Of National Bureau Of Standards Publications 1966 1976 Citations And Abstracts written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Government publications categories.