Towards An Unambiguous Electron Magnetic Chiral Dichroism Emcd Measurement In A Transmission Electron Microscope Tem
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Towards An Unambiguous Electron Magnetic Chiral Dichroism Emcd Measurement In A Transmission Electron Microscope Tem
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Author : Christian Hurm
language : en
Publisher: Logos Verlag Berlin GmbH
Release Date : 2009
Towards An Unambiguous Electron Magnetic Chiral Dichroism Emcd Measurement In A Transmission Electron Microscope Tem written by Christian Hurm and has been published by Logos Verlag Berlin GmbH this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with Science categories.
The intention of the ChiralTEM project (2004-2007) was the detection of electron (energy loss) magnetic chiral dichroism in a transmission electron microscope (TEM), in analogy to X-ray magnetic circular dichroism (XMCD). For the experiments, single-crystal electron transparent specimen's with magnetic induction perpendicular to the specimen's plane are required. In this thesis, different preparation techniques are evaluated regarding their usability to produce ideal specimen's for a verification of EMCD. After the demonstration of a dichroic measurement, an obvious way to prove the chiral effect is to invert the specimen's magnetization from parallel to antiparallel to the electron beam trajectory, leaving all other parameters of the experimental setup unchanged. For this case, one would - according to theory - expect a change in the dichroic signal measured. In the magnetic field of the objective lens of a 300kV TEM, typical ferromagnetic specimens will be close to saturation perpendicular to the specimen's plane. Reversing the current through the coils of the objective lens will then simply invert the magnetization of the specimen. In consequence, any magnetic chiral effect is expected to change sign. A switching unit for Tecnai microscopes has been constructed for save commutation of the lens currents. The direct sensitivity of the dichroic signal to the direction of the magnetization gives evidence to the magnetic origin of the effect.
Deutsche Nationalbibliographie Und Bibliographie Der Im Ausland Erschienenen Deutschsprachigen Ver Ffentlichungen
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Author :
language : de
Publisher:
Release Date : 2009
Deutsche Nationalbibliographie Und Bibliographie Der Im Ausland Erschienenen Deutschsprachigen Ver Ffentlichungen written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with German literature categories.
Linear And Chiral Dichroism In The Electron Microscope
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Author : Peter Schattschneider
language : en
Publisher: CRC Press
Release Date : 2012-03-01
Linear And Chiral Dichroism In The Electron Microscope written by Peter Schattschneider and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-03-01 with Science categories.
This book describes energy loss magnetic chiral dichroism (EMCD), a phenomenon in energy loss spectroscopy discovered in 2006. EMCD is the equivalent of XMCD but is based on fast probe electrons in the electron microscope. A spatial resolution of 2 nm has been demonstrated, and the lattice-resolved mapping of atomic spins appears feasible. EMCD is,
Transmission Electron Microscopy Techniques For Characterization Of Perpendicular Magnetic Recording Media Nanostructures
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Author : Faraz Hossein-Babaei
language : en
Publisher:
Release Date : 2013
Transmission Electron Microscopy Techniques For Characterization Of Perpendicular Magnetic Recording Media Nanostructures written by Faraz Hossein-Babaei and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with categories.
The hard disk drive technology is well-established now as a multi-billion dollar industry. Ever since the advent of hard disk magnetic recording media for computers in the 1950's, their data storage density has been increasing at an exponential rate in response to the growing need for memory storage space. Data in bits of 0 and 1 is written in the magnetic layer (ML) of perpendicular magnetic recording (PMR) media in blocks of effectively uniform magnetizations in hexagonal closed-packed (HCP) structure Co-rich magnetic grains (separated by a nonmagnetic intergranular phase) in directions perpendicular to the disk surface. While the densely packed grains are randomly positioned across the ML as fabricated, the magnetization blocks are written in precisely addressed locations along tracks using the write pole of the read/write head of the memory device. The magnetic nanocrystals form the medium for the writing of information. Obtaining a desirable nanostructure in the ML is of critical importance to the performance of the device. In order to reduce the physical bit size, the ML grain size has been trimmed down over time to maintain a desired signal-to-noise ratio. This progress has been supported by research focused on characterizing the grain structure in terms of size and size distribution. The ML nanostructure must be studied at the nanoscale to facilitate further reduction of the bit size. The transmission electron microscope (TEM) is the ideal tool for examining the nanoscale features of the PMR media. In this work, the TEM was utilized to develop techniques for the study, at the atomic scale, of key structural features of the PMR media which had not been experimentally examined before. The structural and crystallographic correlations between the grains of the ML and its RU seed layer were identified experimentally by observing the two layer structures simultaneously using the energy dispersive spectrometry technique -- a method of studying the chemical constituents of each layer with a scanning TEM technique. This study revealed the one-to-one grain structure relationship. The crystallographic relationship between the nanocrystals in the two layers was identified by analysing the observed Moiré fringes in TEM images. In addition, clusters of grains with common crystallographic orientations in the ML were identified using a novel 2 1/2 dimensional dark field imaging technique previously used to study crystal orientations in physical polycrystalline material systems. Furthermore, through the use of a spherical-aberration-corrected TEM, key structural features of the ML with potential consequences in the performance of the device were revealed at the atomic scale. This revelation was achieved by eliminating the delocalization effect resulting from the objective lens spherical aberration by which, in conventional TEM images, the lattice fringes are extended beyond the crystal boundaries. The newly observed features include the nanocrystalline bridges connecting neighboring magnetic grains through the amorphous intergranular phase and faceting of the grains along their prominent plane systems. Thus, the TEM is shown to be a powerful tool to study different structure-property relationships in these important materials. The results presented in this work are expected to contribute to the on-going efforts to increase the volume of information accommodated in more compact devices after the fine-scale structures observed using advanced microscopy are correlated with the magnetic properties of the device.
Transmission Electron Microscopy
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Author : David Bernard Williams
language : en
Publisher:
Release Date : 2009
Transmission Electron Microscopy written by David Bernard Williams and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with categories.
Electron Diffraction In The Transmission Electron Microscope
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Author : P.E. Champness
language : en
Publisher: Garland Science
Release Date : 2020-08-13
Electron Diffraction In The Transmission Electron Microscope written by P.E. Champness and has been published by Garland Science this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-08-13 with Science categories.
This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with the TEM. The numerous illustrations aid the understanding of the conclusions reached.
Nanometrology Using The Transmission Electron Microscope
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Author : Vlad Stolojan
language : en
Publisher: Morgan & Claypool Publishers
Release Date : 2015-10-12
Nanometrology Using The Transmission Electron Microscope written by Vlad Stolojan and has been published by Morgan & Claypool Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-10-12 with Technology & Engineering categories.
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
Transmission Electron Microscopy Of Semiconductor Nanostructures
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Author : Andreas Rosenauer
language : en
Publisher:
Release Date : 2014-01-15
Transmission Electron Microscopy Of Semiconductor Nanostructures written by Andreas Rosenauer and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-15 with categories.
Transmission Electron Microscopy In Micro Nanoelectronics
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Author : Alain Claverie
language : en
Publisher: John Wiley & Sons
Release Date : 2013-01-29
Transmission Electron Microscopy In Micro Nanoelectronics written by Alain Claverie and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-01-29 with Technology & Engineering categories.
Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs. This book presents in a simple and practical way the new quantitative techniques based on TEM which have recently been invented or developed to address most of the main challenging issues scientists and process engineers have to face to develop or optimize semiconductor layers and devices. Several of these techniques are based on electron holography; others take advantage of the possibility of focusing intense beams within nanoprobes. Strain measurements and mappings, dopant activation and segregation, interfacial reactions at the nanoscale, defect identification and specimen preparation by FIB are among the topics presented in this book. After a brief presentation of the underlying theory, each technique is illustrated through examples from the lab or fab.
Transmission Electron Microscopy And Diffractometry Of Materials
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Author : Brent Fultz
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-21
Transmission Electron Microscopy And Diffractometry Of Materials written by Brent Fultz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-21 with Science categories.
Aims and Scope of the Book This textbook was written for advanced un dergraduate students and beginning graduate students with backgrounds in physical science. Its goal is to acquaint them, as quickly as possible, with the central concepts and some details of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The topics in this book are developed to a level appropriate for most modern materials characterization research using TEM and XRD. There are, of course, many specialties that have attained a higher level of sophistication than presented here. The content of this book has been chosen in part to provide the background needed for a transition to these research specialties, or to other techniques such as neutron diffractometry. Although the book includes many practical details and examples, it does not cover some topics important for laboratory work. Perhaps the most obvious is the omission of specimen preparation methods for TEM. Beneath the details of principle and practice lies a larger goal of unifying the concepts common to both TEM and XRD. Coherence and wave interfer ence are conceptually similar for both x-ray waves and electron wavefunctions.