X Ray Absorption Spectroscopy For The Chemical And Materials Sciences

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X Ray Absorption Spectroscopy For The Chemical And Materials Sciences

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Author : John Evans
language : en
Publisher: John Wiley & Sons
Release Date : 2018-02-05

X Ray Absorption Spectroscopy For The Chemical And Materials Sciences written by John Evans and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-02-05 with Technology & Engineering categories.

A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage — providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies. A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy Features Questions to support learning through the book Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.

International Tables For Crystallography Volume I

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Author : Christopher Chantler
language : en
Publisher: John Wiley & Sons
Release Date : 2024-08-19

International Tables For Crystallography Volume I written by Christopher Chantler and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-08-19 with Science categories.

X-ray absorption spectroscopy and X-ray emission spectroscopy are complementary to crystallographic methods, particularly for materials science and the study of nanostructure and systems with partial disorder and partial local order, including solutions, gases, liquids, glasses and powders. This new volume of International Tables for Crystallography has nine parts and over 150 chapters contributed by a wide range of international experts. Part 1 provides a brief overview and introduction to the background of X-ray absorption spectroscopy (XAS) and experimental facilities. Part 2 discusses the quantum theory of XAS and related approaches. Part 3 describes both standard and advanced experimental methods used in XAS, X-ray emission spectroscopy (XES) and related techniques. Part 4 covers both standard and more advanced pre-processing of data. Part 5 gives an extensive overview of the analysis of experimental data. Part 6 provides details of the major software packages for data collection, reduction and analysis. Part 7 outlines the importance in science, reporting and hypothesis testing of the exchange of input and processed output data, and data deposition. It also presents excerpts of tables of data and supplementary material for XAS, pre-edge studies, X-ray absorption near-edge spectroscopy (XANES) and X-ray absorption fine structure (XAFS) studies. These tables are also available in full as online supporting information. Part 8 explores a wide range of applications of XAS in fields including materials science, physics, chemistry, biology, earth sciences, catalysis and cultural heritage. Part 9 presents definitions of the terms and quantities used, as developed by the International Union of Crystallography's Commission on XAFS. The volume has been written for the worldwide XAS community of thousands of practitioners, beamline scientists, experts and academics, and for the novice user who wishes to know what XAS and XES can do for them and how they may use these techniques for their particular purposes. The volume is therefore intended to be a self-contained, authoritative reference work that can also be used for training, learning or teaching, providing practical guidance for readers of all levels of experience. More information on the volumes in the series International Tables for Crystallography can be found at https://it.iucr.org.

X Ray Absorption And X Ray Emission Spectroscopy

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Author : Jeroen A. van Bokhoven
language : en
Publisher: John Wiley & Sons
Release Date : 2016-01-08

X Ray Absorption And X Ray Emission Spectroscopy written by Jeroen A. van Bokhoven and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-01-08 with Science categories.

During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X–ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X–ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials

X Ray Absorption Spectroscopy

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Author : Graham George
language : en
Publisher:
Release Date : 2019-10

X Ray Absorption Spectroscopy written by Graham George and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-10 with categories.

Targeted for chemists, the current textbook outlines the principles, experimental methods and data analysis in X-Ray Absorption Spectroscopy (XAS). The authors introduce EXAFS, Near-Edge XAS, X-Ray Imaging and many other advanced experimental techniques. A special section of the book is devoted to applications of XAS in chemistry, materials and environmental sciences.

Advances In X Ray Absorption Fine Structure Analysis

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Author : Zhongrui (jerry) Li
language : en
Publisher:
Release Date : 2020-11-15

Advances In X Ray Absorption Fine Structure Analysis written by Zhongrui (jerry) Li and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-15 with categories.

This book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD). This book may serve as a reference book for researchers and technicians taking up synchrotron radiation application research and postgraduates majoring in the X-ray absorption spectroscopy field. It will provide the beginners with all the necessary information in the field of XAFS. Also, experienced users active in particular subfields of XAFS spectroscopies will learn in this book about the enormous potential of XAFS for other applications in physics, chemistry, biology, materials science and engineering, geo- and environmental science, etc. For more details, please visit https: //centralwestpublishing.com s book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD).

Auger And X Ray Photoelectron Spectroscopy In Materials Science

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Author : Siegfried Hofmann
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-25

Auger And X Ray Photoelectron Spectroscopy In Materials Science written by Siegfried Hofmann and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-25 with Science categories.

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Spectroscopy For Materials Characterization

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Author : Simonpietro Agnello
language : en
Publisher: John Wiley & Sons
Release Date : 2021-08-23

Spectroscopy For Materials Characterization written by Simonpietro Agnello and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-08-23 with Technology & Engineering categories.

SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.

X Ray Absorption Spectroscopy Of Semiconductors

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Author : Claudia S. Schnohr
language : en
Publisher: Springer
Release Date : 2014-11-05

X Ray Absorption Spectroscopy Of Semiconductors written by Claudia S. Schnohr and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-11-05 with Technology & Engineering categories.

X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

X Rays In Nanoscience

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Author : Jinghua Guo
language : en
Publisher: John Wiley & Sons
Release Date : 2011-09-22

X Rays In Nanoscience written by Jinghua Guo and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-09-22 with Science categories.

An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world's top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging. The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.

Synchrotron Radiation Techniques In Industrial Chemical And Materials Science

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Author : Kevin L. D'Amico
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Synchrotron Radiation Techniques In Industrial Chemical And Materials Science written by Kevin L. D'Amico and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.

The individual papers that comprise this monograph are derived from two American Chemical Society (ACS) Fall National Meetings that focused on the current uses of synchrotron radiation (SR) research techniques. The first Symposium was held in Washington, DC, in August 1994, and the second convened in Chicago, IL, in August 1995. The intent of these symposia was to present a broad overview of several current topics in industrial, chemical, and materials-based SR research to a chemically inclined audience. The SR techniques covered were divided roughly into the three general fields of industrial, chemical, and materials science for this purpose. Included within these four categories are environmental, geologic, atomic/molecular, analytical, solid state physics, surface science, and biological applications of SR. There is little doubt that structural biology and environmental science are the largest growth areas in SR research as this monograph goes to press. The spirit of these symposia was to bring together the expert synchrotron radiation user with new and potential users of SR techniques. There are now a preponderance of particle storage rings, located throughout the world, devoted exclusively to the production of SR. There have been great improvements in the particle accelerators and storage rings from which SR emanates. These newest third generation SR sources are the result of the successful collaboration between SR users and accelerator physicists which has made a reality out of experiments never before possible.