X Ray Techniques For Advanced Materials Nanostructures And Thin Films From Laboratory Sources To Synchrotron Radiation
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X Ray Techniques For Advanced Materials Nanostructures And Thin Films From Laboratory Sources To Synchrotron Radiation
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Author : European Materials Research Society
language : en
Publisher:
Release Date : 2010
X Ray Techniques For Advanced Materials Nanostructures And Thin Films From Laboratory Sources To Synchrotron Radiation written by European Materials Research Society and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
X Ray Techniques For Advanced Materials Nanostructures And Thin Films
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Author :
language : en
Publisher:
Release Date : 2010
X Ray Techniques For Advanced Materials Nanostructures And Thin Films written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Materials categories.
X Ray Techniques For Advanced Materials Nanostructures And Thin Films From Laboratory Sources To Synchrotron Radiation
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Author : Federico Boscherini
language : en
Publisher:
Release Date : 2010
X Ray Techniques For Advanced Materials Nanostructures And Thin Films From Laboratory Sources To Synchrotron Radiation written by Federico Boscherini and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
X Ray Characterization Of Nanostructured Energy Materials By Synchrotron Radiation
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Author : Mehdi Khodaei
language : en
Publisher: BoD – Books on Demand
Release Date : 2017-03-22
X Ray Characterization Of Nanostructured Energy Materials By Synchrotron Radiation written by Mehdi Khodaei and has been published by BoD – Books on Demand this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-03-22 with Science categories.
Nowadays, nanomaterials are attracting huge attentions not only from a basic research point of view but also for their potential applications. Since finding the structure-property-processing relationships can open new windows in the application of materials, the material characterizations play a crucial role in the research and development of materials science. The increasing demand for energy with the necessity to find alternative renewable and sustainable energy sources leads to the rapid growth in attention to energy materials. In this book, the results of some outstanding researches on synchrotron-based characterization of nanostructured materials related to energy applications are presented.
Applications Of Synchrotron Radiation Techniques To Materials Science Iv Volume 524
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Author : Susan M. Mini
language : en
Publisher:
Release Date : 1998-08-17
Applications Of Synchrotron Radiation Techniques To Materials Science Iv Volume 524 written by Susan M. Mini and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-08-17 with Technology & Engineering categories.
The 57 papers update the status of characterization techniques that use synchrotron radiation since the previous symposium on the subject in the spring of 1996. The techniques considered include X-ray absorption and scattering, imaging, tomography, microscopy, and topographic methods. Among the materials are surfaces, interfaces, electronic materials, metal oxides, solar cells, thin films, carbides, polymers, alloys, nanoparticles, and graphitic materials. Some of the papers are doubled spaced. Annotation copyrighted by Book News, Inc., Portland, OR
X Rays And Materials
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Author : Philippe Goudeau
language : en
Publisher: John Wiley & Sons
Release Date : 2013-05-06
X Rays And Materials written by Philippe Goudeau and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-05-06 with Technology & Engineering categories.
This book presents reviews of various aspects of radiation/matter interactions, be these instrumental developments, the application of the study of the interaction of X-rays and materials to a particular scientific field, or specific methodological approaches. The overall aim of the book is to provide reference summaries for a range of specific subject areas within a pedagogical framework. Each chapter is written by an author who is well known within their field and who has delivered an invited lecture on their subject area as part of the “RX2009 – X-rays and Materials” colloquium that took place in December 2009 at Orsay in France. The book consists of five chapters on the subject of X-ray diffraction, scattering and absorption. Chapter 1 gives a detailed presentation of the capabilities and potential of beam lines dedicated to condensed matter studies at the SOLEIL synchrotron radiation source. Chapter 2 focuses on the study of nanoparticles using small-angle X-ray scattering. Chapter 3 discusses the quantitative studies of this scattering signal used to analyze these characteristics in detail. Chapter 4 discusses relaxor materials, which are ceramics with a particularly complex microstructure. Chapter 5 discusses an approach enabling the in situ analysis of these phase transitions and their associated microstructural changes.
High Resolution X Ray Scattering
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Author : Ullrich Pietsch
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
High Resolution X Ray Scattering written by Ullrich Pietsch and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Advanced X Ray Imaging Of Electrochemical Energy Materials And Devices
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Author : Jiajun Wang
language : en
Publisher: Springer Nature
Release Date : 2021-10-02
Advanced X Ray Imaging Of Electrochemical Energy Materials And Devices written by Jiajun Wang and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-10-02 with Technology & Engineering categories.
This book comprehensively outlines synchrotron-based X-ray imaging technologies and their associated applications in gaining fundamental insights into the physical and chemical properties as well as reaction mechanisms of energy materials. In this book the major X-ray imaging technologies utilised, depending on research goals and sample specifications, are discussed. With X-ray imaging techniques, the morphology, phase, lattice and strain information of energy materials in both 2D and 3D can be obtained in an intuitive way. In addition, due to the high penetration of X-rays, operando/in situ experiments can be designed to track the qualitative and quantitative changes of the samples during operation. This book will broader the reader’s view on X-ray imaging techniques and inspire new ideas and possibilities in energy materials research.
Advanced X Ray Characterization Techniques
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Author : Zainal Arifin Ahmad
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2012-12-13
Advanced X Ray Characterization Techniques written by Zainal Arifin Ahmad and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-13 with Technology & Engineering categories.
Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.
X Rays In Nanoscience
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Author : Jinghua Guo
language : en
Publisher: John Wiley & Sons
Release Date : 2011-09-22
X Rays In Nanoscience written by Jinghua Guo and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-09-22 with Science categories.
An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world's top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging. The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.