X Ray Techniques For Advanced Materials Nanostructures And Thin Films
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X Ray Techniques For Advanced Materials Nanostructures And Thin Films From Laboratory Sources To Synchrotron Radiation
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Author : European Materials Research Society
language : en
Publisher:
Release Date : 2010
X Ray Techniques For Advanced Materials Nanostructures And Thin Films From Laboratory Sources To Synchrotron Radiation written by European Materials Research Society and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
X Ray Techniques For Advanced Materials Nanostructures And Thin Films From Laboratory Sources To Synchrotron Radiation
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Author : Federico Boscherini
language : en
Publisher:
Release Date : 2010
X Ray Techniques For Advanced Materials Nanostructures And Thin Films From Laboratory Sources To Synchrotron Radiation written by Federico Boscherini and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
X Ray Techniques For Advanced Materials Nanostructures And Thin Films
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Author :
language : en
Publisher:
Release Date : 2010
X Ray Techniques For Advanced Materials Nanostructures And Thin Films written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Materials categories.
Advanced Characterization Of Nanostructured Materials Probing The Structure And Dynamics With Synchrotron X Rays And Neutrons
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Author : Sunil K Sinha
language : en
Publisher: World Scientific
Release Date : 2021-03-23
Advanced Characterization Of Nanostructured Materials Probing The Structure And Dynamics With Synchrotron X Rays And Neutrons written by Sunil K Sinha and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-03-23 with Science categories.
Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.
High Resolution X Ray Scattering
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Author : Ullrich Pietsch
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
High Resolution X Ray Scattering written by Ullrich Pietsch and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Recent Trends In Materials Science And Applications
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Author : Jeyasingh Ebenezar
language : en
Publisher: Springer
Release Date : 2017-05-04
Recent Trends In Materials Science And Applications written by Jeyasingh Ebenezar and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-05-04 with Science categories.
This book gathers the proceedings of the plenary sessions, invited lectures, and papers presented at the International Conference on Recent Trends in Materials Science and Applications (ICRTMSA-2016). It also features revealing presentations on various aspects of Materials Science, such as nanomaterials, photonic crystal fibers, quantum dots, thin film techniques, crystal growth, spectroscopic procedures, fabrication and characterisation of new materials / compounds with enhanced features, and potential applications in nonlinear optical and electro-optic devices, solar cell device, chemical sensing, biomedical imaging, diagnosis and treatment of cancer, energy storage device etc. This book will be of great interest to beginning and seasoned researchers alike.
Advanced X Ray Characterization Techniques
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Author : Zainal Arifin Ahmad
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2012-12-13
Advanced X Ray Characterization Techniques written by Zainal Arifin Ahmad and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-13 with Technology & Engineering categories.
Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.
Recent Developments In Thin Film Research Epitaxial Growth And Nanostructures Electron Microscopy And X Ray Diffraction
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Author : G. Ritter
language : en
Publisher: Elsevier Science
Release Date : 1998-08-26
Recent Developments In Thin Film Research Epitaxial Growth And Nanostructures Electron Microscopy And X Ray Diffraction written by G. Ritter and has been published by Elsevier Science this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-08-26 with Technology & Engineering categories.
The ICAM'97 symposium on "Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures" was presented at the combined 1997 International Conference on Applied Materials/European Materials Research Society Spring meeting (ICAM'97/E-MRS'97) held in Strasbourg (France) from 16-20 June 1997. . More than 60 participants representing 10 countries met to discuss the recent developments related to the study of crystalline structure of thin films: first stages of growth, morphology, strains and their relaxation. The aim of this symposium was to discuss the applications of both electron microscopy and X-ray diffraction in thin film studies. X-ray diffraction is a non-destructive method giving very accurate information in reciprocal space for the determination of crystalline data. Many of the contributions were concerned with following such growth processes such as epitaxy of metals and semiconducting materials, measuring the average strain and the structure and the morphology of the films. The electron microscopy investigations allow the study of microstructures and crystalline defects. The main handicap is the necessity for the destruction of the specimens. Electron microscopy is useful for studying the randomly distributed failures in periodicity of crystalline structures.
The Imaging Of Nanostructures With Novel X Ray Methods
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Author : Sebastian Dietze
language : en
Publisher:
Release Date : 2015
The Imaging Of Nanostructures With Novel X Ray Methods written by Sebastian Dietze and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015 with categories.
The use of x-rays to probe matter is an ever increasing popular technique due to their short wavelength that can achieve better than atomic resolution; chemical selectivity that permit the separation of material contributions; and tunable interaction strength allowing a wide class of materials to be probed including interfaced and bulk structures. As more powerful sources of x-rays have become available in the form of synchrotrons and linear accelerators, new and inventive experimental method have emerged to access the unknown. In this dissertation, three novel uses of x-rays are advanced to study a wide class materials. Since the next generation of x-ray sources will feature highly brilliant x-ray beams, they will enable the imaging of local nanoscale structures with unprecedented resolution. A general formalism to predict the achievable spatial resolution in coherent diffractive imaging (CDI), based solely on diffracted intensities, is provided. The coherent dose necessary to reach atomic resolution depends significantly on the atomic scale structure, where amorphous materials or disordered materials require less dose than crystalline materials. A reduction in dose can be larger than three-orders of magnitude as compared to the expected scaling for uniform density materials. Additionally, dose reduction for crystalline materials are predicted at certain resolutions based only on their unit cell dimensions and structure factors. An extension of dichroic coherent diffractive imaging of thin films with perpendicular magnetic anisotropy is made from a uniform case to one that contains charge contributions. With the use of linear polarized x-rays near resonant edges, the charge and magnetic scattering can be reconstructed. First, an approximate manual separation is made before reconstruction to obtain the magnetic domains of a Au patterned GdFe multilayer thin film. This is then compared to a direct reconstruction using the two coherent modes contributed by the right-hand and left-hand circular polarization. These methods lead to very similar results for the magnetic domain reconstruction, proving the viability of this technique. Thus, dichroic CDI may be applied to a much wider class of materials than was previously possible. Finally, persistent photocoductivity was induced during nano-diffraction. The resistivity of vanadium dioxide (VO2) decreased by over one-order of magnitude upon localized illumination with x-rays at room temperature. Despite this reduction, the structure remained in the monoclinic phase and had no signature of the high-temperature tetragonal phase that is usually associated with the lower resistance. Once illumination ceased, relaxation to the insulating state took tens of hours near room temperature. However, a full recovery of the insulating state was achieved within minutes by thermal cycling. This behavior is consistent with random local-potential fluctuations and random distribution of discrete recombination sites used to model residual photoconductivity.
Oxide Thin Films And Nanostructures
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Author : Falko P. Netzer
language : en
Publisher: Oxford University Press
Release Date : 2021-02-25
Oxide Thin Films And Nanostructures written by Falko P. Netzer and has been published by Oxford University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-02-25 with Science categories.
Nanostructured oxide materials - ultra-thin films, nanoparticles and other nanometer-scale objects - play prominent roles in many aspects of our every-day life, in nature and in technological applications, among which is the all-oxide electronics of tomorrow. Due to their reduced dimensions and dimensionality, they strongly interact with their environment: gaseous atmosphere, water or support. Their novel physical and chemical properties are the subject of this book, from both a fundamental and an applied perspective. Oxide Thin Films and Nanostructures reviews and illustrates the various methodologies for their growth, fabrication, experimental and theoretical characterization. The role of key parameters such as film thickness, nanoparticle size and support interactions in driving their fundamental properties is underlined. At the ultimate thickness limit, two-dimensional oxide materials are generated, whose functionalities and potential applications are described. The emerging field of cation mixing is mentioned, which opens new avenues for engineering many oxide properties, as witnessed by natural oxide nanomaterials such as clay minerals, which, beyond their role at the Earth's surface, are now widely used in a whole range of human activities. Oxide nanomaterials are involved in many interdisciplinary fields of advanced nanotechnologies. Catalysis, photocatalysis, solar energy materials, fuel cells, corrosion protection, and biotechnological applications are amongst the areas where they are making an impact. The book outlines prototypical examples. A cautious glimpse into future developments of scientific activity is finally ventured to round off the presentation.