A Practical Guide To Scanning Probe Microscopy


A Practical Guide To Scanning Probe Microscopy
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A Practical Guide To Scanning Probe Microscopy


A Practical Guide To Scanning Probe Microscopy
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Author : Rebecca Howland
language : en
Publisher:
Release Date : 1998-06

A Practical Guide To Scanning Probe Microscopy written by Rebecca Howland and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-06 with categories.


Provides basic information about scanning probe microscopes (SPMs), which are used in a wide variety of disciplines, including fundamental surface science, routine surface roughness analysis, & spectacular three-dimensional imaging -- from atoms of silicon to micron-sized protrusions on the surface of a living cell. Issues covered in this handbook range from fundamental physics of SPMs to their practical capabilities & instrumentation. Examples of applications are included throughout the text, & several application-specific articles are listed at the end of each chapter.



Scanning Probe Microscopy And Spectroscopy


Scanning Probe Microscopy And Spectroscopy
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Author : Roland Wiesendanger
language : en
Publisher: Cambridge University Press
Release Date : 1994-09-29

Scanning Probe Microscopy And Spectroscopy written by Roland Wiesendanger and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-09-29 with Science categories.


The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.



A Practical Guide To Transmission Electron Microscopy Volume Ii


A Practical Guide To Transmission Electron Microscopy Volume Ii
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Author : Zhiping Luo
language : en
Publisher:
Release Date : 2015-12-23

A Practical Guide To Transmission Electron Microscopy Volume Ii written by Zhiping Luo and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-12-23 with Technology & Engineering categories.


Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.



A Practical Guide To Transmission Electron Microscopy Advanced Microscopy


A Practical Guide To Transmission Electron Microscopy Advanced Microscopy
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Author : Zhiping Luo
language : en
Publisher:
Release Date : 2016

A Practical Guide To Transmission Electron Microscopy Advanced Microscopy written by Zhiping Luo and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with Transmission electron microscopy categories.




Scanning Probe Microscopy


Scanning Probe Microscopy
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Author : Laurene Tetard
language : en
Publisher: American Chemical Society
Release Date : 2023-05-22

Scanning Probe Microscopy written by Laurene Tetard and has been published by American Chemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-05-22 with Science categories.


Techniques of nanoscale functional imaging and spectroscopy have blossomed since the invention of scanning probe microscopy (SPM) tools, starting with scanning tunneling microscopy in the early 1980s. The ability to resolve topographical features with nanoscale—sometimes atomic—precision has revolutionized our understanding of molecules, matter, and living systems. These observations have led scientists to pose increasingly more complex questions about properties beyond morphology and their evolution upon external stimuli. Overall, SPM-based schemes provide versatile ways to probe structural, electrical, mechanical, and chemical properties of materials at the nanoscale. Getting started with SPM can be intimidating. This digital primer aims to provide undergraduate and graduate students majoring in various fields of science and engineering with a practical guide to grasp essential concepts and principles related to SPM image and spectra formation and their interpretation. This guide may also be helpful to researchers who are considering new ways of evaluating nanoscale properties of materials, devices, or living systems as applicable to their respective fields. Because of the extensive literature on the developments and applications of SPM, it was impossible to comprehensively cover all aspects of the field. Hence, deliberate choices were made to emphasize some techniques that have not been discussed as extensively in the literature but hold great promise to understand complex systems at the nanoscale.



Springer Handbook Of Experimental Solid Mechanics


Springer Handbook Of Experimental Solid Mechanics
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Author : William N. Sharpe, Jr.
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-12-04

Springer Handbook Of Experimental Solid Mechanics written by William N. Sharpe, Jr. and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-12-04 with Mathematics categories.


The Springer Handbook of Experimental Solid Mechanics documents both the traditional techniques as well as the new methods for experimental studies of materials, components, and structures. The emergence of new materials and new disciplines, together with the escalating use of on- and off-line computers for rapid data processing and the combined use of experimental and numerical techniques have greatly expanded the capabilities of experimental mechanics. New exciting topics are included on biological materials, MEMS and NEMS, nanoindentation, digital photomechanics, photoacoustic characterization, and atomic force microscopy in experimental solid mechanics. Presenting complete instructions to various areas of experimental solid mechanics, guidance to detailed expositions in important references, and a description of state-of-the-art applications in important technical areas, this thoroughly revised and updated edition is an excellent reference to a widespread academic, industrial, and professional engineering audience.



Scanning Probe Microscopy


Scanning Probe Microscopy
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Author : Ernst Meyer
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-14

Scanning Probe Microscopy written by Ernst Meyer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-14 with Science categories.


Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.



Scanning Probe Microscopes


Scanning Probe Microscopes
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Author : K. S. Birdi
language : en
Publisher: CRC Press
Release Date : 2003-02-26

Scanning Probe Microscopes written by K. S. Birdi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-02-26 with Science categories.


Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an



Scanning Probe Microscopy In Industrial Applications


Scanning Probe Microscopy In Industrial Applications
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Author : Dalia G. Yablon
language : en
Publisher: John Wiley & Sons
Release Date : 2013-10-24

Scanning Probe Microscopy In Industrial Applications written by Dalia G. Yablon and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-24 with Technology & Engineering categories.


Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.



Practical Guide To Surface Science And Spectroscopy


Practical Guide To Surface Science And Spectroscopy
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Author : Yip-Wah Chung
language : en
Publisher: Elsevier
Release Date : 2012-12-02

Practical Guide To Surface Science And Spectroscopy written by Yip-Wah Chung and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.


Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces. These techniques include auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy electron diffraction, scanning probe microscopy, and interfacial segregation. Understanding the behavior of materials at their surfaces is essential for materials scientists and engineers as they design and fabricate microelectronics and semiconductor devices. The book gives over 100 examples, discussion questions and problems with varying levels of difficulty. Included with this book is a CD-ROM, which not only contains the same information, but also provides many elements of animation and interaction that are not easily emulated on paper. In diverse subject matters ranging from the operation of ion pumps, computer-assisted data acquisition to tapping mode atomic force microscopy, the interactive component is especially helpful in conveying difficult concepts and retention of important information. The succinct style and organization of this practical guide is ideal for anyone who wants to get up to speed on a given topic in surface spectroscopy or phenomenon within a reasonable amount of time. Key Features * Both theory and practice are emphasized * Logical organization allows one to get up to speed on any given topic quickly * Numerous examples, questions for discussion and practice problems are included * The CD includes animation and interactive elements that help to convey difficult concepts