An Introduction To Logic Circuit Testing
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An Introduction To Logic Circuit Testing
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Author : Parag K. Lala
language : en
Publisher: Springer Nature
Release Date : 2022-06-01
An Introduction To Logic Circuit Testing written by Parag K. Lala and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-06-01 with Technology & Engineering categories.
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Digital Circuit Testing And Testability
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Author : Parag K. Lala
language : en
Publisher: Academic Press
Release Date : 1997
Digital Circuit Testing And Testability written by Parag K. Lala and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with Computers categories.
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Introduction To Iddq Testing
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Author : S. Chakravarty
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Introduction To Iddq Testing written by S. Chakravarty and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Timing Performance Of Nanometer Digital Circuits Under Process Variations
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Author : Victor Champac
language : en
Publisher: Springer
Release Date : 2018-04-18
Timing Performance Of Nanometer Digital Circuits Under Process Variations written by Victor Champac and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-04-18 with Technology & Engineering categories.
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.
Network And Parallel Computing
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Author : James J. Park
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-09
Network And Parallel Computing written by James J. Park and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-09 with Computers categories.
This book constitutes the refereed post-proceedings of the 9th IFIP International Conference on Network and Parallel Computing, NPC 2012, held in Gwangju, Korea, in September 2012. The 38 papers presented were carefully reviewed and selected from 136 submissions. The papers are organized in the following topical sections: algorithms, scheduling, analysis, and data mining; network architecture and protocol design; network security; paralel, distributed, and virtualization techniques; performance modeling, prediction, and tuning; resource management; ubiquitous communications and networks; and web, communication, and cloud computing. In addition, a total of 37 papers selected from five satellite workshops (ATIMCN, ATSME, Cloud&Grid, DATICS, and UMAS 2012) are included.
Dependable Multicore Architectures At Nanoscale
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Author : Marco Ottavi
language : en
Publisher: Springer
Release Date : 2017-08-28
Dependable Multicore Architectures At Nanoscale written by Marco Ottavi and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-08-28 with Technology & Engineering categories.
This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.
Integrated Circuit Test Engineering
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Author : Ian A. Grout
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-08-22
Integrated Circuit Test Engineering written by Ian A. Grout and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-08-22 with Technology & Engineering categories.
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Introduction To Logic Circuits Logic Design With Vhdl
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Author : Brock J. LaMeres
language : en
Publisher: Springer
Release Date : 2018-06-15
Introduction To Logic Circuits Logic Design With Vhdl written by Brock J. LaMeres and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-06-15 with Technology & Engineering categories.
This textbook introduces readers to the fundamental hardware used in modern computers. The only pre-requisite is algebra, so it can be taken by college freshman or sophomore students or even used in Advanced Placement courses in high school. This book presents both the classical approach to digital system design (i.e., pen and paper) in addition to the modern hardware description language (HDL) design approach (computer-based). This textbook enables readers to design digital systems using the modern HDL approach while ensuring they have a solid foundation of knowledge of the underlying hardware and theory of their designs. This book is designed to match the way the material is actually taught in the classroom. Topics are presented in a manner which builds foundational knowledge before moving onto advanced topics. The author has designed the content with learning goals and assessment at its core. Each section addresses a specific learning outcome that the learner should be able to “do” after its completion. The concept checks and exercise problems provide a rich set of assessment tools to measure learner performance on each outcome. This book can be used for either a sequence of two courses consisting of an introduction to logic circuits (Chapters 1-7) followed by logic design (Chapters 8-13) or a single, accelerated course that uses the early chapters as reference material.
Microelectronics Failure Analysis
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Author : EDFAS Desk Reference Committee
language : en
Publisher: ASM International
Release Date : 2011
Microelectronics Failure Analysis written by EDFAS Desk Reference Committee and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with Technology & Engineering categories.
Includes bibliographical references and index.
Integrated Circuit Test Engineering
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Author : Ian A. Grout
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-08
Integrated Circuit Test Engineering written by Ian A. Grout and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-08 with Technology & Engineering categories.
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively