Timing Performance Of Nanometer Digital Circuits Under Process Variations
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Timing Performance Of Nanometer Digital Circuits Under Process Variations
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Author : Victor Champac
language : en
Publisher: Springer
Release Date : 2018-04-18
Timing Performance Of Nanometer Digital Circuits Under Process Variations written by Victor Champac and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-04-18 with Technology & Engineering categories.
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.
Lifetime Reliability Aware Design Of Integrated Circuits
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Author : Mohsen Raji
language : en
Publisher: Springer Nature
Release Date : 2022-11-16
Lifetime Reliability Aware Design Of Integrated Circuits written by Mohsen Raji and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-11-16 with Technology & Engineering categories.
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Process Variations And Probabilistic Integrated Circuit Design
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Author : Manfred Dietrich
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-11-20
Process Variations And Probabilistic Integrated Circuit Design written by Manfred Dietrich and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-11-20 with Technology & Engineering categories.
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Analog Ic Reliability In Nanometer Cmos
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Author : Elie Maricau
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-01-11
Analog Ic Reliability In Nanometer Cmos written by Elie Maricau and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-01-11 with Technology & Engineering categories.
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Low Power Variation Tolerant Design In Nanometer Silicon
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Author : Swarup Bhunia
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-11-10
Low Power Variation Tolerant Design In Nanometer Silicon written by Swarup Bhunia and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-11-10 with Technology & Engineering categories.
Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.
Analysis And Design Of Resilient Vlsi Circuits
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Author : Rajesh Garg
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-10-22
Analysis And Design Of Resilient Vlsi Circuits written by Rajesh Garg and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-10-22 with Technology & Engineering categories.
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Integrated Circuit And System Design Power And Timing Modeling Optimization And Simulation
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Author : Johan Vounckx
language : en
Publisher: Springer
Release Date : 2006-09-07
Integrated Circuit And System Design Power And Timing Modeling Optimization And Simulation written by Johan Vounckx and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-09-07 with Computers categories.
This book constitutes the refereed proceedings of the 16th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2006. The book presents 41 revised full papers and 23 revised poster papers together with 4 key notes and 3 industrial abstracts. Topical sections include high-level design, power estimation and modeling memory and register files, low-power digital circuits, busses and interconnects, low-power techniques, applications and SoC design, modeling, and more.
Protecting Chips Against Hold Time Violations Due To Variability
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Author : Gustavo Neuberger
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-10-01
Protecting Chips Against Hold Time Violations Due To Variability written by Gustavo Neuberger and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-01 with Technology & Engineering categories.
With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasingly important and is a very important issue in the design of complex circuits. Process variability is the statistical variation of process parameters, meaning that these parameters do not have always the same value, but become a random variable, with a given mean value and standard deviation. This effect can lead to several issues in digital circuit design. The logical consequence of this parameter variation is that circuit characteristics, as delay and power, also become random variables. Because of the delay variability, not all circuits will now have the same performance, but some will be faster and some slower. However, the slowest circuits may be so slow that they will not be appropriate for sale. On the other hand, the fastest circuits that could be sold for a higher price can be very leaky, and also not very appropriate for sale. A main consequence of power variability is that the power consumption of some circuits will be different than expected, reducing reliability, average life expectancy and warranty of products. Sometimes the circuits will not work at all, due to reasons associated with process variations. At the end, these effects result in lower yield and lower profitability. To understand these effects, it is necessary to study the consequences of variability in several aspects of circuit design, like logic gates, storage elements, clock distribution, and any other that can be affected by process variations. The main focus of this book will be storage elements.
Analysis And Design Of Networks On Chip Under High Process Variation
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Author : Rabab Ezz-Eldin
language : en
Publisher: Springer
Release Date : 2015-12-16
Analysis And Design Of Networks On Chip Under High Process Variation written by Rabab Ezz-Eldin and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-12-16 with Technology & Engineering categories.
This book describes in detail the impact of process variations on Network-on-Chip (NoC) performance. The authors evaluate various NoC topologies under high process variation and explain the design of efficient NoCs, with advanced technologies. The discussion includes variation in logic and interconnect, in order to evaluate the delay and throughput variation with different NoC topologies. The authors describe an asynchronous router, as a robust design to mitigate the impact of process variation in NoCs and the performance of different routing algorithms is determined with/without process variation for various traffic patterns. Additionally, a novel Process variation Delay and Congestion aware Routing algorithm (PDCR) is described for asynchronous NoC design, which outperforms different adaptive routing algorithms in the average delay and saturation throughput for various traffic patterns.
The Newcom Vision Book
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Author : Sergio Benedetto
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-04-07
The Newcom Vision Book written by Sergio Benedetto and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-04-07 with Technology & Engineering categories.
The Book contains the Vision of the researchers of the European Network of Excellence NEWCOM++ (Network of Excellence on Wireless COMmunication) on the present and future status of Wireless Communication Networks. In its content, the community of NEWCOM++ researchers, shaped under the common ground of a mainly academic network of excellence, have distilled their scientific wisdom in a number of areas characterized by the common denominator of wireless communications, by identifying the medium-long term research tendencies/problems, describing the tools to face them and providing a relatively large number of references for the interested reader. The identified areas and the researchers involved in their redaction reflect the intersection of the major topics in wireless communications with those that are deeply investigated in NEWCOM++; they are preceded by an original description of the main trends in user/society needs and the degree of fulfilment that ongoing and future wireless communications standards will more likely help achieving. The appendix of the Book contains a list of "Millenium Problems", seminal problems in the area of wireless communication networks, characterized by being crucial and still unsolved. The problems have been identified by NEWCOM++ researchers and filtered by the editors of the Vision Book.