Analog And Mixed Signal Boundary Scan
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Analog And Mixed Signal Boundary Scan
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Author : Adam Osseiran
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Analog And Mixed Signal Boundary Scan written by Adam Osseiran and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.
This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.
The Boundary Scan Handbook
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Author : Kenneth P. Parker
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
The Boundary Scan Handbook written by Kenneth P. Parker and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Later that summer, in record time, the standard won ratification as an ANSI standard as well. This completed over six years of intensive cooperative effort by a diverse group of people who share a vision on solving some of the severe testing problems that exist now and are steadily getting worse. Early in this process, someone asked me if 1 thought that the P1l49.l effort would ever bear fruit. 1 responded somewhat glibly that "it was anyone's guess". Well, it wasn't anyone's guess, but rather the faith of a few individuals in the proposition that many testing problems could be solved if a multifaceted industry could agree on a standard for all to follow. Four of these individuals stand out; they are Harry Bleeker, Colin Maunder, Rodham Tulloss, and Lee Whetsel. In that I am convinced that the 1149.1 standard is the most significant testing development in the last 20 years, I personally feel a debt of gratitude to them and all the people who labored on the various Working Groups in its creation.
Test And Design For Testability In Mixed Signal Integrated Circuits
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Author : Jose Luis Huertas Díaz
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-02-23
Test And Design For Testability In Mixed Signal Integrated Circuits written by Jose Luis Huertas Díaz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-02-23 with Technology & Engineering categories.
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Vlsi Test Principles And Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Elsevier
Release Date : 2006-08-14
Vlsi Test Principles And Architectures written by Laung-Terng Wang and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-08-14 with Technology & Engineering categories.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Mixed Signal Circuits
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Author : Thomas Noulis
language : en
Publisher: CRC Press
Release Date : 2018-09-03
Mixed Signal Circuits written by Thomas Noulis and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-09-03 with Technology & Engineering categories.
Mixed-Signal Circuits offers a thoroughly modern treatment of integrated circuit design in the context of mixed-signal applications. Featuring chapters authored by leading experts from industry and academia, this book: Discusses signal integrity and large-scale simulation, verification, and testing Demonstrates advanced design techniques that enable digital circuits and sensitive analog circuits to coexist without any compromise Describes the process technology needed to address the performance challenges associated with developing complex mixed-signal circuits Deals with modeling topics, such as reliability, variability, and crosstalk, that define pre-silicon design methodology and trends, and are the focus of companies involved in wireless applications Develops methods to move analog into the digital domain quickly, minimizing and eliminating common trade-offs between performance, power consumption, simulation time, verification, size, and cost Details approaches for very low-power performances, high-speed interfaces, phase-locked loops (PLLs), voltage-controlled oscillators (VCOs), analog-to-digital converters (ADCs), and biomedical filters Delineates the respective parts of a full system-on-chip (SoC), from the digital parts to the baseband blocks, radio frequency (RF) circuitries, electrostatic-discharge (ESD) structures, and built-in self-test (BIST) architectures Mixed-Signal Circuits explores exciting opportunities in wireless communications and beyond. The book is a must for anyone involved in mixed-signal circuit design for future technologies.
Fault Injection Techniques And Tools For Embedded Systems Reliability Evaluation
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Author : Alfredo Benso
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-15
Fault Injection Techniques And Tools For Embedded Systems Reliability Evaluation written by Alfredo Benso and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-15 with Technology & Engineering categories.
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance.
The Boundary Scan Handbook
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Author : Kenneth P. Parker
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-05-08
The Boundary Scan Handbook written by Kenneth P. Parker and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-05-08 with Technology & Engineering categories.
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future.
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits
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Author : M. Bushnell
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits written by M. Bushnell and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Computer Aided Design Of Analog Integrated Circuits And Systems
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Author : Rob A. Rutenbar
language : en
Publisher: John Wiley & Sons
Release Date : 2002-05-06
Computer Aided Design Of Analog Integrated Circuits And Systems written by Rob A. Rutenbar and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-05-06 with Technology & Engineering categories.
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Introduction To Advanced System On Chip Test Design And Optimization
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Author : Erik Larsson
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-03-30
Introduction To Advanced System On Chip Test Design And Optimization written by Erik Larsson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-03-30 with Technology & Engineering categories.
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.