Defects In Electronic Materials Ii Volume 442
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Defects In Electronic Materials Ii Volume 442
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Author : Jürgen Michel
language : en
Publisher:
Release Date : 1997-05-02
Defects In Electronic Materials Ii Volume 442 written by Jürgen Michel and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-05-02 with Technology & Engineering categories.
The pervasive role of defects in determining the thermal, mechanical, electrical, optical and magnetic properties of materials is significant as is the knowledge and operation of generation and control of defects in electronic materials. Developing novel semiconductor materials, however, requires new insights into the role of defects to achieve new properties. New experimental techniques must be developed to study defects in small structures. Research groups come together in this book from MRS to provide a vivid picture of the current problems, progress and methods in defect studies in electronic materials. Topics include new techniques in defect studies; processing induced defects, plasma-induced point defects; processing induced defects -defects and gate-oxide integrity; point defects and reaction; point defects and interactions in Si; impurity diffusion and hydrogen in Si; dislocations in group IV semiconductors; point defects and defect interactions in SiGe; point defects in III-V compounds; compensation and structural defects in III-V compounds and layers and structures.
Materials Research Society Symposium Proceedings Volume 442 Defects In Electronic Materials Ii December 2 6 1996 Boston Massachusetts
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Author :
language : en
Publisher:
Release Date : 1996
Materials Research Society Symposium Proceedings Volume 442 Defects In Electronic Materials Ii December 2 6 1996 Boston Massachusetts written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with categories.
This proceedings volume contains oral and poster contributions from a symposium on "Defects in Electronic Materials" at the combined meeting of the Materials Research Society (MRS) and the International Conference on Electronic Materials (ICEM) in December, 1996, in Boston. The volume comprises the areas of defects in group III-V, and wide bandgap semiconductors. The symposium was planned to represent the general field of defects in electronic materials, with a focus on issues that are currently widely discussed. The pervasive role of defects in determining the thermal, mechanical, electrical, optical and magnetic properties of materials is significant. The knowledge of generation and control of defects in electronic materials has contributed to the success of these materials. Developing novel semiconductor materials requires new insights into the role of defects to achieve new properties. New experimental techniques have to be developed to study defects in small structures, This proceedings volume provides a vivid picture of the current problems, progress and methods in defect studies in electronic materials. Of most interest were the sessions on new techniques in defect studies and on process-induced defects in Si and GaAs. Papers on new techniques addressed the issues of surface defects, defects in small dimensions and the detection of near-surface defects in Si. In process-induced defects, three areas received significant attention, Plasma processes in Si and GaAs produce defective layers. Many papers deal with the understanding of these defects. Grown-in defects are widely studied because of their deteriorating effect on the gate-oxide integrity (GOI). These defects were identified as octahedral voids in as-grown silicon. Another recurring issue is gettering of metallic impurities to prevent contamination during processing.
Defects In Electronic Materials Volume 104
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Author : M. Stavola
language : en
Publisher: Mrs Proceedings
Release Date : 1988-05-05
Defects In Electronic Materials Volume 104 written by M. Stavola and has been published by Mrs Proceedings this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988-05-05 with Science categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Gallium Nitride And Related Materials Ii Volume 468
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Author : C. R. Abernathy
language : en
Publisher: Materials Research Society
Release Date : 1997-08-13
Gallium Nitride And Related Materials Ii Volume 468 written by C. R. Abernathy and has been published by Materials Research Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-08-13 with Technology & Engineering categories.
This book from MRS dedicated to III-Nitrides, focuses on developments in AlN, GaN, InN and their alloys that are now finding application in short-wavelength lasers (~400nm, cw at room temperature) and high-power electronics (2.8W/mm at GHz). Experts from fields including crystal growth, condensed matter theory, source chemistry, device processing and device design come together in the volume to address issues of both scientific and technological relevance. And while much of the book reports on advances in material preparation and the understanding of defect issues, similar advances in material and device processing are also reported. Topics include: growth and doping; substrates and substrate effects; characterization; processing and device performance and design.
Materials For Optical Limiting Ii Volume 479
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Author : Richard Lee Sutherland
language : en
Publisher:
Release Date : 1997-12-30
Materials For Optical Limiting Ii Volume 479 written by Richard Lee Sutherland and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-12-30 with Technology & Engineering categories.
The proliferation of lasers and systems employing lasers has brought with it the potential for adverse effects from these bright, coherent light sources. This includes the possibility of damage from pulsed lasers, as well as temporary blinding by continuous-waver lasers. With nearly every wavelength possible being emitted by these sources, there exists a need to develop optical limiters and tunable filters which can suppress undesired radiation of any wavelength. This book addresses a number of materials and devices which have the potential for meeting the challenge. The proceedings is divided into five parts. Parts I and II cover research in organic and inorganic materials primarily based on nonlinear absorption or phase transitions for optical limiting of pulsed lasers. Part III includes photo-refractive materials and liquid crystals which find primary applications in dynamic filters. Part IV covers various aspects of device and material characterization, including nonlinear beam propagation effects. Theoretical modelling of materials properties is the subject of Part V.
Crystal Growth Technology
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Author : Hans J. Scheel
language : en
Publisher: John Wiley & Sons
Release Date : 2009-07-31
Crystal Growth Technology written by Hans J. Scheel and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-07-31 with Science categories.
This volume deals with the technologies of crystal fabrication, of crystal machining, and of epilayer production and is the first book on industrial and scientific aspects of crystal and layer production. The major industrial crystals are treated: Si, GaAs, GaP, InP, CdTe, sapphire, oxide and halide scintillator crystals, crystals for optical, piezoelectric and microwave applications and more. Contains 29 contributions from leading crystal technologists covering the following topics: * General aspects of crystal growth technology * Silicon * Compound semiconductors * Oxides and halides * Crystal machining * Epitaxy and layer deposition Scientific and technological problems of production and machining of industrial crystals are discussed by top experts, most of them from the major growth industries and crystal growth centers. In addition, it will be useful for the users of crystals, for teachers and graduate students in materials sciences, in electronic and other functional materials, chemical and metallurgical engineering, micro-and optoelectronics including nanotechnology, mechanical engineering and precision-machining, microtechnology, and in solid-state sciences.
Low Dielectric Constant Materials Ii Volume 443
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Author : André Lagendijk
language : en
Publisher:
Release Date : 1997-08-19
Low Dielectric Constant Materials Ii Volume 443 written by André Lagendijk and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-08-19 with Technology & Engineering categories.
Low-dielectric constant materials are needed to improve the performance and speed of future integrated circuits. In fact, the diversity of contributors to this book is testimony to the global significance of the topic to the future of semiconductor manufacturing. Presentations include those by semiconductor equipment manufacturers and chemical source suppliers, academia from six countries, four government laboratories and five major device manufacturers. Approaches to designing and implementing reduction in dielectric constant for intermetal dielectric materials are featured and range from the evolution of silicon dioxide to fluorinated silicate glass, to the use of inorganic/organic polymers and spin-on-material, to fluorinated diamond-like carbon and nanoporous silica. The book also addresses the practical aspects of the use of low-dielectric constant materials such as chemical mechanical polishing of these materials and optimization of wiring delays in devices utilizing low-k material.
Materials Reliability In Microelectronics Vii Volume 473
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Author : J. Joseph Clement
language : en
Publisher:
Release Date : 1997-10-20
Materials Reliability In Microelectronics Vii Volume 473 written by J. Joseph Clement and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-10-20 with Technology & Engineering categories.
The inexorable drive for increased integrated circuit functionality and performance places growing demands on the metal and dielectric thin films used in fabricating these circuits, as well as spurring demand for new materials applications and processes. This book directly addresses issues of widespread concern in the microelectronics industry - smaller feature sizes, new materials and new applications that challenge the reliability of new technologies. While the book continues the focus on issues related to interconnect reliability, such as electromigration and stress, particular emphasis is placed on the effects of microstructure. An underlying theme is understanding the importance of interactions among different materials and associated interfaces comprising a single structure with dimensions near or below the micrometer scale. Topics include: adhesion and fracture; gate oxide growth and oxide interfaces; surface preparation and gate oxide reliability; oxide degradation and defects; micro-structure, texture and reliability; novel measurement techniques; interconnect performance and reliability modeling; electromigration and interconnect reliability and stress and stress relaxation.
Intrinsic Point Defects Impurities And Their Diffusion In Silicon
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Author : Peter Pichler
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Intrinsic Point Defects Impurities And Their Diffusion In Silicon written by Peter Pichler and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
Gallium Nitride And Related Materials
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Author :
language : en
Publisher:
Release Date : 1997
Gallium Nitride And Related Materials written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with Electroluminescent devices categories.