Development Of X Ray Diffraction Imaging Techniques For The Quasi In Situ Characterization Of Crystal Defects
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Development Of X Ray Diffraction Imaging Techniques For The Quasi In Situ Characterization Of Crystal Defects
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Author : Simon Bode
language : en
Publisher:
Release Date : 2022*
Development Of X Ray Diffraction Imaging Techniques For The Quasi In Situ Characterization Of Crystal Defects written by Simon Bode and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022* with categories.
Characterization Of Crystal Growth Defects By X Ray Methods
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Author : B.K. Tanner
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17
Characterization Of Crystal Growth Defects By X Ray Methods written by B.K. Tanner and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.
This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.
Diffraction And Imaging Techniques In Material Science P2
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Author : S Amelinckx
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Diffraction And Imaging Techniques In Material Science P2 written by S Amelinckx and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Computers categories.
Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
X Ray Diffraction Topography
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Author : B. K. Tanner
language : en
Publisher: Elsevier
Release Date : 2013-10-22
X Ray Diffraction Topography written by B. K. Tanner and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Science categories.
X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
Development Of A New In Situ X Ray Diffraction Technique For Characterising Embedded Nanoparticles
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Author : Nadia Alexandrovna Zatsepin
language : en
Publisher:
Release Date : 2010
Development Of A New In Situ X Ray Diffraction Technique For Characterising Embedded Nanoparticles written by Nadia Alexandrovna Zatsepin and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
A new non-destructive, high resolution X-ray diffraction technique is developed for the characterisation of ensembles of embedded nanoparticles. The method is based on reciprocal space mapping using an analyser crystal, making it sensitive to very low diffraction contrast between nanoparticles and their surrounds, and capable of encompassing a large volume, representative of the bulk material. The robustness of the technique is demonstrated by its lack of dependence on the X-ray coherence volume and optical stability. In addition, the use of a counting detector provides the necessary high dynamic range, and avoids the restrictions imposed by the finite pixelsize of a direct space detector and loss of information due to a beamstop. We review the most widely used techniques for imaging on the nanometre scale and highlight their unique capabilities. We then demonstrate that no single technique alone is sufficient for model independent, non-destructive, nanoscale characterisation of embedded nanoparticles in a bulk material sample. In situ and real-time investigations are imperative for the understanding, and ultimately the control of nanoparticle nucleation and growth in technologically important alloys, colloidal suspensions and various nanomaterial specimens. In this thesis we make significantprogress in addressing this crucial omission. We begin by presenting the particulars of scalar diffraction theory that enable us to mathematically describe kinematic diffraction from large ensembles of nanoparticles embedded in a matrix. The requirements of X-ray optics are then discussed, from the pertinent properties of synchrotron X-ray sources through high quality analysing and monochromating crystals. A method of simulating Fraunhofer diffraction and reciprocal space maps from a large, sparse ensemble of weakly diffracting Al-Cu nanoparticles is deduced from elementary coherence considerations. We then demonstrate that quantitative information regarding the nanoparticle ensemble polydispersity can be extracted from thereconstructions of nanoparticles from the Fraunhofer diffraction patterns of numerous such ensembles. In simulated reciprocal space maps we examine the effects of nanoparticle ensemble polydispersity and nanoparticle orientation with respect to the diffraction plane. Experimentally obtained reciprocal space maps of diffracted intensity from nanoparticles in an Al-Cu alloy are then presented, demonstrating the sensitivity of the technique to weakly diffracting embedded nanoparticles and their orientation relative to the diffraction plane. Here we also present the results of an iterative algorithm applied to reconstruct, with
Fifty Years Of X Ray Diffraction
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Author : P.P. Ewald
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Fifty Years Of X Ray Diffraction written by P.P. Ewald and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
Origin, Scope, and Plan of this Book In July 1962 the fiftieth anniversary of Max von Laue's discovery of the Diffraction of X-rays by crystals is going to be celebrated in Munich by a large international group of crystallographers, physi cists, chemists, spectroscopists, biologists, industrialists, and many others who are employing the methods based on Laue's discovery for their own research. The invitation for this celebration will be issued jointly by the Ludwig Maximilian University of Munich, where the discovery was made, by the Bavarian Academy of Sciences, where it was first made public, and by the International Union of Crystallo graphy, which is the international organization of the National Committees of Crystallography formed in some 30 countries to repre sent and advance the interests of the 3500 research workers in this field. The year 1912 also is the birth year of two branches of the physical sciences which developed promptly from Laue's discovery, namely X-ray Crystal Structure Analysis which is most closely linked to the names ofW. H. (Sir William) Bragg and W. L. (Sir Lawrence) Bragg, and X-ray Spectroscopy which is associated with the names of W. H. Bragg, H. G. J. Moseley, M. de Broglie and Manne Siegbahn. Crystal Structure Analysis began in November 1912 with the first papers ofW. L. Bragg, then still a student in Cambridge, in which, by analysis of the Laue diagrams _of zinc blende, he determined the correct lattice upon which the structure of this crystal is built.
Defect And Microstructure Analysis By Diffraction
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Author : Robert L. Snyder
language : en
Publisher: International Union of Crystal
Release Date : 1999
Defect And Microstructure Analysis By Diffraction written by Robert L. Snyder and has been published by International Union of Crystal this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Science categories.
Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Characterization Of Crystal Growth Defects By X Ray Methods Applications Of Communications Theory
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Author : B. K. Tanner
language : en
Publisher:
Release Date : 2014-01-15
Characterization Of Crystal Growth Defects By X Ray Methods Applications Of Communications Theory written by B. K. Tanner and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-15 with categories.
X Ray Diffraction Imaging Of Biological Cells
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Author : Masayoshi Nakasako
language : en
Publisher: Springer
Release Date : 2018-03-29
X Ray Diffraction Imaging Of Biological Cells written by Masayoshi Nakasako and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-03-29 with Science categories.
In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.
Characterization Of Crystal Growth Defects By X Ray Methods
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Author : B.K. Tanner
language : en
Publisher: Springer
Release Date : 1981-01-01
Characterization Of Crystal Growth Defects By X Ray Methods written by B.K. Tanner and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981-01-01 with Science categories.
This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.
