Electron Spectroscopy Of Crystals
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Electron Spectroscopy Of Crystals
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Author : V. Nemoshkalenko
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Electron Spectroscopy Of Crystals written by V. Nemoshkalenko and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Science categories.
This book is conceived as a monograph, and represents an up-to-date collection of information concerning the use of the method of X-ray photoelectron spec troscopy in the study of the electron structure of crystals, as well as a personal interpretation of the subject by the authors. In a natural way, the book starts in Chapter 1 with a recapitulation of the fundamentals of the method, basic relations, principles of operation, and a com parative presentation of the characteristics and performances of the most com monly used ESCA instruments (from the classical ones-Varian, McPherson, Hewlett Packard, and IEEE-up to the latest model developed by Professor Siegbahn in Uppsala), and continues with a discussion of some of the difficult problems the experimentalist must face such as calibration of spectra, prepara tion of samples, and evaluation of the escape depth of electrons. The second chapter is devoted to the theory of photoemission from crystal line solids. A discussion of the methods of Hartree-Fock and Hartree-Fock Slater for the calculation of bonding energy levels in multielectronic systems is presented, and the necessity of including in the theory both relativistic and relaxation effects is argued.
Electron Energy Loss Spectroscopy And Surface Vibrations
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Author : H. Ibach
language : en
Publisher: Academic Press
Release Date : 2013-10-22
Electron Energy Loss Spectroscopy And Surface Vibrations written by H. Ibach and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Science categories.
Electron Energy Loss Spectroscopy and Surface Vibrations is devoted to electron energy loss spectroscopy as a probe of the crystal surface. Electrons with energy in the range of a few electron volts sample only a few atomic layers. As they approach or exit from the crystal, they interact with the vibrational modes of the crystal surface, or possibly with other elementary excitations localized there. The energy spectrum of electrons back-reflected from the surface is thus a rich source of information on its dynamics. The book opens with a detailed analysis of the physics that controls the operation of the monochromator, which is the core of the experimental apparatus. Separate chapters follow on the interaction of electrons with vibrational modes of the surface region and with other elementary excitations in the vicinity; the lattice dynamics of clean and adsorbate-covered surfaces, with emphasis on those features of particular relevance to surface vibrational spectroscopy; and selected applications vibration spectroscopy in surface physics and chemistry.
Auger Electron Spectroscopy
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Author : Donald T. Hawkins
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Auger Electron Spectroscopy written by Donald T. Hawkins and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.
Electron Spectroscopy For Surface Analysis
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Author : H. Ibach
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Electron Spectroscopy For Surface Analysis written by H. Ibach and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
The development of surface physics and surface chemistry as a science is closely related to the technical development of a number of methods involving electrons either as an excitation source or as an emitted particle carrying characteristic information. Many of these various kinds of electron spectroscopies have become commercially available and have made their way into industrial laboratories. Others are still in an early stage, but may become of increasing importance in the future. In this book an assessment of the various merits and possible drawbacks of the most frequently used electron spectroscopies is attempted. Emphasis is put on prac tical examples and experimental design rather than on theoretical considerations. The book addresses itself to the reader who wishes to know which electron spectroscopy or which combination of different electron spectroscopies he may choose for the particular problems under investigation. After a brief introduction the practical design of electron spectrometers and their figures of merit important for the different applications are discussed in Chapter 2. Chapter 3 deals with electron excited electron spectroscopies which are used for the elemental analysis of surfaces. Structure analysis by electron diffrac tion is described in Chapter 4 with special emphasis on the use of electron diffrac tion for the investigation of surface imperfections. For the application of electron diffraction to surface crystallography in general, the reader is referred to Volume 4 of "Topics in Applied Physics".
Synthesis Crystal Growth And Characterization
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Author : K. Lal
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Synthesis Crystal Growth And Characterization written by K. Lal and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.
Synthesis, Crystal Growth and Characterization presents the proceedings of the International School on Synthesis, Crystal Growth and Characterization of Materials for Energy Conversion and Storage, held on October 12-23, 1981, at the National Physical Laboratory in New Delhi, India. The book consists of lectures by distinguished scientists from around the world who tackle different aspects of synthesis, crystal growth, characterization of materials, energy conversion, and energy storage. Organized into four parts encompassing 26 chapters, the book begins with an overview of the synthesis of materials at high temperatures and pressures before turning to a discussion of how macrocrystalline and amorphous silicon is prepared. It then looks at fundamental principles underlying the process of crystal growth, both from the vapor phase and from melt, and methodically introduces the reader to the different techniques used to characterize materials, including neutron scattering and electron transport. The next chapters focus on point defects and aggregates that influence the critical electronic properties of semiconducting materials, X-ray diffraction studies of strains and stresses in thin films used in solid-state devices, and electron spectroscopic studies of solid surfaces. The book also considers the role of physics in microelectronics and vice versa, fast ion transport in solids, and the concept of Syadvada in relation to modern physics. This volume is a valuable resource for participants of the International School on Synthesis, Crystal Growth and Characterization of Materials for Energy Conversion and Storage, as well as active researchers working in areas related to the field.
Crystal Growth And Evaluation Of Silicon For Vlsi And Ulsi
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Author : Golla Eranna
language : en
Publisher: CRC Press
Release Date : 2014-12-08
Crystal Growth And Evaluation Of Silicon For Vlsi And Ulsi written by Golla Eranna and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-12-08 with Science categories.
Silicon, as a single-crystal semiconductor, has sparked a revolution in the field of electronics and touched nearly every field of science and technology. Though available abundantly as silica and in various other forms in nature, silicon is difficult to separate from its chemical compounds because of its reactivity. As a solid, silicon is chemically inert and stable, but growing it as a single crystal creates many technological challenges. Crystal Growth and Evaluation of Silicon for VLSI and ULSI is one of the first books to cover the systematic growth of silicon single crystals and the complete evaluation of silicon, from sand to useful wafers for device fabrication. Written for engineers and researchers working in semiconductor fabrication industries, this practical text: Describes different techniques used to grow silicon single crystals Explains how grown single-crystal ingots become a complete silicon wafer for integrated-circuit fabrication Reviews different methods to evaluate silicon wafers to determine suitability for device applications Analyzes silicon wafers in terms of resistivity and impurity concentration mapping Examines the effect of intentional and unintentional impurities Explores the defects found in regular silicon-crystal lattice Discusses silicon wafer preparation for VLSI and ULSI processing Crystal Growth and Evaluation of Silicon for VLSI and ULSI is an essential reference for different approaches to the selection of the basic silicon-containing compound, separation of silicon as metallurgical-grade pure silicon, subsequent purification, single-crystal growth, and defects and evaluation of the deviations within the grown crystals.
Catalog Of National Bureau Of Standards Publications 1966 1976
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Author : United States. National Bureau of Standards. Technical Information and Publications Division
language : en
Publisher:
Release Date : 1978
Catalog Of National Bureau Of Standards Publications 1966 1976 written by United States. National Bureau of Standards. Technical Information and Publications Division and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Government publications categories.
Catalog Of National Bureau Of Standards Publications 1966 1976 Pt 1 2 Key Word Index
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Author : United States. National Bureau of Standards
language : en
Publisher:
Release Date : 1978
Catalog Of National Bureau Of Standards Publications 1966 1976 Pt 1 2 Key Word Index written by United States. National Bureau of Standards and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Government publications categories.
Catalog Of National Bureau Of Standards Publications 1966 1976
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Author : United States. National Bureau of Standards
language : en
Publisher:
Release Date : 1978
Catalog Of National Bureau Of Standards Publications 1966 1976 written by United States. National Bureau of Standards and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Government publications categories.
Organic Molecular Crystals
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Author : Edgar A. Silinsh
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Organic Molecular Crystals written by Edgar A. Silinsh and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
This book is based on the results of many years of experimental work by the author and his colleagues, dealing with the electronic properties of organic crystals. E. Silinsh has played a leading role in pOinting out the importance of the polarization energy by an excess carrier, in determining not only the character of the carrier mobility in organic crystals, but in determining the band gap and the nature of the all-important trapping site in these crystals. The one-electron model of electronic conductivity that has been so successful in dealing with inorganic semiconductors is singular ly unsuccessful in rationalizing the unusual physical properties of organic crystals. A many-body theory is required, and the experimental manifestation of this is the central role played by the crystal polarization enerqies in transferring the results obtained with the isolated molecule, to the solid. The careful studies of E. Silinsh in this field have shown tn detail how this polarization energy develops around the excess carrier (and also the hole-electron pair) sitting on a molecular site in the crystal. As with all insulators, trapping sites playa dominant role in reducing the magnitude of ~he current that can theoretically pass through the organic crystal. It is usually the case that these trapping sites are energetically distributed within the forbidden band of the crystal. For many years, an exponential distribution has shown itself to be useful and reasonably correct: However,' E.