Fundamentals Of Inelastic Electron Scattering

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Fundamentals Of Inelastic Electron Scattering
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Author : P Schattschneider
language : en
Publisher:
Release Date : 1986-10-24
Fundamentals Of Inelastic Electron Scattering written by P Schattschneider and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986-10-24 with categories.
Fundamentals Of Inelastic Electron Scattering
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Author : Peter Schattschneider
language : en
Publisher: Springer
Release Date : 1986
Fundamentals Of Inelastic Electron Scattering written by Peter Schattschneider and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Electrons categories.
Transmission Electron Microscopy And Diffractometry Of Materials
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Author : Brent Fultz
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-14
Transmission Electron Microscopy And Diffractometry Of Materials written by Brent Fultz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-14 with Science categories.
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Collision Processes Of Ion Positron Electron And Photon Beams With Matter Proceedings Of Elaf 91
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Author : Ana Cecilia De Azevedo E Souza
language : en
Publisher: World Scientific
Release Date : 1992-04-30
Collision Processes Of Ion Positron Electron And Photon Beams With Matter Proceedings Of Elaf 91 written by Ana Cecilia De Azevedo E Souza and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992-04-30 with categories.
The proceedings contain lectures and contributed papers presented at the Latin American School of Physics in Caxambu, Brazil. Topics are related to a review of collision processes, excitation and ionization of molecules, ion formation by electron impact, mass and energy spectroscopy in collision reactions, desorption induced by ion and electron beams, and principles and applications of synchrotron radiation. The major theme of the school was “Current methods in collision processes.”
Linear And Chiral Dichroism In The Electron Microscope
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Author : Peter Schattschneider
language : en
Publisher: CRC Press
Release Date : 2012-03-01
Linear And Chiral Dichroism In The Electron Microscope written by Peter Schattschneider and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-03-01 with Science categories.
This book describes energy loss magnetic chiral dichroism (EMCD), a phenomenon in energy loss spectroscopy discovered in 2006. EMCD is the equivalent of XMCD but is based on fast probe electrons in the electron microscope. A spatial resolution of 2 nm has been demonstrated, and the lattice-resolved mapping of atomic spins appears feasible. EMCD is, thus, a promising technique for magnetic studies on the nanometer and sub-nanometer scale, providing the technical and logistic advantages of electron microscopy, such as in situ chemical and structural information, easy access, and low cost.
Electron Beam Specimen Interactions And Simulation Methods In Microscopy
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Author : Budhika G. Mendis
language : en
Publisher: John Wiley & Sons
Release Date : 2018-04-30
Electron Beam Specimen Interactions And Simulation Methods In Microscopy written by Budhika G. Mendis and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-04-30 with Technology & Engineering categories.
A detailed presentation of the physics of electron beam-specimen interactions Electron microscopy is one of the most widely used characterisation techniques in materials science, physics, chemistry, and the life sciences. This book examines the interactions between the electron beam and the specimen, the fundamental starting point for all electron microscopy. Detailed explanations are provided to help reinforce understanding, and new topics at the forefront of current research are presented. It provides readers with a deeper knowledge of the subject, particularly if they intend to simulate electron beam-specimen interactions as part of their research projects. The book covers the vast majority of commonly used electron microscopy techniques. Some of the more advanced topics (annular bright field and dopant atom imaging, atomic resolution chemical analysis, band gap measurements) provide additional value, especially for readers who have access to advanced instrumentation, such as aberration-corrected and monochromated microscopes. Electron Beam-Specimen Interactions and Simulation Methods in Microscopy offers enlightening coverage of: the Monte-Carlo Method; Multislice Simulations; Bloch Waves in Conventional and Analytical Transmission Electron Microscopy; Bloch Waves in Scanning Transmission Electron Microscopy; Low Energy Loss and Core Loss EELS. It also supplements each chapter with clear diagrams and provides appendices at the end of the book to assist with the pre-requisites. A detailed presentation of the physics of electron beam-specimen interactions Each chapter first discusses the background physics before moving onto simulation methods Uses computer programs to simulate electron beam-specimen interactions (presented in the form of case studies) Includes hot topics brought to light due to advances in instrumentation (particularly aberration-corrected and monochromated microscopes) Electron Beam-Specimen Interactions and Simulation Methods in Microscopy benefits students undertaking higher education degrees, practicing electron microscopists who wish to learn more about their subject, and researchers who wish to obtain a deeper understanding of the subject matter for their own work.
Electron Energy Loss Spectroscopy
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Author : Nicholas J. Heller
language : en
Publisher: American Chemical Society
Release Date : 2025-06-12
Electron Energy Loss Spectroscopy written by Nicholas J. Heller and has been published by American Chemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-06-12 with Science categories.
This primer is geared toward undergraduate and graduate students who possess a basic understanding of chemistry and physics and are looking for a route to enter the world of electron energy loss spectroscopy (EELS). It may also be a convenient reference for established researchers interested in adopting a new analytical method or simply for anyone eager to learn more about electron–matter interactions. This primer is divided into five chapters to guide your reading: Chapter 1 introduces the concept of electron-based spectroscopy and defines what qualifies as an electron-based technique. The authors outline the principal interactions at play and present a range of methods that correspond to different types of signals. The chapter concludes with a concise historical narrative tracing the development of EELS. Chapter 2 details the background required to build a deeper understanding of EELS and spectroscopy. The authors connect photon-based and electron-based approaches, highlighting where they overlap and where they diverge. Chapter 3 focuses on the fundamental instrumentation used in electron spectroscopy, discusses optimization strategies, and introduces key instrument parameters. The authors compare different electron sources, optical geometries, and lens configurations. Chapter 4 explores scattering mechanisms and electron–matter interactions, offering theoretical underpinnings and guidance on interpreting EELS spectra. Key concepts such as elastic and inelastic scattering, core-level transitions, plasmons, and analysis methods are reviewed. Chapter 5 concludes with real-world applications, such as the use of EELS in biology, nanomaterials, polymers, and solid-state systems. The authors also briefly survey emerging directions, including in situ and ultrafast EELS, underscoring the method’s evolving landscape.
Electron Energy Loss Spectroscopy In The Electron Microscope
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Author : R.F. Egerton
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Electron Energy Loss Spectroscopy In The Electron Microscope written by R.F. Egerton and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Science categories.
to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
The Basics Of Crystallography And Diffraction
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Author : Christopher Hammond
language : en
Publisher: Oxford University Press
Release Date : 2009-05-07
The Basics Of Crystallography And Diffraction written by Christopher Hammond and has been published by Oxford University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-05-07 with Science categories.
Crystallography and diffraction are widely used throughout science for studying structure. However, many students find these subjects difficult. The aim of this book is to show, through relevant examples and without relying on complex mathematics, that the basic ideas behind crystallography and diffraction are simple and easily comprehensible.
Advances In Imaging And Electron Physics
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Author :
language : en
Publisher: Academic Press
Release Date : 2018-06-15
Advances In Imaging And Electron Physics written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-06-15 with Computers categories.
Advances in Imaging and Electron Physics, Volume 206, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates on all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing