Hierarchical Modeling For Vlsi Circuit Testing

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Hierarchical Modeling For Vlsi Circuit Testing

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Author : Debashis Bhattacharya
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Hierarchical Modeling For Vlsi Circuit Testing written by Debashis Bhattacharya and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.

Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to most types of digital circuits, and should provide fault coverage comparable to that of traditional, low-level methods. The fault coverage problem has, perhaps, been the most intractable, due to continued reliance in the testing industry on the single stuck-line (SSL) fault model, which is tightly bound to the gate level of abstraction. This monograph presents a novel approach to solving the foregoing problem. It is based on the systematic use of multibit vectors rather than single bits to represent logic signals, including fault signals. A circuit is viewed as a collection of high-level components such as adders, multiplexers, and registers, interconnected by n-bit buses. To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel. However, by reducing the bus size from n to one, we can obtain the traditional gate-level circuit and models.

Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits

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Author : M. Bushnell
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11

Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits written by M. Bushnell and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Neural Models And Algorithms For Digital Testing

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Author : S.T. Chadradhar
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Neural Models And Algorithms For Digital Testing written by S.T. Chadradhar and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.

References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy Minimization. . . . . . . . . . . . . 94 9. 5. 1 Transitive Oosure . . . . . . . . . . . . . . . . . 94 9. 5. 2 Additional Pairwise Relationships 96 9. 5. 3 Path Sensitization . . . . . . . . . . . . . . . . . 97 9. 6 Experimental Results 98 9. 7 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 100 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 10 TRANSITIVE CLOSURE AND TESTING 103 10. 1 Background . . . . . . . . . . . . . . . . . . . . . . . . 104 10. 2 Transitive Oosure Definition 105 10. 3 Implication Graphs 106 10. 4 A Test Generation Algorithm 107 10. 5 Identifying Necessary Assignments 112 10. 5. 1 Implicit Implication and Justification 113 10. 5. 2 Transitive Oosure Does More Than Implication and Justification 115 10. 5. 3 Implicit Sensitization of Dominators 116 10. 5. 4 Redundancy Identification 117 10. 6 Summary 119 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119 11 POLYNOMIAL-TIME TESTABILITY 123 11. 1 Background 124 11. 1. 1 Fujiwara's Result 125 11. 1. 2 Contribution of the Present Work . . . . . . . . . 126 11. 2 Notation and Tenninology 127 11. 3 A Polynomial TlDle Algorithm 128 11. 3. 1 Primary Output Fault 129 11. 3. 2 Arbitrary Single Fault 135 11. 3. 3 Multiple Faults. . . . . . . . . . . . . . . . . . . 137 11. 4 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 139 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139 ix 12 SPECIAL CASES OF HARD PROBLEMS 141 12. 1 Problem Statement 142 12. 2 Logic Simulation 143 12. 3 Logic Circuit Modeling . 146 12. 3. 1 Modelfor a Boolean Gate . . . . . . . . . . . . . 147 12. 3. 2 Circuit Modeling 148 12.

On Line Testing For Vlsi

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Author : Michael Nicolaidis
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09

On Line Testing For Vlsi written by Michael Nicolaidis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

High Level Vlsi Synthesis

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Author : Raul Camposano
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

High Level Vlsi Synthesis written by Raul Camposano and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

The time has come for high-level synthesis. When research into synthesizing hardware from abstract, program-like de scriptions started in the early 1970' s, there was no automated path from the register transfer design produced by high-level synthesis to a complete hardware imple mentation. As a result, it was very difficult to measure the effectiveness of high level synthesis methods; it was also hard to justify to users the need to automate architecture design when low-level design had to be completed manually. Today's more mature CAD techniques help close the gap between an automat ically synthesized design and a manufacturable design. Market pressures encour age designers to make use of any and all automated tools. Layout synthesis, logic synthesis, and specialized datapath generators make it feasible to quickly imple ment a register-transfer design in silicon,leaving designers more time to consider architectural improvements. As IC design becomes more automated, customers are increasing their demands; today's leading edge designers using logic synthesis systems are training themselves to be tomorrow's consumers of high-level synthe sis systems. The need for very fast turnaround, a competitive fabrication market WhlCh makes small-quantity ASIC manufacturing possible, and the ever growing co:n plexity of the systems being designed, all make higher-level design automaton inevitable.

Vlsi Design Of Neural Networks

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Author : Ulrich Ramacher
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Vlsi Design Of Neural Networks written by Ulrich Ramacher and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

The early era of neural network hardware design (starting at 1985) was mainly technology driven. Designers used almost exclusively analog signal processing concepts for the recall mode. Learning was deemed not to cause a problem because the number of implementable synapses was still so low that the determination of weights and thresholds could be left to conventional computers. Instead, designers tried to directly map neural parallelity into hardware. The architectural concepts were accordingly simple and produced the so called interconnection problem which, in turn, made many engineers believe it could be solved by optical implementation in adequate fashion only. Furthermore, the inherent fault-tolerance and limited computation accuracy of neural networks were claimed to justify that little effort is to be spend on careful design, but most effort be put on technology issues. As a result, it was almost impossible to predict whether an electronic neural network would function in the way it was simulated to do. This limited the use of the first neuro-chips for further experimentation, not to mention that real-world applications called for much more synapses than could be implemented on a single chip at that time. Meanwhile matters have matured. It is recognized that isolated definition of the effort of analog multiplication, for instance, would be just as inappropriate on the part ofthe chip designer as determination of the weights by simulation, without allowing for the computing accuracy that can be achieved, on the part of the user.

Symbolic Analysis And Reduction Of Vlsi Circuits

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Author : Zhanhai Qin
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-03-13

Symbolic Analysis And Reduction Of Vlsi Circuits written by Zhanhai Qin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-03-13 with Technology & Engineering categories.

Symbolic analysis is an intriguing topic in VLSI designs. The analysis methods are crucial for the applications to the parasitic reduction and analog circuit evaluation. However, analyzing circuits symbolically remains a challenging research issue. Therefore, in this book, we survey the recent results as the progress of on-going works rather than as the solution of the field. For parasitic reduction, we approximate a huge amount of electrical parameters into a simplified RLC network. This reduction allows us to handle very large integrated circuits with given memory capacity and CPU time. A symbolic analysis approach reduces the circuit according to the network topology. Thus, the designer can maintain the meaning of the original network and perform the analysis hierarchically. For analog circuit designs, symbolic analysis provides the relation between the tunable parameters and the characteristics of the circuit. The analysis allows us to optimize the circuit behavior. The book is divided into three parts. Part I touches on the basics of circuit analysis in time domain and in s domain. For an s domain expression, the Taylor's expansion with s approaching infinity is equivalent to the time domain solution after the inverse Laplace transform. On the other hand, the Taylor's expansion when s approaches zero derives the moments of the output responses in time domain. Part II focuses on the techniques for parasitic reduction. In Chapter 2, we present the approximation methods to match the first few moments with reduced circuit orders. In Chapter 3, we apply the Y-Delta transformation to reduce the dynamic linear network. The method finds the exact values of the low order coefficients of the numerator and denominator of the transfer function and thus matches part of the moments. In Chapter 4, we handle two major issues of the Y-Delta transformation: common factors in fractional expressions and round-off errors. Chapter 5 explains the stability of the reduced expression, in particular the Ruth-Hurwitz Criterion. We make an effort to describe the proof of the Criterion because the details are omitted in most of the contemporary textbooks. In Chapter 6, we present techniques to synthesize circuits to approximate the reduced expressions after the transformation. In Part III, we discuss symbolic generation of the determinants and cofactors for the application to analog designs. In Chapter 7, we depict the classical topological analysis approach. In Chapter 8, we describe a determinant decision diagram approach that exploits the sparsity of the matrix to accelerate the computation. In Chapter 9, we take only significant terms when we search through determinant decision diagram to approximate the solution. In Chapter 10, we extend the determinant decision diagram to a hierarchical model. The construction of the modules through the hierarchy is similar to the Y-Delta transformation in the sense that a byproduct of common factors appears in the numerator and denominator. Therefore, we describe the method to prune the common factors.

Principles Of Vlsi System Planning

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Author : Allen M. Dewey
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Principles Of Vlsi System Planning written by Allen M. Dewey and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.

This book describes a new type of computer aided VLSI design tool, called a VLSI System Planning, that is meant to aid designers dur ing the early, or conceptual, state of design. During this stage of design, the objective is to define a general design plan, or approach, that is likely to result in an efficient implementation satisfying the initial specifications, or to determine that the initial specifications are not realizable. A design plan is a collection of high level design decisions. As an example, the conceptual design of digital filters involves choosing the type of algorithm to implement (e. g. , finite impulse response or infinite impulse response), the type of polyno mial approximation (e. g. , Equiripple or Chebyshev), the fabrication technology (e. g. , CMOS or BiCMOS), and so on. Once a particu lar design plan is chosen, the detailed design phase can begin. It is during this phase that various synthesis, simulation, layout, and test activities occur to refine the conceptual design, gradually filling more detail until the design is finally realized. The principal advantage of VLSI System Planning is that the increasingly expensive resources of the detailed design process are more efficiently managed. Costly redesigns are minimized because the detailed design process is guided by a more credible, consistent, and correct design plan.

Symbolic Analysis For Automated Design Of Analog Integrated Circuits

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Author : Georges Gielen
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Symbolic Analysis For Automated Design Of Analog Integrated Circuits written by Georges Gielen and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

It is a great honor to provide a few words of introduction for Dr. Georges Gielen's and Prof. Willy Sansen's book "Symbolic analysis for automated design of analog integrated circuits". The symbolic analysis method presented in this book represents a significant step forward in the area of analog circuit design. As demonstrated in this book, symbolic analysis opens up new possibilities for the development of computer-aided design (CAD) tools that can analyze an analog circuit topology and automatically size the components for a given set of specifications. Symbolic analysis even has the potential to improve the training of young analog circuit designers and to guide more experienced designers through second-order phenomena such as distortion. This book can also serve as an excellent reference for researchers in the analog circuit design area and creators of CAD tools, as it provides a comprehensive overview and comparison of various approaches for analog circuit design automation and an extensive bibliography. The world is essentially analog in nature, hence most electronic systems involve both analog and digital circuitry. As the number of transistors that can be integrated on a single integrated circuit (IC) substrate steadily increases over time, an ever increasing number of systems will be implemented with one, or a few, very complex ICs because of their lower production costs.

Models For Large Integrated Circuits

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Author : Patrick DeWilde
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Models For Large Integrated Circuits written by Patrick DeWilde and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

A modern microelectronic circuit can be compared to a large construction, a large city, on a very small area. A memory chip, a DRAM, may have up to 64 million bit locations on a surface of a few square centimeters. Each new generation of integrated circuit- generations are measured by factors of four in overall complexity -requires a substantial increase in density from the current technology, added precision, a decrease of the size of geometric features, and an increase in the total usable surface. The microelectronic industry has set the trend. Ultra large funds have been invested in the construction of new plants to produce the ultra large-scale circuits with utmost precision under the most severe conditions. The decrease in feature size to submicrons -0.7 micron is quickly becoming availabl- does not only bring technological problems. New design problems arise as well. The elements from which microelectronic circuits are build, transistors and interconnects, have different shape and behave differently than before. Phenomena that could be neglected in a four micron technology, such as the non-uniformity of the doping profile in a transistor, or the mutual capacitance between two wires, now play an important role in circuit design. This situation does not make the life of the electronic designer easier: he has to take many more parasitic effects into account, up to the point that his ideal design will not function as originally planned.