High Resolution X Ray Diffraction And Imaging
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High Resolution X Ray Diffraction And Imaging
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Author : Tilo Baumbach
language : en
Publisher:
Release Date : 2007
High Resolution X Ray Diffraction And Imaging written by Tilo Baumbach and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with categories.
High Resolution X Ray Diffraction And Imaging
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Author : Tilo Baumbach
language : en
Publisher:
Release Date : 2007
High Resolution X Ray Diffraction And Imaging written by Tilo Baumbach and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with categories.
High Resolution X Ray Diffractometry And Topography
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Author : D.K. Bowen
language : en
Publisher: CRC Press
Release Date : 1998-02-05
High Resolution X Ray Diffractometry And Topography written by D.K. Bowen and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-02-05 with Technology & Engineering categories.
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization
Light And X Ray Optics
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Author : Emil Zolotoyabko
language : en
Publisher: Walter de Gruyter GmbH & Co KG
Release Date : 2023-09-07
Light And X Ray Optics written by Emil Zolotoyabko and has been published by Walter de Gruyter GmbH & Co KG this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-09-07 with Science categories.
Contemporary optics is the foundation of many of today’s technologies including various focusing and defocusing devices, microscopies and imaging techniques. Light and X-ray Optis for Materials Scientists and Engineers offers a guide to basic concepts and provides an accessible framework for understanding this highly application-relevant branch of science for materials scientists, physicists, chemists, biologists, and engineers trained in different disciplines. The text links the fundamentals of optics to modern applications, especially for promotion of nanotechnology and life science, such as conventional, near-field, confocal, phase-contrast microscopies and imaging schemes based on interference and diffraction phenomena. Written by a noted expert and experienced instructor, the book contains numerous worked examples throughout to help the reader gain a thorough understanding of the concepts and information presented. The text covers a wide range of relevant topics, including reflection, refraction, and focusing phenomena, wave polarization and birefringence in crystals, optics in negative materials, metamaterials, and photonic structures, holography, light and X-ray interferometry, extensive description of diffraction optics, including dynamical X-ray diffraction, and more.
High Resolution X Ray Scattering
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Author : Ullrich Pietsch
language : en
Publisher: Springer Science & Business Media
Release Date : 2004-08-27
High Resolution X Ray Scattering written by Ullrich Pietsch and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-08-27 with Technology & Engineering categories.
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
X Ray Diffraction
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Author : Oliver H. Seeck
language : en
Publisher: CRC Press
Release Date : 2015-02-10
X Ray Diffraction written by Oliver H. Seeck and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-02-10 with Science categories.
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
High Resolution X Ray Diffraction Imaging Of Photorefractive Crystals And Gratings
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Author : Gerard D. Fogarty
language : en
Publisher:
Release Date : 1994
High Resolution X Ray Diffraction Imaging Of Photorefractive Crystals And Gratings written by Gerard D. Fogarty and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Crystals categories.
High Resolution X Ray Diffraction And Imaging
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Author :
language : en
Publisher:
Release Date : 2006
High Resolution X Ray Diffraction And Imaging written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with categories.
High Resolution X Ray Diffraction Imaging Using Ptychography
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Author : Isaac Russell Peterson
language : en
Publisher:
Release Date : 2015
High Resolution X Ray Diffraction Imaging Using Ptychography written by Isaac Russell Peterson and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015 with Diffraction patterns categories.
High Resolution Ab Initio Three Dimensional X Ray Diffraction Microscopy
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Author :
language : en
Publisher:
Release Date : 2005
High Resolution Ab Initio Three Dimensional X Ray Diffraction Microscopy written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with categories.
Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a non-periodic object. We also construct 2D images of thick objects with infinite depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution using X-ray undulator radiation, and establishes the techniques to be used in atomic-resolution ultrafast imaging at X-ray free-electron laser sources.