Integrated Circuit Metrology Inspection And Process Control
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Integrated Circuit Metrology Inspection And Process Control
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Author : Society of Photo-optical Instrumentation Engineers
language : en
Publisher:
Release Date : 1987
Integrated Circuit Metrology Inspection And Process Control written by Society of Photo-optical Instrumentation Engineers and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with categories.
Integrated Circuit Metrology Inspection And Process Control
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Author :
language : en
Publisher:
Release Date : 1994
Integrated Circuit Metrology Inspection And Process Control written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Electronic circuit design categories.
Integrated Circuit Metrology Inspection And Process Control Vi
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Author : Michael T. Postek
language : en
Publisher: SPIE-International Society for Optical Engineering
Release Date : 1992
Integrated Circuit Metrology Inspection And Process Control Vi written by Michael T. Postek and has been published by SPIE-International Society for Optical Engineering this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Technology & Engineering categories.
Integrated Circuit Metrology Inspection And Process Control Iii
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Author : Kevin M. Monahan
language : en
Publisher:
Release Date : 1989
Integrated Circuit Metrology Inspection And Process Control Iii written by Kevin M. Monahan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Technology & Engineering categories.
Integrated Circuit Metrology Inspection And Process Control V
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Author : William H. Arnold
language : en
Publisher: SPIE-International Society for Optical Engineering
Release Date : 1991
Integrated Circuit Metrology Inspection And Process Control V written by William H. Arnold and has been published by SPIE-International Society for Optical Engineering this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Technology & Engineering categories.
Integrated Circuit Metrology Inspection And Process Control Ii
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Author : Kevin M. Monahan
language : en
Publisher:
Release Date : 1988
Integrated Circuit Metrology Inspection And Process Control Ii written by Kevin M. Monahan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Mathematics categories.
Integrated Circuit Metrology Inspection And Process Control
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Author : Kevin M. Monahan
language : en
Publisher:
Release Date : 1987
Integrated Circuit Metrology Inspection And Process Control written by Kevin M. Monahan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Technology & Engineering categories.
Integrated Circuit Metrology Inspection And Process Control Viii
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Author : Marylyn Hoy Bennett
language : en
Publisher:
Release Date : 1994
Integrated Circuit Metrology Inspection And Process Control Viii written by Marylyn Hoy Bennett and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Electronic books categories.
Metrology Inspection And Process Control For Microlithography
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Author :
language : en
Publisher:
Release Date : 2001
Metrology Inspection And Process Control For Microlithography written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Measurement categories.
Confocal Scanning Optical Microscopy And Related Imaging Systems
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Author : Gordon S. Kino
language : en
Publisher: Academic Press
Release Date : 1996-09-18
Confocal Scanning Optical Microscopy And Related Imaging Systems written by Gordon S. Kino and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-09-18 with Science categories.
This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. - Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers - Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology - Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations - Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications - Discusses the theory and design of near-field optical microscopes - Explains phase imaging in the scanning optical and interference microscopes