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Istfa 2012
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Author : ASM International
language : en
Publisher: ASM International
Release Date : 2012
Istfa 2012 written by ASM International and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with Technology & Engineering categories.
Istfa 2011
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Author :
language : en
Publisher: ASM International
Release Date : 2011
Istfa 2011 written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with Technology & Engineering categories.
Istfa 2012
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Author : ASM International
language : en
Publisher:
Release Date : 2012
Istfa 2012 written by ASM International and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with Electronic apparatus and appliances categories.
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Istfa 2013
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Author : A. S. M. International
language : en
Publisher: ASM International
Release Date : 2013-01-01
Istfa 2013 written by A. S. M. International and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-01-01 with Technology & Engineering categories.
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
Istfa 2014
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Author : A. S. M. International
language : en
Publisher: ASM International
Release Date : 2014-11-01
Istfa 2014 written by A. S. M. International and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-11-01 with Technology & Engineering categories.
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Istfa 2019 Proceedings Of The 45th International Symposium For Testing And Failure Analysis
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Author :
language : en
Publisher: ASM International
Release Date : 2019-12-01
Istfa 2019 Proceedings Of The 45th International Symposium For Testing And Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-12-01 with Technology & Engineering categories.
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
Istfa 2017 Proceedings From The 43rd International Symposium For Testing And Failure Analysis
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Author :
language : en
Publisher: ASM International
Release Date : 2017-12-01
Istfa 2017 Proceedings From The 43rd International Symposium For Testing And Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-01 with Technology & Engineering categories.
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Istfa 2018 Proceedings From The 44th International Symposium For Testing And Failure Analysis
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Author :
language : en
Publisher: ASM International
Release Date : 2018-12-01
Istfa 2018 Proceedings From The 44th International Symposium For Testing And Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-12-01 with categories.
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Microelectronics Fialure Analysis Desk Reference Seventh Edition
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Author : Tejinder Gandhi
language : en
Publisher: ASM International
Release Date : 2019-11-01
Microelectronics Fialure Analysis Desk Reference Seventh Edition written by Tejinder Gandhi and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-11-01 with Technology & Engineering categories.
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Helium Ion Microscopy
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Author : Gregor Hlawacek
language : en
Publisher: Springer
Release Date : 2016-10-04
Helium Ion Microscopy written by Gregor Hlawacek and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-10-04 with Science categories.
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.