Optical And Electrical Addressing In Moleculebased Logic Circuits

DOWNLOAD
Download Optical And Electrical Addressing In Moleculebased Logic Circuits PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Optical And Electrical Addressing In Moleculebased Logic Circuits book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page
Optical And Electrical Addressing In Moleculebased Logic Circuits
DOWNLOAD
Author : Marcel Manheller
language : en
Publisher: Forschungszentrum Jülich
Release Date : 2012
Optical And Electrical Addressing In Moleculebased Logic Circuits written by Marcel Manheller and has been published by Forschungszentrum Jülich this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with categories.
Zsfassung in dt. u. engl. Sprache
Electrical Characterization Of Manganite And Titanate Heterostructures
DOWNLOAD
Author : Anja Herpers
language : en
Publisher: Forschungszentrum Jülich
Release Date : 2014-03-28
Electrical Characterization Of Manganite And Titanate Heterostructures written by Anja Herpers and has been published by Forschungszentrum Jülich this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-03-28 with categories.
Oxygen Transport In Thin Oxide Films At High Field Strength
DOWNLOAD
Author : Dieter Weber
language : en
Publisher: Forschungszentrum Jülich
Release Date : 2014
Oxygen Transport In Thin Oxide Films At High Field Strength written by Dieter Weber and has been published by Forschungszentrum Jülich this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014 with categories.
Ionic transport in nanostructures at high eld strength has recently gained attention, because novel types of computer memory with potentially superior properties rely on such phenomena. The applied voltages are only moderate, but they drop over the distance of a few nanometers and lead to extreme eld strengths in the MV/cm region. Such strong elds contributes signi cantly to the activation energy for ionic jump processes. This leads to an exponential increase of transport speed with voltage. Conventional high-temperature ionic conduction, in contrast, only relies on thermal activation for such jumps. In this thesis, the transport of minute amounts of oxygen through a thin dielectric layer sandwiched between two thin conducting oxide electrodes was detected semiquantitatively by measuring the conductance change of the electrodes after applying a current through the dielectric layer. The relative conductance change G=G as a function of current I and duration t follows over several orders of magnitude a simple, empirical law of the form G=G = CIAtB with t parameters C, A and B; A;B 2 [0; 1]. This empirical law can be linked to a predicted exponential increase of the transport speed with voltage at high eld strength. The behavior in the time domain can be explained with a spectrum of relaxation processes, similar to the relaxation of dielectrics. The in uence of temperature on the transport is strong, but still much lower than expected. This contradicts a commonly used law for high- eld ionic transport. The di erent oxide layers are epitaxial with thicknesses between 5 and 70 nm. First large-scale test samples were fabricated using shadow masks. The general behavior of such devices was studied extensively. In an attempt to achieve quantitative results with defect-free, miniaturized devices, a lithographic manufacturing process that uses repeated steps of epitaxial deposition and structuring of the layers was developed. It employs newly developed and optimized wet chemical etching processes for the conducting electrodes. First high-quality devices could be manufactured with this process and con rmed that such devices su er less from parasitic e ects. The lithographically structured samples were made from di erent materials. The results from the rst test samples and the lithographically structured samples are therefore not directly comparable. They do exhibit however in principle the same behavior. Further investigation of such lithographically structured samples appears promising
Carrier Mobility In Advanced Channel Materials Using Alternative Gate Dielectrics
DOWNLOAD
Author : Eylem Durgun Özben
language : en
Publisher: Forschungszentrum Jülich
Release Date : 2014-03-20
Carrier Mobility In Advanced Channel Materials Using Alternative Gate Dielectrics written by Eylem Durgun Özben and has been published by Forschungszentrum Jülich this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-03-20 with categories.
Supported Lipid Bilayer As A Biomimetic Platform For Neuronal Cell Culture
DOWNLOAD
Author : Dzmitry Afanasenkau
language : en
Publisher: Forschungszentrum Jülich
Release Date : 2013
Supported Lipid Bilayer As A Biomimetic Platform For Neuronal Cell Culture written by Dzmitry Afanasenkau and has been published by Forschungszentrum Jülich this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with categories.
Ultrathin Gold Nanowires
DOWNLOAD
Author : Alexandre Kisner
language : en
Publisher: Forschungszentrum Jülich
Release Date : 2013
Ultrathin Gold Nanowires written by Alexandre Kisner and has been published by Forschungszentrum Jülich this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with categories.
The Role Of Defects At Functional Interfaces Between Polar And Non Polar Perovskite Oxides
DOWNLOAD
Author : Felix Gunkel
language : en
Publisher: Forschungszentrum Jülich
Release Date : 2013
The Role Of Defects At Functional Interfaces Between Polar And Non Polar Perovskite Oxides written by Felix Gunkel and has been published by Forschungszentrum Jülich this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with categories.
Characterization Integration And Reliability Of Hfo2 And Laluo3 High Metal Gate Stacks For Cmos Applications
DOWNLOAD
Author : Alexander Nichau
language : en
Publisher: Forschungszentrum Jülich
Release Date : 2014-04-03
Characterization Integration And Reliability Of Hfo2 And Laluo3 High Metal Gate Stacks For Cmos Applications written by Alexander Nichau and has been published by Forschungszentrum Jülich this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-04-03 with categories.
Thermal Diffusion In Binary Surfactant Systems And Microemulsions
DOWNLOAD
Author : Bastian Arlt
language : en
Publisher: Forschungszentrum Jülich
Release Date : 2012
Thermal Diffusion In Binary Surfactant Systems And Microemulsions written by Bastian Arlt and has been published by Forschungszentrum Jülich this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with categories.
Springer Handbook Of Nanotechnology
DOWNLOAD
Author : Bharat Bhushan
language : en
Publisher: Springer
Release Date : 2017-11-05
Springer Handbook Of Nanotechnology written by Bharat Bhushan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-11-05 with Technology & Engineering categories.
This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates a number of recent new developments. It integrates nanofabrication, nanomaterials, nanodevices, nanomechanics, nanotribology, materials science, and reliability engineering knowledge in just one volume. Furthermore, it discusses various nanostructures; micro/nanofabrication; micro/nanodevices and biomicro/nanodevices, as well as scanning probe microscopy; nanotribology and nanomechanics; molecularly thick films; industrial applications and nanodevice reliability; societal, environmental, health and safety issues; and nanotechnology education. In this new edition, written by an international team of over 140 distinguished experts and put together by an experienced editor with a comprehensive understanding of the field, almost all the chapters are either new or substantially revised and expanded, with new topics of interest added. It is an essential resource for anyone working in the rapidly evolving field of key technology, including mechanical and electrical engineers, materials scientists, physicists, and chemists.