Practical Electron Microscopy In Materials Science
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Practical Electron Microscopy In Materials Science
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Author : Jeffrey William Edington
language : en
Publisher: Techbooks
Release Date : 1976
Practical Electron Microscopy In Materials Science written by Jeffrey William Edington and has been published by Techbooks this book supported file pdf, txt, epub, kindle and other format this book has been release on 1976 with Crystallography categories.
Practical Electron Microscopy In Materials Science
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Author : Jeffrey William Edington
language : en
Publisher:
Release Date : 1991
Practical Electron Microscopy In Materials Science written by Jeffrey William Edington and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Crystallography categories.
Practical Electron Microscopy In Materials Science
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Author : J.W. Edington
language : en
Publisher:
Release Date : 1974
Practical Electron Microscopy In Materials Science written by J.W. Edington and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1974 with categories.
Practical Scanning Electron Microscopy
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Author : Joseph Goldstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Practical Scanning Electron Microscopy written by Joseph Goldstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
Practical Electron Microscopy
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Author : Elaine Evelyn Hunter
language : en
Publisher: Cambridge University Press
Release Date : 1993-09-24
Practical Electron Microscopy written by Elaine Evelyn Hunter and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993-09-24 with Medical categories.
For this new edition, the chapters on photography and the electron microscope have been completely rewritten and two new chapters have been added--on immuno electron microscopy using colloidal gold and on useful specialized techniques.
Physical Principles Of Electron Microscopy
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Author : Ray Egerton
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-02-11
Physical Principles Of Electron Microscopy written by Ray Egerton and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-02-11 with Technology & Engineering categories.
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Transmission Electron Microscopy And Diffractometry Of Materials
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Author : Brent Fultz
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-14
Transmission Electron Microscopy And Diffractometry Of Materials written by Brent Fultz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-14 with Science categories.
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Sample Preparation Handbook For Transmission Electron Microscopy
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Author : Jeanne Ayache
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-07-03
Sample Preparation Handbook For Transmission Electron Microscopy written by Jeanne Ayache and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-03 with Technology & Engineering categories.
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Transmission Electron Microscopy
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Author : C. Barry Carter
language : en
Publisher: Springer
Release Date : 2016-08-24
Transmission Electron Microscopy written by C. Barry Carter and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-08-24 with Technology & Engineering categories.
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Electron Energy Loss Spectroscopy In The Electron Microscope
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Author : R.F. Egerton
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Electron Energy Loss Spectroscopy In The Electron Microscope written by R.F. Egerton and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Science categories.
to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.