Prototype Rule Based Reliability Analysis For Vlsi Circuit Design
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Prototype Rule Based Reliability Analysis For Vlsi Circuit Design
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Author :
language : en
Publisher:
Release Date : 1994
Prototype Rule Based Reliability Analysis For Vlsi Circuit Design written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with categories.
This report describes the development and application of parametric and geometry based macro-models of hot-carrier induced dynamic degradation in MOS VLSI circuits. Previously, a simulation based approach has been used for reliability analysis, but this is inefficient for reliability assessment of very large scale integrated circuits. Geometry-based macro-models for hot-carrier reliability estimation have been developed. The macro-models express hot-carrier damage as functions of designable parameters such as transistor size (W), output loading capacitance (C1) and the input signal slew rate (a). A prototype rule- based reliability diagnosis tool, iRULE, has been developed. This tool uses the macro-models for designing hot-carrier resistant circuits without the need for transient reliability simulations. This provides the ability to analyze very large circuits with more than one million transistors on a workstation in a short amount of time. This report also describes a fast timing reliability simulation tool, ILLIADS-R, that can accurately estimate hot-carrier degradation while providing several orders of magnitude speed up over traditional transistor-level circuit simulators. Reliability, Hot-carrier degradation, VLSI CMOS Circuits, Simulation.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1995
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Aeronautics categories.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1989
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Aeronautics categories.
Soft Error Reliability Of Vlsi Circuits
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Author : Behnam Ghavami
language : en
Publisher: Springer Nature
Release Date : 2020-10-13
Soft Error Reliability Of Vlsi Circuits written by Behnam Ghavami and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-10-13 with Technology & Engineering categories.
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Government Reports Announcements Index
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Author :
language : en
Publisher:
Release Date : 1994-09
Government Reports Announcements Index written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-09 with Science categories.
Government Reports Annual Index
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Author :
language : en
Publisher:
Release Date : 1994
Government Reports Annual Index written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Government reports announcements & index categories.
Probabilistic Techniques For Reliability Analysis Of Vlsi Circuits
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Author : I. N. Hajj
language : en
Publisher:
Release Date : 1996
Probabilistic Techniques For Reliability Analysis Of Vlsi Circuits written by I. N. Hajj and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Integrated circuits categories.
Integrated Circuit Quality And Reliability
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Author : Eugene R. Hnatek
language : en
Publisher: CRC Press
Release Date : 2018-10-03
Integrated Circuit Quality And Reliability written by Eugene R. Hnatek and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-03 with Technology & Engineering categories.
Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.
Hot Carrier Reliability Of Mos Vlsi Circuits
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Author : Yusuf Leblebici
language : en
Publisher: Springer
Release Date : 2012-09-27
Hot Carrier Reliability Of Mos Vlsi Circuits written by Yusuf Leblebici and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-27 with Technology & Engineering categories.
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits. Hot-carrier induced degrada tion of MOS transistor characteristics is one of the primary mechanisms affecting the long-term reliability of MOS VLSI circuits. It is likely to become even more important in future generation chips, since the down ward scaling of transistor dimensions without proportional scaling of the operating voltage aggravates this problem. A thorough understanding of the physical mechanisms leading to hot-carrier related degradation of MOS transistors is a prerequisite for accurate circuit reliability evaluation. It is also being recognized that important reliability concerns other than the post-manufacture reliability qualification need to be addressed rigorously early in the design phase. The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits. If the predicted reliability does not satisfy the requirements, appropriate design modifications may be carried out to improve the resistance of the devices to degradation.
Information Technology Atlas Europe
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Author : International Organisations Services
language : en
Publisher: IOS Press
Release Date : 1990
Information Technology Atlas Europe written by International Organisations Services and has been published by IOS Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Business & Economics categories.