Soft Error Reliability Of Vlsi Circuits

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Soft Error Reliability Of Vlsi Circuits

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Author : Behnam Ghavami
language : en
Publisher: Springer Nature
Release Date : 2020-10-13

Soft Error Reliability Of Vlsi Circuits written by Behnam Ghavami and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-10-13 with Technology & Engineering categories.

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

Early Soft Error Reliability Assessment Of Convolutional Neural Networks Executing On Resource Constrained Iot Edge Devices

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Author : Geancarlo Abich
language : en
Publisher: Springer Nature
Release Date : 2023-01-01

Early Soft Error Reliability Assessment Of Convolutional Neural Networks Executing On Resource Constrained Iot Edge Devices written by Geancarlo Abich and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-01-01 with Technology & Engineering categories.

This book describes an extensive and consistent soft error assessment of convolutional neural network (CNN) models from different domains through more than 14.8 million fault injections, considering different precision bit-width configurations, optimization parameters, and processor models. The authors also evaluate the relative performance, memory utilization, and soft error reliability trade-offs analysis of different CNN models considering a compiler-based technique w.r.t. traditional redundancy approaches.

Advanced Simulation And Test Methodologies For Vlsi Design

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Author : G. Russell
language : en
Publisher: Springer Science & Business Media
Release Date : 1989-02-28

Advanced Simulation And Test Methodologies For Vlsi Design written by G. Russell and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989-02-28 with Computers categories.

Vlsi Design And Test For Systems Dependability

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Author : Shojiro Asai
language : en
Publisher: Springer
Release Date : 2018-07-20

Vlsi Design And Test For Systems Dependability written by Shojiro Asai and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-20 with Technology & Engineering categories.

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Vlsi Soc Research Trends In Vlsi And Systems On Chip

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Author : Giovanni De Micheli
language : en
Publisher: Springer
Release Date : 2010-08-23

Vlsi Soc Research Trends In Vlsi And Systems On Chip written by Giovanni De Micheli and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-08-23 with Computers categories.

This book contains extended and revised versions of the best papers presented during the fourteenth IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration. This conference provides a forum to exchange ideas and show industrial and academic research results in microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels.

Noise Contamination In Nanoscale Vlsi Circuits

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Author : Selahattin Sayil
language : en
Publisher: Springer Nature
Release Date : 2022-08-31

Noise Contamination In Nanoscale Vlsi Circuits written by Selahattin Sayil and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-08-31 with Technology & Engineering categories.

This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.

Architecture Design For Soft Errors

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Author : Shubu Mukherjee
language : en
Publisher: Morgan Kaufmann
Release Date : 2011-08-29

Architecture Design For Soft Errors written by Shubu Mukherjee and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-08-29 with Computers categories.

Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. - Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors - Shows readers how to quantify their soft error reliability - Provides state-of-the-art techniques to protect against soft errors

Soft Error Reliability Using Virtual Platforms

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Author : Felipe Rocha da Rosa
language : en
Publisher: Springer Nature
Release Date : 2020-11-02

Soft Error Reliability Using Virtual Platforms written by Felipe Rocha da Rosa and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-02 with Technology & Engineering categories.

This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets.

On Chip Current Sensors For Reliable Secure And Low Power Integrated Circuits

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Author : Rodrigo Possamai Bastos
language : en
Publisher: Springer Nature
Release Date : 2019-09-30

On Chip Current Sensors For Reliable Secure And Low Power Integrated Circuits written by Rodrigo Possamai Bastos and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-09-30 with Technology & Engineering categories.

This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs.

Soft Errors In Modern Electronic Systems

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Author : Michael Nicolaidis
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-09-24

Soft Errors In Modern Electronic Systems written by Michael Nicolaidis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-09-24 with Technology & Engineering categories.

This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.