Secondary Ion Mass Spectroscopy Of Solid Surfaces
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Secondary Ion Mass Spectroscopy Of Solid Surfaces
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Author : V. T. Cherepin
language : en
Publisher: CRC Press
Release Date : 2020-04-28
Secondary Ion Mass Spectroscopy Of Solid Surfaces written by V. T. Cherepin and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-04-28 with Science categories.
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.
Secondary Ion Mass Spectrometry
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Author : J. C. Vickerman
language : en
Publisher: Oxford University Press, USA
Release Date : 1989
Secondary Ion Mass Spectrometry written by J. C. Vickerman and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Business & Economics categories.
This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Tof Sims
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Author : J. C. Vickerman
language : en
Publisher: IM Publications
Release Date : 2013
Tof Sims written by J. C. Vickerman and has been published by IM Publications this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Mass spectrometry categories.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Ion Spectroscopies For Surface Analysis
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Author : Alvin W. Czanderna
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Ion Spectroscopies For Surface Analysis written by Alvin W. Czanderna and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.
Cluster Secondary Ion Mass Spectrometry
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Author : Christine M. Mahoney
language : en
Publisher: John Wiley & Sons
Release Date : 2013-04-17
Cluster Secondary Ion Mass Spectrometry written by Christine M. Mahoney and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Secondary Ion Mass Spectrometry
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Author : F. A. Stevie
language : en
Publisher:
Release Date : 2016
Secondary Ion Mass Spectrometry written by F. A. Stevie and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with Technology & Engineering categories.
Secondary ion mass spectroscopy is a technology used primarily to determine the surface chemistry and structure of any particular material. It is a crucial analytical tool in determining the quality and integrity of everything from semiconductor electronics materials to films and coatings used in all sorts of materials and products. It is especially useful in studying the surface characteristics of materials, as well as chemical surface adsorption and oxidative processes. This new book will bring the reader quickly up to speed on the essential principles of this technology, the latest equipment and instrumentation developments, the newest trends in measurement and analysis, and the many new applications that are being found for this type of spectrometry. Additional reading will be provided for further study.
Secondary Ion Mass Spectrometry Studies Of Solids And Surfaces
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Author : N. Winograd
language : en
Publisher:
Release Date : 1985
Secondary Ion Mass Spectrometry Studies Of Solids And Surfaces written by N. Winograd and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with categories.
We have recently completed construction of an energy- and angle-resolved detector for neutral particles desorbed from ion bombarded surfaces. It is based on a time-of-flight measurement for the neutral energies, multiphoton resonance ionization (MPRI) for the angular information. Using this detector, we have initiated a series of experiments aimed at determining the energy and angular distributions of the Rh atoms ejected from clean and adsorbate covered polycrystalline and single crystal surfaces. From the polycrystalline material, we find the velocity distribution of Rh atoms follows closely the form predicted by Thompson with a peak intensity occuring at approximately 5 eV and a high energy tail decreasing in intensity as E-2. Polar angle distributions exhibit nearly a cos2 shape. From a Rh(001) crystal, the velocity distribution generally peaks at higher value than that found from the polycrystalline surface, and depends strongly on the value of the polar collection angle. In addition to energy distribution measurements into a given angle, we are able to extract angular distribution measurements into a given azimuth from Rh(001) show three peaks of preferred ejection angles. Originator supplied keywords include: Surface Analysis, Secondary Ion Mass Spectrometry, Ion Bombardment, Multi-Photon, Clusters.
Secondary Ion Mass Spectrometry Sims Iii
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Author : A. Benninghoven
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Secondary Ion Mass Spectrometry Sims Iii written by A. Benninghoven and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
Secondary Ion Mass Spectrometry
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Author : Paul van der Heide
language : en
Publisher: John Wiley & Sons
Release Date : 2014-08-19
Secondary Ion Mass Spectrometry written by Paul van der Heide and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-08-19 with Science categories.
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
Electron And Ion Spectroscopy Of Solids
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Author : L. Fiermans
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Electron And Ion Spectroscopy Of Solids written by L. Fiermans and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Science categories.
Surface physics and chemistry have in recent years become one of the most active fields in solid state research. A number of techniques have been developed, and both the experimental aspect and the correlated theory are evolving at an extremely fast rate. Electron and ion spectroscopy are of major importance in this development. In this volume, which contains edited and extended versions of eight sets of lectures given at the NATO Advanced Study Institute held at Ghent, Belgium, from August 29 to September 9, 1977, a re view of the state of the art in these fields is given from both an experimental and a theoretical point of view. Electron emission techniques such as UPS (ultraviolet photoemission spectroscopy), XPS (x-ray photoemission spectroscopy), and AES (Auger electron spectroscopy) constitute the major part of this volume, reflecting the fact that they continue to be the most widely applied surface techniques. Recent developments in the application of synchrotron radiation to angle-resolved photoelectron spectroscopy are extensively covered, from an experimental point of view by Prof. W. E. Spicer (Stanford University, U.S.A.) and from a theoretical point of view by Dr. A. Liebsch (Kernforschungsanlage Julich, Germany). Emphasis is put on the study of energy bands in layered structures, and on chemisorption on well-defined surfaces. Chemisorption and catalysis on metals is treated in detail by Prof. G. Ertl (Universitat Munchen, Germany). This chapter contains a review of the application of the different surface techniques to specific surface systems.