Soft Circuits
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Soft Circuits
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Author : Kylie Peppler
language : en
Publisher: MIT Press
Release Date : 2014-10-10
Soft Circuits written by Kylie Peppler and has been published by MIT Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-10-10 with Education categories.
Introducing students to the world of wearable technology. Soft Circuits introduces students to the world of wearable technology. Using Modkit, an accessible DIY electronics toolkit, students learn to create e-textile cuffs, “electrici-tee” shirts, and solar-powered backpacks. Students also learn the importance of one component to the whole—how, for example, changing the structure of LED connections immediately affects the number of LEDs that light up.
Soft Errors
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Author : Jean-Luc Autran
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Soft Errors written by Jean-Luc Autran and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.
Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.
Soft Error Reliability Of Vlsi Circuits
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Author : Behnam Ghavami
language : en
Publisher: Springer Nature
Release Date : 2020-10-13
Soft Error Reliability Of Vlsi Circuits written by Behnam Ghavami and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-10-13 with Technology & Engineering categories.
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Circuit And Layout Techniques For Soft Error Resilient Digital Cmos Circuits
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Author : Hsiao-Heng Kelin Lee
language : en
Publisher: Stanford University
Release Date : 2011
Circuit And Layout Techniques For Soft Error Resilient Digital Cmos Circuits written by Hsiao-Heng Kelin Lee and has been published by Stanford University this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with categories.
Radiation-induced soft errors are a major concern for modern digital circuits, especially memory elements. Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e. latches and flip-flops, is challenging. Traditional techniques for designing soft-error-resilient sequential elements generally address single node errors, or Single Event Upsets (SEUs). However, with technology scaling, the charge deposited by a single particle strike can be simultaneously collected and shared by multiple circuit nodes, resulting in Single Event Multiple Upsets (SEMUs). In this work, we target SEMUs by presenting a design framework for soft-error-resilient sequential cell design with an overview of existing circuit and layout techniques for soft error mitigation, and introducing a new soft error resilience layout design principle called LEAP, or Layout Design through Error-Aware Transistor Positioning. We then discuss our application of LEAP to the SEU-immune Dual Interlocked Storage Cell (DICE) by implementing a new sequential element layout called LEAP-DICE, retaining the original DICE circuit topology. We compare the soft error performance of SEU-immune flip-flops with the LEAP-DICE flip-flop using a test chip in 180nm CMOS under 200-MeV proton radiation and conclude that 1) our LEAP-DICE flip-flop encounters on average 2,000X and 5X fewer errors compared to a conventional D flip-flop and our reference DICE flip-flop, respectively; 2) our LEAP-DICE flip-flop has the best soft error performance among all existing SEU-immune flip-flops; 3) In the evaluation of our design framework, we also discovered new soft error effects related to operating conditions such as voltage scaling, clock frequency setting and radiation dose.
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
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Author : Ronald D Schrimpf
language : en
Publisher: World Scientific
Release Date : 2004-07-29
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices written by Ronald D Schrimpf and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-07-29 with Technology & Engineering categories.
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Analysis And Design Of Resilient Vlsi Circuits
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Author : Rajesh Garg
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-10-22
Analysis And Design Of Resilient Vlsi Circuits written by Rajesh Garg and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-10-22 with Technology & Engineering categories.
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Mitigating Process Variability And Soft Errors At Circuit Level For Finfets
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Author : Alexandra Zimpeck
language : en
Publisher: Springer Nature
Release Date : 2021-03-10
Mitigating Process Variability And Soft Errors At Circuit Level For Finfets written by Alexandra Zimpeck and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-03-10 with Technology & Engineering categories.
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.
Soft Errors In Modern Electronic Systems
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Author : Michael Nicolaidis
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-09-24
Soft Errors In Modern Electronic Systems written by Michael Nicolaidis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-09-24 with Technology & Engineering categories.
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Building Squishy Circuits
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Author : AnnMarie Thomas
language : en
Publisher: Cherry Lake
Release Date : 2017-08-01
Building Squishy Circuits written by AnnMarie Thomas and has been published by Cherry Lake this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-08-01 with Juvenile Nonfiction categories.
With Squishy Circuits, you can create your own electrical circuits using soft, squishy dough. Through simple text written to foster creativity and problem solving, students will the art of innovation. Large, colorful images show students how to complete activities. Additional tools, including a glossary and an index, help students learn new vocabulary and locate information.
Design Analysis And Test Of Logic Circuits Under Uncertainty
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Author : Smita Krishnaswamy
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-09-21
Design Analysis And Test Of Logic Circuits Under Uncertainty written by Smita Krishnaswamy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-21 with Technology & Engineering categories.
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.