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Stochastic Process Variation In Deep Submicron Cmos


Stochastic Process Variation In Deep Submicron Cmos
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Stochastic Process Variation In Deep Submicron Cmos


Stochastic Process Variation In Deep Submicron Cmos
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Author : Amir Zjajo
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-19

Stochastic Process Variation In Deep Submicron Cmos written by Amir Zjajo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-19 with Technology & Engineering categories.


One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits. In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.



Advancing Vlsi Through Machine Learning


Advancing Vlsi Through Machine Learning
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Author : Abhishek Narayan Tripathi
language : en
Publisher: CRC Press
Release Date : 2025-03-31

Advancing Vlsi Through Machine Learning written by Abhishek Narayan Tripathi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-03-31 with Technology & Engineering categories.


This book explores the synergy between very large-scale integration (VLSI) and machine learning (ML) and its applications across various domains. It investigates how ML techniques can enhance the design and testing of VLSI circuits, improve power efficiency, optimize layouts, and enable novel architectures. This book bridges the gap between VLSI and ML, showcasing the potential of this integration in creating innovative electronic systems, advancing computing capabilities, and paving the way for a new era of intelligent devices and technologies. Additionally, it covers how VLSI technologies can accelerate ML algorithms, enabling more efficient and powerful data processing and inference engines. It explores both hardware and software aspects, covering topics like hardware accelerators, custom hardware for specific ML tasks, and ML-driven optimization techniques for chip design and testing. This book will be helpful for academicians, researchers, postgraduate students, and those working in ML-driven VLSI.



Real Time Multi Chip Neural Network For Cognitive Systems


Real Time Multi Chip Neural Network For Cognitive Systems
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Author : Amir Zjajo
language : en
Publisher: CRC Press
Release Date : 2022-09-01

Real Time Multi Chip Neural Network For Cognitive Systems written by Amir Zjajo and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-09-01 with Science categories.


Simulation of brain neurons in real-time using biophysically-meaningful models is a pre-requisite for comprehensive understanding of how neurons process information and communicate with each other, in effect efficiently complementing in-vivo experiments. In spiking neural networks (SNNs), propagated information is not just encoded by the firing rate of each neuron in the network, as in artificial neural networks (ANNs), but, in addition, by amplitude, spike-train patterns, and the transfer rate. The high level of realism of SNNs and more significant computational and analytic capabilities in comparison with ANNs, however, limit the size of the realized networks. Consequently, the main challenge in building complex and biophysically-accurate SNNs is largely posed by the high computational and data transfer demands.Real-Time Multi-Chip Neural Network for Cognitive Systems presents novel real-time, reconfigurable, multi-chip SNN system architecture based on localized communication, which effectively reduces the communication cost to a linear growth. The system use double floating-point arithmetic for the most biologically accurate cell behavior simulation, and is flexible enough to offer an easy implementation of various neuron network topologies, cell communication schemes, as well as models and kinds of cells. The system offers a high run-time configurability, which reduces the need for resynthesizing the system. In addition, the simulator features configurable on- and off-chip communication latencies as well as neuron calculation latencies. All parts of the system are generated automatically based on the neuron interconnection scheme in use. The simulator allows exploration of different system configurations, e.g. the interconnection scheme between the neurons, the intracellular concentration of different chemical compounds (ions), which affect how action potentials are initiated and propagate.



Brain Machine Interface


Brain Machine Interface
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Author : Amir Zjajo
language : en
Publisher: Springer
Release Date : 2016-03-30

Brain Machine Interface written by Amir Zjajo and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-03-30 with Technology & Engineering categories.


This book provides a complete overview of significant design challenges in respect to circuit miniaturization and power reduction of the neural recording system, along with circuit topologies, architecture trends, and (post-silicon) circuit optimization algorithms. The introduced novel circuits for signal conditioning, quantization, and classification, as well as system configurations focus on optimized power-per-area performance, from the spatial resolution (i.e. number of channels), feasible wireless data bandwidth and information quality to the delivered power of implantable system.



Low Power High Resolution Analog To Digital Converters


Low Power High Resolution Analog To Digital Converters
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Author : Amir Zjajo
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-10-29

Low Power High Resolution Analog To Digital Converters written by Amir Zjajo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-10-29 with Technology & Engineering categories.


With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.



Rf Frontend Design For Process Variation Tolerant Receivers


Rf Frontend Design For Process Variation Tolerant Receivers
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Author : Pooyan Sakian
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-02-22

Rf Frontend Design For Process Variation Tolerant Receivers written by Pooyan Sakian and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-02-22 with Technology & Engineering categories.


This book discusses a number of challenges faced by designers of wireless receivers, given complications caused by the shrinking of electronic and mobile devices circuitry into ever-smaller sizes and the resulting complications on the manufacturability, production yield, and the end price of the products. The authors describe the impact of process technology on the performance of the end product and equip RF designers with countermeasures to cope with such problems. The mechanisms by which these problems arise are analyzed in detail and novel solutions are provided, including design guidelines for receivers with robustness to process variations and details of circuit blocks that obtain the required performance level. Describes RF receiver frontends and their building blocks from a system- and circuit-level perspective; Provides system-level analysis of a generic RF receiver frontend with robustness to process variations; Includes details of CMOS circuit design at 60GHz and reconfigurable circuits at 60GHz; Covers millimeter-wave circuit design with robustness to process variations.



Timing Performance Of Nanometer Digital Circuits Under Process Variations


Timing Performance Of Nanometer Digital Circuits Under Process Variations
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Author : Victor Champac
language : en
Publisher: Springer
Release Date : 2018-04-18

Timing Performance Of Nanometer Digital Circuits Under Process Variations written by Victor Champac and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-04-18 with Technology & Engineering categories.


This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.



Strain Engineered Mosfets


Strain Engineered Mosfets
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Author : C.K. Maiti
language : en
Publisher: CRC Press
Release Date : 2018-10-03

Strain Engineered Mosfets written by C.K. Maiti and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-03 with Technology & Engineering categories.


Currently strain engineering is the main technique used to enhance the performance of advanced silicon-based metal-oxide-semiconductor field-effect transistors (MOSFETs). Written from an engineering application standpoint, Strain-Engineered MOSFETs introduces promising strain techniques to fabricate strain-engineered MOSFETs and to methods to assess the applications of these techniques. The book provides the background and physical insight needed to understand new and future developments in the modeling and design of n- and p-MOSFETs at nanoscale. This book focuses on recent developments in strain-engineered MOSFETS implemented in high-mobility substrates such as, Ge, SiGe, strained-Si, ultrathin germanium-on-insulator platforms, combined with high-k insulators and metal-gate. It covers the materials aspects, principles, and design of advanced devices, fabrication, and applications. It also presents a full technology computer aided design (TCAD) methodology for strain-engineering in Si-CMOS technology involving data flow from process simulation to process variability simulation via device simulation and generation of SPICE process compact models for manufacturing for yield optimization. Microelectronics fabrication is facing serious challenges due to the introduction of new materials in manufacturing and fundamental limitations of nanoscale devices that result in increasing unpredictability in the characteristics of the devices. The down scaling of CMOS technologies has brought about the increased variability of key parameters affecting the performance of integrated circuits. This book provides a single text that combines coverage of the strain-engineered MOSFETS and their modeling using TCAD, making it a tool for process technology development and the design of strain-engineered MOSFETs.



Analog Circuit Design For Process Variation Resilient Systems On A Chip


Analog Circuit Design For Process Variation Resilient Systems On A Chip
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Author : Marvin Onabajo
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-03-08

Analog Circuit Design For Process Variation Resilient Systems On A Chip written by Marvin Onabajo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-03-08 with Technology & Engineering categories.


This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters; Includes built-in testing techniques, linked to current industrial trends; Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches; Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.



Closing The Gap Between Asic Custom


Closing The Gap Between Asic Custom
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Author : David Chinnery
language : en
Publisher: Springer Science & Business Media
Release Date : 2002-06-30

Closing The Gap Between Asic Custom written by David Chinnery and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-06-30 with Computers categories.


This book carefully details design tools and techniques for high-performance ASIC design. Using these techniques, the performance of ASIC designs can be improved by two to three times. Important topics include: Improving performance through microarchitecture; Timing-driven floorplanning; Controlling and exploiting clock skew; High performance latch-based design in an ASIC methodology; Automatically identifying and synthesizing complex logic gates; Automated cell sizing to increase performance and reduce power; Controlling process variation.These techniques are illustrated by designs running two to three times the speed of typical ASICs in the same process generation.