Structure And Electronic Properties Of Ultrathin Dielectric Films On Silicon And Related Structures Volume 592
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Structure And Electronic Properties Of Ultrathin Dielectric Films On Silicon And Related Structures Volume 592
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Author : D. A. Buchanan
language : en
Publisher:
Release Date : 2000-10-17
Structure And Electronic Properties Of Ultrathin Dielectric Films On Silicon And Related Structures Volume 592 written by D. A. Buchanan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-10-17 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. The book, first published in 2000, includes detailed theoretical studies of the nature of SiO2 and its interface with silicon, electron paramagnetic resonance for the study of defects, electron tunneling, and band alignment among others.
Structure And Electronic Properties Of Ultrathin Dielectric Films On Silicon And Related Structures
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Author :
language : en
Publisher:
Release Date : 1999
Structure And Electronic Properties Of Ultrathin Dielectric Films On Silicon And Related Structures written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Dielectric films categories.
Structure And Electronic Properties Of Ultrathin Dielectric Films On Silicon And Related Structures
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Author : D. A. Buchanan
language : en
Publisher: Cambridge University Press
Release Date : 2014-06-05
Structure And Electronic Properties Of Ultrathin Dielectric Films On Silicon And Related Structures written by D. A. Buchanan and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-06-05 with Technology & Engineering categories.
With the ever-decreasing dimension, laterally and vertically, in CMOS and DRAM technology, the understanding of thin insulators and their interfaces with silicon have become of critical importance. As a result of this scaling of semiconductor devices, an increased interest from industrial, government, and university laboratories has become evident in this field of study. The book, first published in 2000, includes detailed theoretical studies of the nature of SiO2 and its interface with silicon, electron paramagnetic resonance for the study of defects, electron tunneling, and band alignment among others. There are also studies developing new techniques and advancing our understanding of these dielectrics and interfaces, including addressing the issue of dielectric breakdown. Aside from the work addressing SiO2, there are a number of papers regarding the application of the so-called 'high-k' dielectrics. The high-k materials addressed in the volume include such films as Ta2O5, HfO2, Bi2Ti2O7, CeO2, and ZrO2.
Oxide Reliability A Summary Of Silicon Oxide Wearout Breakdown And Reliability
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Author : David J Dumin
language : en
Publisher: World Scientific
Release Date : 2002-01-18
Oxide Reliability A Summary Of Silicon Oxide Wearout Breakdown And Reliability written by David J Dumin and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-01-18 with Technology & Engineering categories.
This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.
Gan And Related Alloys 1999 Volume 595
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Author : Thomas H. Myers
language : en
Publisher:
Release Date : 2000-05-05
Gan And Related Alloys 1999 Volume 595 written by Thomas H. Myers and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-05-05 with Science categories.
This book on gallium nitride (GaN) and associated materials focuses on advances in basic science, as well as the rapidly maturing technologies involving blue/green light emitters, detectors and high-power electronics. A highlight is a report on wide-bandgap semiconductor research done in Europe. Also reported is the commercialization of a laser operating at 405nm wavelength with a 4000-hour device lifetime. At 450nm emission wavelength, significant reductions in lifetime were found, and are believed to arise from nonideal properties of the InGaN alloy used in the active layer of the device. Additional topics include: the significant success of transistors for microwave applications; improvements in the epitaxy of GaN, using both selective area growth techniques (lateral epitaxy overgrowth) and introducing low-temperature intralayers in the films; advances in both molecular beam epitaxy and metal-organic vapor phase epitaxy, including several studies of quantum dot formation in strained alloys and improvements in hydride vapor phase epitaxy, particularly for providing very thick films.
Interfaces Adhesion And Processing In Polymer Systems
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Author : Spiros Haralambos Anastasiadis
language : en
Publisher:
Release Date : 2001
Interfaces Adhesion And Processing In Polymer Systems written by Spiros Haralambos Anastasiadis and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Science categories.
Thermoelectric Materials 2000 The Next Generation Materials For Small Scale Refrigeration And Power Generation Applications Volume 626
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Author : Terry M. Tritt
language : en
Publisher:
Release Date : 2001-03
Thermoelectric Materials 2000 The Next Generation Materials For Small Scale Refrigeration And Power Generation Applications Volume 626 written by Terry M. Tritt and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-03 with Science categories.
The presentations from the symposium are grouped into the following topics: skutterudites, superlattice, new materials, quantum wires and dots, half-heusler alloys and quasicrystals, TE theory, thermionics, clathrates, and thin films TE. In addition, poster sessions include the following: semiconductors with tetrahedral anions as potential thermoelectric materials, lattice dynamics study of anisotropic heat conduction in supperlattices, structure and thermoelectric properties of new quaternary tin and lead Bismuth selenides, attributes of the Seebeck coefficient of Bismuth microwire array composites, and High-Z Lanthanum-Cerium Hexaborate thin films for low-temperature applications. c. Book News Inc.
Characterization And Metrology For Ulsi Technology 2003
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Author : David G. Seiler
language : en
Publisher: American Institute of Physics
Release Date : 2003-10-08
Characterization And Metrology For Ulsi Technology 2003 written by David G. Seiler and has been published by American Institute of Physics this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-10-08 with Computers categories.
The worldwide semiconductor community faces increasingly difficult challenges as it moves into the manufacturing of chips with feature sizes approaching 100 nm and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Topics include: integrated circuit history, challenges and overviews, front end, lithography, interconnect and back end, and critical analytical techniques. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continue the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The editors believe that this book of collected papers provides a concise and effective portrayal of industry characterization needs and the way they are being addressed by industry, academia, and government to continue the dramatic progress in semiconductor technology. Hopefully, it will also provide a basis for stimulating advances in metrology and new ideas for research and development.
Oxidation Studies Of Ultra Low Atomic Step Density Silicon 111
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Author : Antonio Chandrea Oliver
language : en
Publisher:
Release Date : 2001
Oxidation Studies Of Ultra Low Atomic Step Density Silicon 111 written by Antonio Chandrea Oliver and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with categories.
Magnetoresistive Oxides And Related Materials Volume 602
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Author : M. S. Rzchowski
language : en
Publisher:
Release Date : 2001-05-23
Magnetoresistive Oxides And Related Materials Volume 602 written by M. S. Rzchowski and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-05-23 with Science categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.