Surface And Interface Characterization By Electron Optical Methods
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Surface And Interface Characterization By Electron Optical Methods
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Author : Ugo Valdre
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Surface And Interface Characterization By Electron Optical Methods written by Ugo Valdre and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Science categories.
The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.
Handbook Of Surface And Interface Analysis
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Author : John C. Riviere
language : en
Publisher: CRC Press
Release Date : 2009-06-24
Handbook Of Surface And Interface Analysis written by John C. Riviere and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-06-24 with Science categories.
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
Surface Analysis Methods In Materials Science
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Author : D.J. O'Connor
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Surface Analysis Methods In Materials Science written by D.J. O'Connor and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.
The success of the first edition of this broad appeal book prompted the prepa ration of an updated and expanded second edition. The field of surface anal ysis is constantly changing as it answers the need to provide more specific and more detailed information about surface composition and structure in advanced materials science applications. The content of the second edition meets that need by including new techniques and expanded applications. Newcastle John O'Connor Clayton Brett Sexton Adelaide Roger Smart January 2003 Preface to the First Edition The idea for this book stemmed from a remark by Philip Jennings of Mur doch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface anal ysis and applications to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experi ence and range of coverage of surface analytical techniques and applications to provide a text for this purpose. A list of techniques and applications to be included was agreed at that meeting. The intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alteration in content.
Surfaces And Interfaces In Ceramic And Ceramic Metal Systems
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Author : Joseph Pask
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Surfaces And Interfaces In Ceramic And Ceramic Metal Systems written by Joseph Pask and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
The 17th University Conference on Ceramics, which also was the 7th LBL/MMRD International Materials Symposium, was held on the campus of the University of California at Berkeley from July 28 to August 1, 1980. It was devoted to the subject of surfaces and interfaces in ceramic and ceramic-metal systems. The program was timely and of great interest, as indicated by the large number of contributed papers, which included contributions from ten foreign countries. These proceedings are divided into the following categories dealing with the chemistry and physics of interfaces: calculations of interface/surface states, characterization of surfaces and inter faces, thermodynamics of interfaces, influence of surface and inter faces on selected ceramic processes, grain boundary structures, effects of grain boundaries on deformation and fracture, interfacial phenomena, formation of interfaces, development of adhesion, and reactions at interfaces. A number of papers deal specifically with the Si-Si02 interface, which probably has received more attention than any other because of its importance in the electronics industry. This coverage fulfills the principal objective of the symposium which was to explore and assess the current fundamental understand ing of interfaces and surfaces. A parallel objective of the symposium was fulfilled by a group of papers dealing with the correlation of interfacial characteris tics with mechanical behavior. This group includes papers dealing with the adherence of dissimilar materials at interfaces.
Surface And Thin Film Analysis
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Author : Gernot Friedbacher
language : en
Publisher: John Wiley & Sons
Release Date : 2011-03-31
Surface And Thin Film Analysis written by Gernot Friedbacher and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-31 with Technology & Engineering categories.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Survey Of Semiconductor Physics
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Author : Karl Wolfgang Böer
language : en
Publisher: Springer Science & Business Media
Release Date : 1990
Survey Of Semiconductor Physics written by Karl Wolfgang Böer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Science categories.
Taking up where the first volume left off, this work provides coverage of the inhomogeneous semiconductor. It deals mainly with Si and GaAs, but also investigates other materials of theoretical and practical interest, such as Ge, other III-V and II-VI compounds, and amorphous SiH. Equipped with this source, physicists, semiconductor engineers, device engineers and fabrication engineers will have access to a vast reservoir of practical information on the design, production and operations of semiconductor devices.
Advanced Materials Interfaces
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Author : Ashutosh Tiwari
language : en
Publisher: John Wiley & Sons
Release Date : 2016-07-15
Advanced Materials Interfaces written by Ashutosh Tiwari and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-07-15 with Technology & Engineering categories.
Advanced Material Interfaces is a state-of-the-art look at innovative methodologies and strategies adopted for interfaces and their applications. The 13 chapters are written by eminent researchers not only elaborate complex interfaces fashioned of solids, liquids, and gases, but also ensures cross-disciplinary mixture and blends of physics, chemistry, materials science, engineering and life sciences. Advanced interfaces operate fundamental roles in essentially all integrated devices. It is therefore of the utmost urgency to focus on how newly-discovered fundamental constituents and interfacial progressions can be materialized and used for precise purposes. Interfaces are associated in wide multiplicity of application spectrum from chemical catalysis to drug functions and the advancement is funnelled by fine-tuning of our fundamental understanding of the interface effects.
Handbook Of Microscopy
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Author : S. Amelinckx
language : en
Publisher: John Wiley & Sons
Release Date : 2008-08-29
Handbook Of Microscopy written by S. Amelinckx and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-08-29 with Science categories.
Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"
Metallization And Metal Semiconductor Interfaces
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Author : Inder P. Batra
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Metallization And Metal Semiconductor Interfaces written by Inder P. Batra and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
This book represents the work presented at a NATO Advanced Research Workshop on "Metallization and Metal-Semiconductor Interfaces", held at the Technical University of Munich, Garching, W. Germany from 22-26 August 1988. The major focus of the workshop was to evaluate critically the progress made in the area of metal-semiconductor interfaces. The underlying theme was the mechanism of Schottky barrier formation and a serious as sessment of the various models. A significant fraction of the workshop time was also spent in discussing the interaction of alkali metals with semiconductors. Alkali metals on semi conductors form ordered overlayers and the resulting system often exhibits one-dimensional metallic properties. The nature of their interaction has introduced new and exciting com plexities and this was pursued at length during the lively discussions at the workshop. A half a day was devoted to Scanning Tunneling Microscopy, the emphasis being on its utility in providing structural and electronic character of low-coverage regime. The book should pro vide readers with the most current status of the research activity in the general area of metal-semiconductor interfaces at an international level. It should also serve as an excellent introduction to the field, since sufficient review type of material has also been included The workshop organizers, Dr. I. P. Batra (Director), mM Almaden Research Center, San Jose, Prof. S. Ciraci, Bilkent University, Ankara, Prof. C. Y. Pong, University of California, Davis, Prof. Dr. F. Koch (Local Chairman), Technical University Munich, Garching, Dr. H.
Basic Properties Of Semiconductors
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Author : P.T. Landsberg
language : en
Publisher: Elsevier
Release Date : 2016-04-19
Basic Properties Of Semiconductors written by P.T. Landsberg and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-04-19 with Science categories.
Since Volume 1 was published in 1982, the centres of interest in the basic physics of semiconductors have shifted. Volume 1 was called Band Theory and Transport Properties in the first edition, but the subject has broadened to such an extent that Basic Properties is now a more suitable title.Seven chapters have been rewritten by the original authors. However, twelve chapters are essentially new, with the bulk of this work being devoted to important current topics which give this volume an almost encyclopaedic form.The first three chapters discuss various aspects of modern band theory and the next two analyze impurities in semiconductors. Then follow chapters on semiconductor statistics and on surfaces, interfaces and band offsets as they occur in heterojunctions. Chapters 8 to 19 report on newer topics (though a survey of transport properties of carriers is also included). Among these are transport of hot electrons, and thermoelectric effects including here and elsewhere properties of low-dimensional and mesoscopic structures. The electron-hole liquid, the quantum Hall effect, localisation, ballistic transport, coherence in superlattices, current ideas on tunnelling and on quantum confinement and scattering processes are also covered.