System Test And Diagnosis
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System Test And Diagnosis
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Author : William R. Simpson
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
System Test And Diagnosis written by William R. Simpson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail. The ideas presented emphasize that it is possible to diagnose complex systems efficiently. Since the notion of system is hierarchical, these ideas are applicable to all levels. The philosophy is presented in the context of a model-based approach, using the information flow model, that focuses on the information provided by the tests rather than the functions embedded in the system. Detailed algorithms are offered for evaluating system testability, performing efficient diagnosis, verifying and validating the models, and constructing an architecture for system maintenance. Several advanced algorithms, not commonly available in existing diagnosis tools, are discussed, including reasoning with inexact or uncertain test data, breaking large problems into manageable smaller problems, diagnosing systems with time sensitive information and time dependent tests and learning from experience. The book is divided into three parts. The first part provides motivation for careful development of the subject and the second part provides the tools necessary for analyzing system testability and computing diagnostic strategies. The third part presents advanced topics in diagnosis. Several case studies are provided, including a single detailed case study. Smaller case studies describe experiences from actual applications of the methods discussed. The detailed case study walks the reader through a complete analysis of a system to illustrate the concepts and describe the analyses that are possible. All case studies are based upon real systems that have been modeled for the purposes of diagnosis. System Test and Diagnosis is the culmination of nearly twelve years of research into diagnosis modeling and its applications. It is designed as a primary reference for engineers and practitioners interested in system test and diagnosis.
System Test And Diagnosis
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Author : William R. Simpson
language : en
Publisher: Springer Science & Business Media
Release Date : 1994-08-31
System Test And Diagnosis written by William R. Simpson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-08-31 with Technology & Engineering categories.
System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail. The ideas presented emphasize that it is possible to diagnose complex systems efficiently. Since the notion of system is hierarchical, these ideas are applicable to all levels. The philosophy is presented in the context of a model-based approach, using the information flow model, that focuses on the information provided by the tests rather than the functions embedded in the system. Detailed algorithms are offered for evaluating system testability, performing efficient diagnosis, verifying and validating the models, and constructing an architecture for system maintenance. Several advanced algorithms, not commonly available in existing diagnosis tools, are discussed, including reasoning with inexact or uncertain test data, breaking large problems into manageable smaller problems, diagnosing systems with time sensitive information and time dependent tests and learning from experience. The book is divided into three parts. The first part provides motivation for careful development of the subject and the second part provides the tools necessary for analyzing system testability and computing diagnostic strategies. The third part presents advanced topics in diagnosis. Several case studies are provided, including a single detailed case study. Smaller case studies describe experiences from actual applications of the methods discussed. The detailed case study walks the reader through a complete analysis of a system to illustrate the concepts and describe the analyses that are possible. All case studies are based upon real systems that have been modeled for the purposes of diagnosis. System Test and Diagnosis is the culmination of nearly twelve years of research into diagnosis modeling and its applications. It is designed as a primary reference for engineers and practitioners interested in system test and diagnosis.
Research Perspectives And Case Studies In System Test And Diagnosis
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Author : John W. Sheppard
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Research Perspectives And Case Studies In System Test And Diagnosis written by John W. Sheppard and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
"System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is ¿any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail . System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the same problems and occasional disagreement between authors as to definitions or the importance of factors. ... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge ofthat science...”. From the Preface
Design For At Speed Test Diagnosis And Measurement
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Author : Benoit Nadeau-Dostie
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11
Design For At Speed Test Diagnosis And Measurement written by Benoit Nadeau-Dostie and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
Knowledge Driven Board Level Functional Fault Diagnosis
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Author : Fangming Ye
language : en
Publisher: Springer
Release Date : 2016-08-19
Knowledge Driven Board Level Functional Fault Diagnosis written by Fangming Ye and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-08-19 with Technology & Engineering categories.
This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design. • Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.
Intelligent Knowledge Based Systems
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Author : Cornelius T. Leondes
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-04-28
Intelligent Knowledge Based Systems written by Cornelius T. Leondes and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-04-28 with Computers categories.
For most of our history the wealth of a nation was limited by the size and stamina of the work force. Today, national wealth is measured in intellectual capital. Nations possessing skillful people in such diverse areas as science, medicine, business, and engineering produce innovations that drive the nation to a higher quality of life. To better utilize these valuable resources, intelligent, knowledge-based systems technology has evolved at a rapid and significantly expanding rate. Reflecting the most fascinating AI-based research and its broad practical applications, intelligent, knowledge-based systems technology is being utilized by nations to improve their medical care, advance their engineering technology, and increase their manufacturing productivity, as well as play a significant role in a very wide variety of other areas of activity of substantive significance. Today, in the beginning of the 21st century, it is difficult to imagine the development of the modern world without extensive use of the AI information technology that is rapidly transforming the global, knowledge- based economy as well as entire societies. The breadth of the major application areas of intelligent, knowledge-based systems technology is very impressive. These include, among other areas: Agriculture, Business, Chemistry, Communications, Computer Systems, Education, Electronics, Engineering, Environment, Geology, Image Processing, Information Management, Law, Manufacturing, Mathematics, Medicine, Meteorology, Military, Mining, Power Systems, Science, Space Technology, and Transportation. The great breadth and expanding significance of this field on the international scene require a multi-volume, major reference work for an adequately substantive treatment of the subject, "Intelligent Knowledge-Based Systems: Business and Technology in The New Millennium." This work consists of the following distinctly titled and well integrated volumes. Volume I. Knowledge-Based Systems; Volume II. Information Technology; Volume III.Expert and Agent Systems; Volume IV.Intelligent Systems; Volume V.Neural Networks. This five-volume set clearly manifests the great significance of these key technologies for the new economies of the new millennium. The Volumes: Volume 1, Knowledge-Based Systems, addresses the basic question of how accumulated data and staff expertise from business operations can be abstracted into useful knowledge, and how such knowledge can be applied to ongoing operations. The wide range of areas represented includes product innovation and design, intelligent database exploitation, and business model analysis. (Eleven chapters) Volume 2, Information Technology, addresses the important question of how data should be stored and used to maximize its overall value. Case studies examine a wide variety of application areas including product development, manufacturing, product management, and product pricing. (Ten chapters) Volume 3, Expert and Agent Systems, considers such application areas as image databases, business process monitoring, e-commerce, and production planning and scheduling, offering a wide range of perspectives and business-function concentrations to stimulate readers' innovative thought. (Ten chapters) Volume 4, Intelligent Systems, discusses applications in such areas as mission-critical functions, business forecasting, medical patient care, and product design and development. (Nine chapters) Volume 5, Neural Networks, Fuzzy Theory, and Genetic Algorithm Techniques, explores applications in such areas as bioinformatics, product life-cycle cost estimating, product development, computer-aided design, product assembly, and facility location. (Ten chapters) The discussions in these volumes provide a wealth of practical ideas intended to foster innovation in thought and, consequently, in the further development of technology. Together, they comprise a significant and uniquely comprehensive reference source for research workers, practitioners, computer scientists, academics, students, and others on the international scene for years to come.
Communications Signal Processing And Systems
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Author : Qilian Liang
language : en
Publisher: Springer
Release Date : 2018-06-07
Communications Signal Processing And Systems written by Qilian Liang and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-06-07 with Technology & Engineering categories.
This book brings together papers presented at the 2017 International Conference on Communications, Signal Processing, and Systems (ICCSP 2017), which was held on July 14–17, 2017 in Harbin, China. Presenting the latest developments and discussing the interactions and links between these multidisciplinary fields, the book spans topics ranging from communications, signal processing and systems. It is aimed at undergraduate and graduate electrical engineering, computer science and mathematics students, researchers and engineers from academia and industry as well as government employees.
Introduction To Advanced System On Chip Test Design And Optimization
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Author : Erik Larsson
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-03-30
Introduction To Advanced System On Chip Test Design And Optimization written by Erik Larsson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-03-30 with Technology & Engineering categories.
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Fault Injection Techniques And Tools For Embedded Systems Reliability Evaluation
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Author : Alfredo Benso
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-15
Fault Injection Techniques And Tools For Embedded Systems Reliability Evaluation written by Alfredo Benso and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-15 with Technology & Engineering categories.
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance.
Cost Analysis Of Electronic Systems
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Author : Peter Sandborn
language : en
Publisher: World Scientific
Release Date : 2013
Cost Analysis Of Electronic Systems written by Peter Sandborn and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Business & Economics categories.
Understanding the cost ramifications of design, manufacturing and life-cycle management decisions is of central importance to businesses associated with all types of electronic systems. Cost Analysis of Electronic Systems contains carefully developed models and theory that practicing engineers can directly apply to the modeling of costs for real products and systems. In addition, this book brings to light and models many contributions to life-cycle costs that practitioners are aware of but never had the tools or techniques to address quantitatively in the past.Cost Analysis of Electronic Systems melds elements of traditional engineering economics with manufacturing process and life-cycle cost management concepts to form a practical foundation for predicting the cost of electronic products and systems. Various manufacturing cost analysis methods are addressed including: process-flow, parametric, cost of ownership, and activity-based costing. The effects of learning curves, data uncertainty, test and rework processes, and defects are considered. Aspects of system sustainment and life-cycle cost modeling including reliability (warranty, burn-in), maintenance (sparing and availability), and obsolescence are treated. Finally, total cost of ownership of systems and return on investment are addressed.Real life design scenarios from integrated circuit fabrication, electronic systems assembly, substrate fabrication, and electronic systems managementare used as examples of the application of the cost estimation methods developed within the book.