Vlsi Very Large Scale Integrated Circuits Device Reliability Models
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Vlsi Very Large Scale Integrated Circuits Device Reliability Models
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Author : D. Coit
language : en
Publisher:
Release Date : 1984
Vlsi Very Large Scale Integrated Circuits Device Reliability Models written by D. Coit and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with categories.
This report details a study in which the objective was to develop failure rate prediction models for VLSI, Hybrid, analog microprocessor, and VHSIC devices. A description is given of the various phases involved in reliability prediction model development, such as; literature collection/review, investigation of failure modes, failure rate data collection, statistical analysis methodologies, model factors quantification, and model validation. For VLSI, Hybrid and analog microprocessor devices, the models are given in a form which can easily be included in MIL-HDBK-217. For VHSIC devices, this effort was necessarily limited to the identification of necessary model factors (attributes) which should be included in a quantitative model acceptable for inclusion in MIL-HDBK-217. This effort was necessarily limited to the development of a qualitative reliability prediction model due to the lack of available data on VHSIC devices at the time of this study. Keywords include: VLSI, Hybrid microcircuit, Integrated circuit, Failure rate, MIL-HDBK-217, and Reliability prediction.
Vlsi Soc Design For Reliability Security And Low Power
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Author : Youngsoo Shin
language : en
Publisher: Springer
Release Date : 2016-09-12
Vlsi Soc Design For Reliability Security And Low Power written by Youngsoo Shin and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-09-12 with Computers categories.
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
Machine Learning In Vlsi Computer Aided Design
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Author : Ibrahim (Abe) M. Elfadel
language : en
Publisher: Springer
Release Date : 2019-03-15
Machine Learning In Vlsi Computer Aided Design written by Ibrahim (Abe) M. Elfadel and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-03-15 with Technology & Engineering categories.
This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center
System Integration
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Author : Kurt Hoffmann
language : en
Publisher: John Wiley & Sons
Release Date : 2006-02-08
System Integration written by Kurt Hoffmann and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-02-08 with Technology & Engineering categories.
The development of large-scale integrated systems on a chip has had a dramatic effect on circuit design methodology. Recent years have seen an escalation of interest in systems level integration (system-on-a-chip) and the development of low power, high chip density circuits and systems. Kurt Hoffmann sets out to address a wide range of issues relating to the design and integration of integrated circuit components and provides readers with the methodology by which simple equations for the estimation of transistor geometries and circuit behaviour can be deduced. The broad coverage of this unique book ranges from field effect transistor design, MOS transistor modelling and the fundamentals of digital CMOS circuit design through to MOS memory architecture and design. Highlights the increasing requirement for information on system-on-a-chip design and integration. Combines coverage of semiconductor physics, digital VLSI design and analog integrated circuits in one volume for the first time. Written with the aim of bridging the gap between semiconductor device physics and practical circuit design. Introduces the basic behaviour of semiconductor components for ICs and covers the design of both digital and analog circuits in CMOS and BiCMOS technologies. Broad coverage will appeal to both students and practising engineers alike. Written by a respected expert in the field with a proven track record of publications in this field. Drawing upon considerable experience within both industry and academia, Hoffmann’s outstanding text, will prove an invaluable resource for designers, practising engineers in the semiconductor device field and electronics systems industry as well as Postgraduate students of microelectronics, electrical and computer engineering.
Mosfet Models For Vlsi Circuit Simulation
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Author : Narain D. Arora
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Mosfet Models For Vlsi Circuit Simulation written by Narain D. Arora and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.
Metal Oxide Semiconductor (MOS) transistors are the basic building block ofMOS integrated circuits (I C). Very Large Scale Integrated (VLSI) circuits using MOS technology have emerged as the dominant technology in the semiconductor industry. Over the past decade, the complexity of MOS IC's has increased at an astonishing rate. This is realized mainly through the reduction of MOS transistor dimensions in addition to the improvements in processing. Today VLSI circuits with over 3 million transistors on a chip, with effective or electrical channel lengths of 0. 5 microns, are in volume production. Designing such complex chips is virtually impossible without simulation tools which help to predict circuit behavior before actual circuits are fabricated. However, the utility of simulators as a tool for the design and analysis of circuits depends on the adequacy of the device models used in the simulator. This problem is further aggravated by the technology trend towards smaller and smaller device dimensions which increases the complexity of the models. There is extensive literature available on modeling these short channel devices. However, there is a lot of confusion too. Often it is not clear what model to use and which model parameter values are important and how to determine them. After working over 15 years in the field of semiconductor device modeling, I have felt the need for a book which can fill the gap between the theory and the practice of MOS transistor modeling. This book is an attempt in that direction.
Mosfet Modeling For Vlsi Simulation
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Author : Narain Arora
language : en
Publisher: World Scientific
Release Date : 2007
Mosfet Modeling For Vlsi Simulation written by Narain Arora and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with Technology & Engineering categories.
A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations. The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1995
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Aeronautics categories.
Prototype Rule Based Reliability Analysis For Vlsi Circuit Design
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Author :
language : en
Publisher:
Release Date : 1994
Prototype Rule Based Reliability Analysis For Vlsi Circuit Design written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with categories.
This report describes the development and application of parametric and geometry based macro-models of hot-carrier induced dynamic degradation in MOS VLSI circuits. Previously, a simulation based approach has been used for reliability analysis, but this is inefficient for reliability assessment of very large scale integrated circuits. Geometry-based macro-models for hot-carrier reliability estimation have been developed. The macro-models express hot-carrier damage as functions of designable parameters such as transistor size (W), output loading capacitance (C1) and the input signal slew rate (a). A prototype rule- based reliability diagnosis tool, iRULE, has been developed. This tool uses the macro-models for designing hot-carrier resistant circuits without the need for transient reliability simulations. This provides the ability to analyze very large circuits with more than one million transistors on a workstation in a short amount of time. This report also describes a fast timing reliability simulation tool, ILLIADS-R, that can accurately estimate hot-carrier degradation while providing several orders of magnitude speed up over traditional transistor-level circuit simulators. Reliability, Hot-carrier degradation, VLSI CMOS Circuits, Simulation.
Reliability In Very Large Scale Integrated Circuits
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Author : Martyn Simon Davies
language : en
Publisher:
Release Date : 1992
Reliability In Very Large Scale Integrated Circuits written by Martyn Simon Davies and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Integrated circuits categories.
Guidebook For Managing Silicon Chip Reliability
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Author : Michael Pecht
language : en
Publisher: CRC Press
Release Date : 2017-11-22
Guidebook For Managing Silicon Chip Reliability written by Michael Pecht and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-11-22 with Technology & Engineering categories.
Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This quick reference on semiconductor reliability addresses the key question: How will the understanding of failure mechanisms affect the future? Chapters discuss: failure sites, operational loads, and failure mechanism intrinsic device sensitivities electromigration hot carrier aging time dependent dielectric breakdown mechanical stress induced migration alpha particle sensitivity electrostatic discharge (ESD) and electrical overstress latch-up qualification screening guidelines for designing reliability Guidebook for Managing Silicon Chip Reliability focuses on device failure and causes throughout - providing a thorough framework on how to model the mechanism, test for defects, and avoid and manage damage. It will serve as an exceptional resource for electrical engineers as well as mechanical engineers working in the field of electronic packaging.