A Pattern Recognition Based Method For Ic Failure Analysis
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A Pattern Recognition Based Method For Ic Failure Analysis
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Author : Andrzej Strojwas
language : en
Publisher:
Release Date : 1984
A Pattern Recognition Based Method For Ic Failure Analysis written by Andrzej Strojwas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with categories.
A Pattern Recognition Based Method For Ic Failure Analysis
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Author : Andrzej J. Strojwas
language : en
Publisher:
Release Date : 1982
A Pattern Recognition Based Method For Ic Failure Analysis written by Andrzej J. Strojwas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1982 with Integrated circuits categories.
Pattern Recognition Based Methods For Ic Failure Analysis
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Author : Andrzej Josef Strojwas
language : en
Publisher:
Release Date : 1986
Pattern Recognition Based Methods For Ic Failure Analysis written by Andrzej Josef Strojwas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Optical pattern recognition categories.
A Pattern Recognition Based Methods For Ic Failure Analysis
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Author : Andrzej Jozef Strojwas
language : en
Publisher:
Release Date : 1982
A Pattern Recognition Based Methods For Ic Failure Analysis written by Andrzej Jozef Strojwas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1982 with Artificial intelligence categories.
Yield Simulation For Integrated Circuits
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Author : D.M. Walker
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17
Yield Simulation For Integrated Circuits written by D.M. Walker and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Computers categories.
In the summer of 1981 I was asked to consider the possibility of manufacturing a 600,000 transistor microprocessor in 1985. It was clear that the technology would only be capable of manufacturing 100,000-200,000 transistor chips with acceptable yields. The control store ROM occupied approximately half of the chip area, so I considered adding spare rows and columns to increase ROM yield. Laser-programmed polysilicon fuses would be used to switch between good and bad circuits. Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. The fabrication technology did not yet exist, so I was unable to experimentally verify the benefits of redundancy. When the technology did become available, it would be too late in the development schedule to spend time running test chips. The yield analysis had to be done analytically or by simulation. Analytic yield analysis techniques did not offer sufficient accuracy for dealing with complex structures. The simulation techniques then available were very labor-intensive and seemed more suitable for redundant memories and other very regular structures [Stapper 80J. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator. Since I was unable to convince anyone to build such a simulator for me, I embarked on the research myself.
Testing And Diagnosis Of Analog Circuits And Systems
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Author : Ruey-wen Liu
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Testing And Diagnosis Of Analog Circuits And Systems written by Ruey-wen Liu and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.
IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.
Ieee International Conference On Circuits And Computers Iccc 82
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Author :
language : en
Publisher:
Release Date : 1982
Ieee International Conference On Circuits And Computers Iccc 82 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1982 with Computers categories.
Microelectronic Failure Analysis
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Author :
language : en
Publisher: ASM International
Release Date : 2002-01-01
Microelectronic Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-01-01 with Technology & Engineering categories.
Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee
Proceedings
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Author :
language : en
Publisher:
Release Date : 1982
Proceedings written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1982 with Computers categories.
Microelectronics Failure Analysis
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Author :
language : en
Publisher: ASM International
Release Date : 2004-01-01
Microelectronics Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-01-01 with Technology & Engineering categories.
For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron