Advanced X Ray Characterization Of Ulsi Materials
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Advanced X Ray Characterization Of Ulsi Materials
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Author : Anival Ayala
language : en
Publisher:
Release Date : 2000
Advanced X Ray Characterization Of Ulsi Materials written by Anival Ayala and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Integrated circuits categories.
Advanced Interconnects For Ulsi Technology
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Author : Mikhail Baklanov
language : en
Publisher: John Wiley & Sons
Release Date : 2012-04-02
Advanced Interconnects For Ulsi Technology written by Mikhail Baklanov and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-04-02 with Technology & Engineering categories.
Finding new materials for copper/low-k interconnects is critical to the continuing development of computer chips. While copper/low-k interconnects have served well, allowing for the creation of Ultra Large Scale Integration (ULSI) devices which combine over a billion transistors onto a single chip, the increased resistance and RC-delay at the smaller scale has become a significant factor affecting chip performance. Advanced Interconnects for ULSI Technology is dedicated to the materials and methods which might be suitable replacements. It covers a broad range of topics, from physical principles to design, fabrication, characterization, and application of new materials for nano-interconnects, and discusses: Interconnect functions, characterisations, electrical properties and wiring requirements Low-k materials: fundamentals, advances and mechanical properties Conductive layers and barriers Integration and reliability including mechanical reliability, electromigration and electrical breakdown New approaches including 3D, optical, wireless interchip, and carbon-based interconnects Intended for postgraduate students and researchers, in academia and industry, this book provides a critical overview of the enabling technology at the heart of the future development of computer chips.
Crystal Growth And Characterization Of Advanced Materials Proceedings Of The International School On Crystal Growth And Characterization Of Advanced Matherials
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Author : A N Christensen
language : en
Publisher: World Scientific
Release Date : 1988-12-31
Crystal Growth And Characterization Of Advanced Materials Proceedings Of The International School On Crystal Growth And Characterization Of Advanced Matherials written by A N Christensen and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988-12-31 with Technology & Engineering categories.
Contents:Fundamental Aspects of Crystal Growth from the Melt (C Paorici & L Zanotti)Phase Diagrams in Crystal Growth (A N Christensen)Growth Procedures and Perfection of Semiconductor Materials (A Lindegaard-Andersen)Atomistic Aspects of Crystal Growth and Epitaxy (I Markov)Fundamentals of Liquid Phase Epitaxial Growth (P Kordos)Determination of Few Selected Basic Parameters of the Investigation of AIII-BV Semiconductors Using X-Ray Methods (H Bruhl)Multijunction Solar Cells (I Chambouleyron)Application of the Mossbauer Spectroscopy to the Study of Magnetic Materials (G Albanese)Metallic Magnetism in Modern Materials (D Givord)and others Readership: Materials scientists.
Semiconductor Strain Metrology
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Author : Terence K. S. Wong
language : en
Publisher: Bentham Science Publishers
Release Date : 2012
Semiconductor Strain Metrology written by Terence K. S. Wong and has been published by Bentham Science Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with Technology & Engineering categories.
This book surveys the major and newly developed techniques for semiconductor strain metrology. Semiconductor strain metrology has emerged in recent years as a topic of great interest to researchers involved in thin film and nanoscale device characterizati
Electron Microscopy Of Semiconducting Materials And Ulsi Devices
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Author : Clive Hayzelden
language : en
Publisher:
Release Date : 1998
Electron Microscopy Of Semiconducting Materials And Ulsi Devices written by Clive Hayzelden and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Technology & Engineering categories.
The first symposium on electron microscopy and materials for ultra-large scale integration (ULSI) at the Society's meeting attracted 34 papers by contributors from Asia, North America, and Europe. They cover specimen preparation and defect analysis in semiconductor devices; metallization, silicides, and diffusion barriers; the advanced characterization of ULSI structures, and semiconductor epitaxy and heterostructures. Annotation copyrighted by Book News, Inc., Portland, OR
High Resolution X Ray Diffraction And Topography For The Characterization Of Advanced Materials
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Author : Brian Keith Tanner
language : en
Publisher:
Release Date : 2001
High Resolution X Ray Diffraction And Topography For The Characterization Of Advanced Materials written by Brian Keith Tanner and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Materials categories.
Characterization And Metrology For Ulsi Technology 2000
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Author : David G. Seiler
language : en
Publisher:
Release Date : 2001
Characterization And Metrology For Ulsi Technology 2000 written by David G. Seiler and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Integrated circuits categories.
Advanced Nanoscale Ulsi Interconnects Fundamentals And Applications
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Author : Yosi Shacham-Diamand
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-09-19
Advanced Nanoscale Ulsi Interconnects Fundamentals And Applications written by Yosi Shacham-Diamand and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-09-19 with Science categories.
In Advanced ULSI interconnects – fundamentals and applications we bring a comprehensive description of copper-based interconnect technology for ultra-lar- scale integration (ULSI) technology for integrated circuit (IC) application. In- grated circuit technology is the base for all modern electronics systems. You can ?nd electronics systems today everywhere: from toys and home appliances to a- planes and space shuttles. Electronics systems form the hardware that together with software are the bases of the modern information society. The rapid growth and vast exploitation of modern electronics system create a strong demand for new and improved electronic circuits as demonstrated by the amazing progress in the ?eld of ULSI technology. This progress is well described by the famous “Moore’s law” which states, in its most general form, that all the metrics that describe integrated circuit performance (e. g. , speed, number of devices, chip area) improve expon- tially as a function of time. For example, the number of components per chip d- bles every 18 months and the critical dimension on a chip has shrunk by 50% every 2 years on average in the last 30 years. This rapid growth in integrated circuits te- nology results in highly complex integrated circuits with an increasing number of interconnects on chips and between the chip and its package. The complexity of the interconnect network on chips involves an increasing number of metal lines per interconnect level, more interconnect levels, and at the same time a reduction in the interconnect line critical dimensions.
Materials For Information Technology
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Author : Ehrenfried Zschech
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-07-02
Materials For Information Technology written by Ehrenfried Zschech and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-07-02 with Technology & Engineering categories.
This book provides an up to date survey of the state of the art of research into the materials used in information technology, and will be bought by researchers in universities, institutions as well as research workers in the semiconductor and IT industries.
Proceedings Of The First International Symposium On Advanced Materials For Ulsi
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Author : Martin P. Scott
language : en
Publisher:
Release Date : 1988
Proceedings Of The First International Symposium On Advanced Materials For Ulsi written by Martin P. Scott and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Integrated circuits categories.