Defects And Diffusion In Semiconductors X
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Defects And Diffusion In Semiconductors X
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Author : David Fisher
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2008-03-18
Defects And Diffusion In Semiconductors X written by David Fisher and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-03-18 with Technology & Engineering categories.
An Annual Retrospective X
Defects And Diffusion In Semiconductors
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Author :
language : en
Publisher:
Release Date : 2007
Defects And Diffusion In Semiconductors written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with Semiconductors categories.
Defect And Diffusion Forum Vols 55 56
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Author : Fred H. Wohlbier
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 1987-01-01
Defect And Diffusion Forum Vols 55 56 written by Fred H. Wohlbier and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987-01-01 with Technology & Engineering categories.
Defect and Diffusion Forum Vols. 55-56
Defects And Diffusion In Semiconductors I
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Author : David Fisher
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 1998-07-16
Defects And Diffusion In Semiconductors I written by David Fisher and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-07-16 with Technology & Engineering categories.
An Annual Retrospective
Point Defects In Group Iv Semiconductors
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Author : S. Pizzini
language : en
Publisher: Materials Research Forum LLC
Release Date : 2017-04-05
Point Defects In Group Iv Semiconductors written by S. Pizzini and has been published by Materials Research Forum LLC this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-04-05 with Technology & Engineering categories.
A self-consistent model of point defects requires a reliable connection with the experimentally deduced structural, spectroscopic and thermodynamic properties of the defect centres, to allow their unambiguous identification. This book focuses on the properties of defects in group IV semiconductors and seeks to clarify whether full knowledge of their chemical nature can account for several problems encountered in practice. It is shown how difficult the fulfilment of self-consistency conditions can be, even today, after more than four decades of dedicated research work, especially in the case of compound semiconductors, such as SiC, but also in the apparently simple cases of silicon and germanium. The reason for this is that the available microscopic models do not yet account for defect interactions in real solids.
Extended Defects In Semiconductors
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Author : D. B. Holt
language : en
Publisher: Cambridge University Press
Release Date : 2007-04-12
Extended Defects In Semiconductors written by D. B. Holt and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-04-12 with Science categories.
A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.
D X Centres And Other Metastable Defects In Semiconductors Proceedings Of The Int Symposium Mauterndorf Austria 18 22 February 1991
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Author : W. Jantsch
language : en
Publisher: CRC Press
Release Date : 2020-11-25
D X Centres And Other Metastable Defects In Semiconductors Proceedings Of The Int Symposium Mauterndorf Austria 18 22 February 1991 written by W. Jantsch and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-25 with Science categories.
Since the first reports on metastable defects in III-V and II-VI compound semiconductors appeared in the late 1960s, the number of reports on defects with metastable states has been growing at an ever increasing rate. D(X)-center and other metastability defects cause many technical problems that are exacerbated by the uncertainty and controversy surrounding the mechanisms that cause them. A lively mix of theoretical and experimental discussions, D(X)-Centres and other Metastable Defects in Semiconductors presents a timely investigation of these systems. The book discusses topics such as, the validity of negative or positive U models, as well as alternative views that challenge existing ideas. The richness and precision of experimental data now emerging in the field is chronicled as are new investigative techniques. Based on an INT symposium, this book provides a successful forum where an extraordinary variety of ideas, including new perspectives, are examined critically.
Defect Recognition And Image Processing In Semiconductors 1997
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Author : J. Doneker
language : en
Publisher: Routledge
Release Date : 2017-11-22
Defect Recognition And Image Processing In Semiconductors 1997 written by J. Doneker and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-11-22 with Science categories.
Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
Defects And Diffusion In Semiconductors Iii
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Author : David Fisher
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2000-08-26
Defects And Diffusion In Semiconductors Iii written by David Fisher and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-08-26 with Technology & Engineering categories.
An Annual Retrospective III
Defects And Diffusion In Ii Vi Compounds
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Author : David Fisher
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 1999-08-25
Defects And Diffusion In Ii Vi Compounds written by David Fisher and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999-08-25 with Technology & Engineering categories.
A 10-Year Retrospective