Design To Test
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Design To Test
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Author : John Turino
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Design To Test written by John Turino and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.
A Practitioner S Guide To Software Test Design
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Author : Lee Copeland
language : en
Publisher: Artech House
Release Date : 2004
A Practitioner S Guide To Software Test Design written by Lee Copeland and has been published by Artech House this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Computers categories.
Written by a leading expert in the field, this unique volume contains current test design approaches and focuses only on software test design. Copeland illustrates each test design through detailed examples and step-by-step instructions.
Introduction To Advanced System On Chip Test Design And Optimization
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Author : Erik Larsson
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-03-30
Introduction To Advanced System On Chip Test Design And Optimization written by Erik Larsson and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-03-30 with Technology & Engineering categories.
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Design For Test And Test Optimization Techniques For Tsv Based 3d Stacked Ics
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Author : Brandon Noia
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-19
Design For Test And Test Optimization Techniques For Tsv Based 3d Stacked Ics written by Brandon Noia and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-19 with Technology & Engineering categories.
This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.
Vlsi Test Principles And Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Elsevier
Release Date : 2006-08-14
Vlsi Test Principles And Architectures written by Laung-Terng Wang and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-08-14 with Technology & Engineering categories.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
High Performance Memory Testing
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Author : R. Dean Adams
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11
High Performance Memory Testing written by R. Dean Adams and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Design Driven Testing
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Author : Matt Stephens
language : en
Publisher: Apress
Release Date : 2011-01-11
Design Driven Testing written by Matt Stephens and has been published by Apress this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-01-11 with Computers categories.
The groundbreaking book Design Driven Testing brings sanity back to the software development process by flipping around the concept of Test Driven Development (TDD)—restoring the concept of using testing to verify a design instead of pretending that unit tests are a replacement for design. Anyone who feels that TDD is “Too Damn Difficult” will appreciate this book. Design Driven Testing shows that, by combining a forward-thinking development process with cutting-edge automation, testing can be a finely targeted, business-driven, rewarding effort. In other words, you’ll learn how to test smarter, not harder. Applies a feedback-driven approach to each stage of the project lifecycle. Illustrates a lightweight and effective approach using a core subset of UML. Follows a real-life example project using Java and Flex/ActionScript. Presents bonus chapters for advanced DDTers covering unit-test antipatterns (and their opposite, “test-conscious” design patterns), and showing how to create your own test transformation templates in Enterprise Architect.
Practical Test Design
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Author : Istvan Forgacs
language : en
Publisher: BCS, The Chartered Institute for IT
Release Date : 2019-08-28
Practical Test Design written by Istvan Forgacs and has been published by BCS, The Chartered Institute for IT this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-28 with categories.
This book presents the key test design techniques, in line with ISTQB, and explains the why and when of using them, with practical examples and code snippets. How and why the techniques can be combined is covered, as are automated test design methods. Tips and exercises are included throughout the book.
Linear Models For Optimal Test Design
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Author : Wim J. van der Linden
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-01-01
Linear Models For Optimal Test Design written by Wim J. van der Linden and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-01 with Social Science categories.
Wim van der Linden was just given a lifetime achievement award by the National Council on Measurement in Education. There is no one more prominent in the area of educational testing. There are hundreds of computer-based credentialing exams in areas such as accounting, real estate, nursing, and securities, as well as the well-known admissions exams for college, graduate school, medical school, and law school - there is great need on the theory of testing. This book presents the statistical theory and practice behind constructing good tests e.g., how is the first test item selected, how are the next items selected, and when do you have enough items.
The Ux Five Second Rules
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Author : Paul Doncaster
language : en
Publisher: Morgan Kaufmann
Release Date : 2014-03-21
The Ux Five Second Rules written by Paul Doncaster and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-03-21 with Computers categories.
The five-second test is one of the most convenient rapid UX testing methods available, although its value can be compromised by ignoring the restrictions of the method. The Five-Second Rules uses detailed examples from a collection of more than 300 tests to describe the strengths and weaknesses of this rapid testing method. Readers will learn about the "five-second rules" for getting useful data, and will explore what types of design issues can be resolved by using the method. A five-second test (also known as "timeout test" and "exposure test") involves displaying a visual or informational design for five seconds, removing it from view, then asking what aspects were recalled most easily or vividly. The goal is to understand what stands out most about a design or product, and the impact on the viewer's perception of it. Describes the origins of the method and its usefulness in modern UX design research and testing Conveys the need to structure tests carefully so that time, effort, and money are not wasted, and compiled data is not misleading Fosters an appreciation for the method's outcomes and how they can contribute to the success or failure of a proposed design