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Diffraction And Imaging Techniques In Material Science Vol 2 Imaging And Diffraction Techniques


Diffraction And Imaging Techniques In Material Science Vol 2 Imaging And Diffraction Techniques
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Diffraction And Imaging Techniques In Material Science P2


Diffraction And Imaging Techniques In Material Science P2
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Author : S Amelinckx
language : en
Publisher: Elsevier
Release Date : 2012-12-02

Diffraction And Imaging Techniques In Material Science P2 written by S Amelinckx and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Computers categories.


Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.



Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques


Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques
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Author :
language : en
Publisher:
Release Date : 1978

Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Electron microscopy categories.




Diffraction And Imaging Techniques In Material Science Vol 2 Imaging And Diffraction Techniques


Diffraction And Imaging Techniques In Material Science Vol 2 Imaging And Diffraction Techniques
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Author : S. Amelinckx (ed)
language : en
Publisher:
Release Date :

Diffraction And Imaging Techniques In Material Science Vol 2 Imaging And Diffraction Techniques written by S. Amelinckx (ed) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with categories.




Handbook Of Microscopy


Handbook Of Microscopy
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Author : Marcel Locquin
language : en
Publisher: Butterworth-Heinemann
Release Date : 2013-10-22

Handbook Of Microscopy written by Marcel Locquin and has been published by Butterworth-Heinemann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Science categories.


Handbook of Microscopy is a manual that deals mainly with the basic instruments and techniques used in light microscopy and its biological applications. A large section is devoted to the study of organic matter in microfossils preserved in rocks, in view of its stratigraphic importance in mining and oil prospecting. This text is comprised of six chapters; the first of which introduces the reader to the basic principles as well as to the instruments and techniques used in light microscopy. This book also discusses the microscopes and electronic flashlights for photomicrography, along with the use of monochromatic light, stereological and physicochemical microanalysis, microanalysis by electron microscopy, and microdetermination of physical values. Attention then turns to staining and impregnation and methods of fixation, examination, cutting, and mounting. The remaining chapters focus on the microscopy of topological stains and non-specific cytological stains, with emphasis on special methods used in animal and plant histology and protistology and mycological methods in pathology. This book is written specifically for microscopists.



Extended Defects In Semiconductors


Extended Defects In Semiconductors
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Author : D. B. Holt
language : en
Publisher: Cambridge University Press
Release Date : 2007-04-12

Extended Defects In Semiconductors written by D. B. Holt and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-04-12 with Science categories.


A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.



International Tables For Crystallography Volume C


International Tables For Crystallography Volume C
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Author : E. Prince
language : en
Publisher: John Wiley & Sons
Release Date : 2004-01-16

International Tables For Crystallography Volume C written by E. Prince and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-01-16 with Science categories.


International Tables for Crystallography is the definitive resource and reference work for crystallography and structural science. Each of the volumes in the series contains articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials. Emphasis is given to symmetry, diffraction methods and techniques of crystal-structure determination, and the physical and chemical properties of crystals. The data are accompanied by discussions of theory, practical explanations and examples, all of which are useful for teaching. Volume C provides the mathematical, physical and chemical information needed for experimental studies in structural crystallography. This volume covers all aspects of experimental techniques, using all three principal radiation types (X-ray, electron and neutron), from the selection and mounting of crystals and production of radiation, through data collection and analysis, to interpretation of results. Each chapter is supported by a substantial collection of references, and the volume ends with a section on precautions against radiation injury. Eleven chapters have been revised, corrected or updated for the third edition of Volume C. More information on the series can be found at: http://it.iucr.org



Principles Of Electron Optics Volume 4


Principles Of Electron Optics Volume 4
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Author : Peter W. Hawkes
language : en
Publisher: Academic Press
Release Date : 2022-05-10

Principles Of Electron Optics Volume 4 written by Peter W. Hawkes and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-05-10 with Technology & Engineering categories.


Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. - Includes authoritative coverage of many recent developments in wave electron optics - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope



Electron Microscopy


Electron Microscopy
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Author : S. Amelinckx
language : en
Publisher: John Wiley & Sons
Release Date : 2008-09-26

Electron Microscopy written by S. Amelinckx and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-09-26 with Technology & Engineering categories.


Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.



Characterization Of Crystal Growth Defects By X Ray Methods


Characterization Of Crystal Growth Defects By X Ray Methods
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Author : B.K. Tanner
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17

Characterization Of Crystal Growth Defects By X Ray Methods written by B.K. Tanner and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.


This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.



Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques


Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques
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Author : Severin Amelinckx
language : en
Publisher:
Release Date : 1978

Diffraction And Imaging Techniques In Material Science Imaging And Diffraction Techniques written by Severin Amelinckx and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Electron microscopy categories.