Diffraction Methods In Materials Science
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Diffraction Methods In Materials Science
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Author : Jindřich Hašek
language : en
Publisher:
Release Date : 1993
Diffraction Methods In Materials Science written by Jindřich Hašek and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993 with Science categories.
Diffraction Methods In Materials Science
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Author : Jerome Bernard Cohen
language : en
Publisher:
Release Date : 1966
Diffraction Methods In Materials Science written by Jerome Bernard Cohen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1966 with Science categories.
Diffraction Analysis Of The Microstructure Of Materials
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Author : Eric J. Mittemeijer
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-21
Diffraction Analysis Of The Microstructure Of Materials written by Eric J. Mittemeijer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-21 with Science categories.
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Modern Diffraction Methods
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Author : E. J. Mittemeijer
language : en
Publisher: John Wiley & Sons
Release Date : 2013-02-04
Modern Diffraction Methods written by E. J. Mittemeijer and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-02-04 with Science categories.
The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).
Experimental Methods
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Author : Herbert Herman
language : en
Publisher: Elsevier
Release Date : 2013-10-22
Experimental Methods written by Herbert Herman and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Technology & Engineering categories.
Treatise on Materials Science and Technology, Volume 19: Experimental Methods, Part A covers the methods of materials experimentation and testing. The book discusses the measurement of residual stresses by x-ray diffraction techniques; the investigation of composition variations by diffraction; and the use of Mössbauer spectroscopy in materials science. The text also describes photoluminescence techniques for studies of composition and defects in semiconductors; and materials production by high-rate sputter deposition. Graduate students in the field of materials science, laboratory scientists, and materials engineers will find the book invaluable.
X Ray Diffraction For Materials Research
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Author : Myeongkyu Lee
language : en
Publisher: CRC Press
Release Date : 2017-03-16
X Ray Diffraction For Materials Research written by Myeongkyu Lee and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-03-16 with Science categories.
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Structure From Diffraction Methods
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Author : Duncan W. Bruce
language : en
Publisher: John Wiley & Sons
Release Date : 2014-06-12
Structure From Diffraction Methods written by Duncan W. Bruce and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-06-12 with Technology & Engineering categories.
Inorganic materials show a diverse range of important properties that are desirable for many contemporary, real-world applications. Good examples include recyclable battery cathode materials for energy storage and transport, porous solids for capture and storage of gases and molecular complexes for use in electronic devices. An understanding of the function of these materials is necessary in order to optimise their behaviour for real applications, hence the importance of 'structure–property relationships'. The chapters presented in this volume deal with recent advances in the characterisation of crystalline materials. They include some familiar diffraction methods, thoroughly updated with modern advances. Also included are techniques that can now probe details of the three-dimensional arrangements of atoms in nanocrystalline solids, allowing aspects of disorder to be studied. Small-angle scattering, a technique that is often overlooked, can probe both ordered and disordered structures of materials at longer length scales than those probed by powder diffraction methods. Addressing both physical principals and recent advances in their applications, Structure from Diffraction Methods covers: Powder Diffraction X-Ray and Neutron Single-Crystal Diffraction PDF Analysis of Nanoparticles Electron Crystallography Small-Angle Scattering Ideal as a complementary reference work to other volumes in the series (Local Structural Characterisation and Multi Length-Scale Characterisation), or as an examination of the specific characterisation techniques in their own right, Structure from Diffraction Methods is a valuable addition to the Inorganic Materials Series.
Diffraction And Imaging Techniques In Material Science P2
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Author : S Amelinckx
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Diffraction And Imaging Techniques In Material Science P2 written by S Amelinckx and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Computers categories.
Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
Electron Backscatter Diffraction In Materials Science
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Author : Adam J. Schwartz
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Electron Backscatter Diffraction In Materials Science written by Adam J. Schwartz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Introduction To Diffraction In Materials Science And Engineering
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Author : Aaron D. Krawitz
language : en
Publisher: Wiley-Interscience
Release Date : 2001-04-19
Introduction To Diffraction In Materials Science And Engineering written by Aaron D. Krawitz and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-04-19 with Science categories.
Fundamentals and practical applications of diffraction for researchers, engineers, and students Materials science relies heavily on diffraction for the analysis of materials. Introduction to Diffraction in Materials Science and Engineering is a survey of the practical aspects of this valuable tool. Though it contains basic discussion of the theory and physics of diffraction, this book emphasizes understanding and the practical application of diffraction in materials science-making it a valuable text and resource for students, professionals, and researchers. Designed as a teaching and self-study text, this resource begins with a treatment of the fundamentals of crystallography and crystal structure and its importance in diffraction before moving on to cover important aspects of diffraction applications. Numerous examples and problems at the end of each chapter, including critical thinking questions, make this an excellent tool for learning and understanding. The book includes treatments of: * Basics of crystallography * Geometrical representation of crystals and reciprocal space * X-rays and neutrons * Structure factors and intensity * Powder diffraction * Qualitative (Powder Diffraction File) and quantitative phase analysis * Use of the International Tables for more complex structures and the Reitveld method * Residual stress * Introductions to texture, small diffracting units, and long-range order Aaron Krawitz provides both a practical introduction to diffraction that suits the needs of students and a resource for professionals already at work in materials science or engineering who want to utilize the power of diffraction in the study of materials.