Low Power And Reliable Sram Memory Cell And Array Design
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Low Power And Reliable Sram Memory Cell And Array Design
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Author : Koichiro Ishibashi
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-08-18
Low Power And Reliable Sram Memory Cell And Array Design written by Koichiro Ishibashi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-08-18 with Technology & Engineering categories.
Success in the development of recent advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses various issues for designing SRAM memory cells for advanced CMOS technology. To study LSI design, SRAM cell design is the best materials subject because issues about variability, leakage and reliability have to be taken into account for the design.
Terrestrial Radiation Effects In Ulsi Devices And Electronic Systems
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Author : Eishi H. Ibe
language : en
Publisher: John Wiley & Sons
Release Date : 2015-03-02
Terrestrial Radiation Effects In Ulsi Devices And Electronic Systems written by Eishi H. Ibe and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-03-02 with Technology & Engineering categories.
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
Proceedings Of Sixth International Conference On Computer And Communication Technologies
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Author : K. Reddy Madhavi
language : en
Publisher: Springer Nature
Release Date : 2025-07-25
Proceedings Of Sixth International Conference On Computer And Communication Technologies written by K. Reddy Madhavi and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-07-25 with Computers categories.
This book is a compilation of high-quality scientific papers presented at the 6th International Conference on Computer & Communication Technologies (IC3T 2024). The book covers cutting-edge technologies and applications of soft computing, artificial intelligence, and communication. In addition, a variety of further topics are discussed, which include data mining, machine intelligence, fuzzy computing, sensor networks, signal and image processing, human–computer interaction, and web intelligence.
Energy Efficient And Reliable Embedded Nanoscale Sram Design
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Author : Bhupendra Singh Reniwal
language : en
Publisher: CRC Press
Release Date : 2023-11-29
Energy Efficient And Reliable Embedded Nanoscale Sram Design written by Bhupendra Singh Reniwal and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-11-29 with Technology & Engineering categories.
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.
Robust Sram Designs And Analysis
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Author : Jawar Singh
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-08-01
Robust Sram Designs And Analysis written by Jawar Singh and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-08-01 with Technology & Engineering categories.
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.
Nanoelectronics For Next Generation Integrated Circuits
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Author : Rohit Dhiman
language : en
Publisher: CRC Press
Release Date : 2022-11-23
Nanoelectronics For Next Generation Integrated Circuits written by Rohit Dhiman and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-11-23 with Technology & Engineering categories.
The incessant scaling of complementary metal-oxide semiconductor (CMOS) technology has resulted in significant performance improvements in very-large-scale integration (VLSI) design techniques and system architectures. This trend is expected to continue in the future, but this requires breakthroughs in the design of nano-CMOS and post-CMOS technologies. Nanoelectronics refers to the possible future technologies beyond conventional CMOS scaling limits. This volume addresses the current state-of-the-art nanoelectronic technologies and presents potential options for next-generation integrated circuits. Nanoelectronics for Next-generation Integrated Circuits is a useful reference guide for researchers, engineers, and advanced students working on the frontier of the design and modeling of nanoelectronic devices and their integration aspects with future CMOS circuits. This comprehensive volume eloquently presents the design methodologies for spintronics memories, quantum-dot cellular automata, and post-CMOS FETs, including applications in emerging integrated circuit technologies.
Vlsi Design And Test For Systems Dependability
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Author : Shojiro Asai
language : en
Publisher: Springer
Release Date : 2018-07-20
Vlsi Design And Test For Systems Dependability written by Shojiro Asai and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-20 with Technology & Engineering categories.
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Circuit Technology Co Optimization Of Sram Design In Advanced Cmos Nodes
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Author : Hsiao-Hsuan Liu
language : en
Publisher: Springer Nature
Release Date : 2024-12-20
Circuit Technology Co Optimization Of Sram Design In Advanced Cmos Nodes written by Hsiao-Hsuan Liu and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-12-20 with Computers categories.
Modern computing engines—CPUs, GPUs, and NPUs—require extensive SRAM for cache designs, driven by the increasing demand for higher density, performance, and energy efficiency. This book delves into two primary areas within ultra-scaled technology nodes: (1) advancing SRAM bitcell scaling and (2) exploring innovative subarray designs to enhance power-performance-area (PPA) metrics across technology nodes. The first part of the book utilizes a bottom-up design-technology co-optimization (DTCO) approach, employing a dedicated PPA simulation framework to evaluate and identify the most promising strategies for SRAM bitcell scaling. It offers a comprehensive examination of SRAM bitcell scaling beyond 1 nm node, outlining a structured research cycle that includes identifying scaling bottlenecks, developing cutting-edge architectures with complementary field-effect transistor (CFET) technology, and addressing challenges such as process integration and routing complexities. Additionally, this book introduces a novel write margin methodology to better address the risks of write failures in resistance-dominated nodes. This methodology accounts for time-dependent parasitic bitline effects and incorporates timing setup of write-assist techniques to prevent underestimating the yield loss. In the second part, the focus shifts to a top-down DTCO approach due to the diminishing returns of bitcell scaling beyond 5 Å node at the macro level. As technology scales, increasing resistance and capacitance (RC) lead designers to adopt smaller subarray sizes to reduce effective RC and enhance subarray-level PPA. However, this approach can result in increased inter-subarray interconnect overhead, potentially offsetting macro-level improvements. This book examines the effects of various subarray sizes on macro-level PPA and finds that larger subarrays can significantly reduce interconnect overhead and improve the energy-delay-area product (EDAP) of SRAM macro. The introduction of the active interconnect (AIC) concept enables the use of larger subarray sizes, while integrating carbon nanotube FET as back-end-of-line compatible devices results in macro-level EDAP improvements of up to 65% when transitioning from standard subarrays to AIC divided subarrays. These findings highlight the future trajectory of SRAM subarray design in deeply scaled nodes.
Circuit Design For Modern Applications
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Author : A. Andrew Roobert
language : en
Publisher: CRC Press
Release Date : 2025-02-05
Circuit Design For Modern Applications written by A. Andrew Roobert and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-02-05 with Technology & Engineering categories.
This book offers a clear exploration of cutting-edge semiconductor circuit technologies and their practical applications. It covers topics like advanced transistor design, low-power consumption techniques, and high-performance circuit design. Circuit Design for Modern Applications explores the recent innovations in semiconductor technology. Bandgap reference circuits, quad model transistors, voltagecontrolled oscillators, LDO regulators, power amplifiers, low noise amplifiers, operational amplifiers, low-power CNTFET-based quaternary multipliers, and STT MRAM-based cache memory for multicore systems are discussed. It points out the difficulties in designing CMOS analog and RF circuits for mmWave applications and looks into newly developed field-effect transistors for an alternate solution. Innovative devices such as III-V material-based HEMTs, and junctionless FETs are discussed. The book also looks at creative ways to improve circuit performance and energy efficiency, which is a useful resource for academics, researchers, and industry experts working in semiconductors. This book will help the readers to stay on the cutting edge of contemporary circuit design technologies, covering various topics from fundamental circuit design to high-performance circuits.
Near Threshold Computing
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Author : Michael Hübner
language : en
Publisher: Springer
Release Date : 2015-11-14
Near Threshold Computing written by Michael Hübner and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-11-14 with Technology & Engineering categories.
This book explores near-threshold computing (NTC), a design-space using techniques to run digital chips (processors) near the lowest possible voltage. Readers will be enabled with specific techniques to design chips that are extremely robust; tolerating variability and resilient against errors. Variability-aware voltage and frequency allocation schemes will be presented that will provide performance guarantees, when moving toward near-threshold manycore chips. · Provides an introduction to near-threshold computing, enabling reader with a variety of tools to face the challenges of the power/utilization wall; · Demonstrates how to design efficient voltage regulation, so that each region of the chip can operate at the most efficient voltage and frequency point; · Investigates how performance guarantees can be ensured when moving towards NTC manycores through variability-aware voltage and frequency allocation schemes.