Materials Reliability Issues In Microelectronics
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Materials Reliability Issues In Microelectronics
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Author :
language : en
Publisher:
Release Date : 1991
Materials Reliability Issues In Microelectronics written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Microelectronics categories.
Proceedings of the "MRS Symposium on Materials Reliability Issues in Microelectronics"--Dedication, p. xiii.
Materials Reliability Issues In Microelectronics Volume 225
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Author : James R. Lloyd
language : en
Publisher:
Release Date : 1991-10-22
Materials Reliability Issues In Microelectronics Volume 225 written by James R. Lloyd and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-10-22 with Science categories.
With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.
Materials Reliability In Microelectronics
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Author :
language : en
Publisher:
Release Date : 1992
Materials Reliability In Microelectronics written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Microelectronics categories.
Materials Reliability In Microelectronics Ii Volume 265
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Author : C. V. Thompson
language : en
Publisher:
Release Date : 1992-09-30
Materials Reliability In Microelectronics Ii Volume 265 written by C. V. Thompson and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992-09-30 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Materials Reliability In Microelectronics Viii
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Author : John C. Bravman
language : en
Publisher:
Release Date : 1998
Materials Reliability In Microelectronics Viii written by John C. Bravman and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Electrodiffusion categories.
Microelectronics Failure Analysis
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Author :
language : en
Publisher: ASM International
Release Date : 2004-01-01
Microelectronics Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-01-01 with Technology & Engineering categories.
For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron
Proceedings Of The Third Symposium On Silicon Nitride And Silicon Dioxide Thin Insulating Films
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Author : Vikram J. Kapoor
language : en
Publisher: The Electrochemical Society
Release Date : 1994
Proceedings Of The Third Symposium On Silicon Nitride And Silicon Dioxide Thin Insulating Films written by Vikram J. Kapoor and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Science categories.
Reliability Of Organic Compounds In Microelectronics And Optoelectronics
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Author : Willem Dirk van Driel
language : en
Publisher: Springer Nature
Release Date : 2022-01-31
Reliability Of Organic Compounds In Microelectronics And Optoelectronics written by Willem Dirk van Driel and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-01-31 with Technology & Engineering categories.
This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.
Handbook Of Lead Free Solder Technology For Microelectronic Assemblies
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Author : Karl J. Puttlitz
language : en
Publisher: CRC Press
Release Date : 2004-02-27
Handbook Of Lead Free Solder Technology For Microelectronic Assemblies written by Karl J. Puttlitz and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-02-27 with Technology & Engineering categories.
This reference provides a complete discussion of the conversion from standard lead-tin to lead-free solder microelectronic assemblies for low-end and high-end applications. Written by more than 45 world-class researchers and practitioners, the book discusses general reliability issues concerning microelectronic assemblies, as well as factors specif
An Assessment Of The National Institute Of Standards And Technology Measurement And Standards Laboratories
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Author : National Research Council
language : en
Publisher: National Academies Press
Release Date : 2002-09-26
An Assessment Of The National Institute Of Standards And Technology Measurement And Standards Laboratories written by National Research Council and has been published by National Academies Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-09-26 with Technology & Engineering categories.
This assessment of the technical quality and relevance of the programs of the Measurement and Standards Laboratories of the National Institute of Standards and Technology is the work of the 165 members of the National Research Council's (NRC's) Board on Assessment of NIST Programs and its panels. These individuals were chosen by the NRC for their technical expertise, their practical experience in running research programs, and their knowledge of industry's needs in basic measurements and standards. This assessment addresses the following: The technical merit of the laboratory programs relative to the state of the art worldwide; The effectiveness with which the laboratory programs are carried out and the results disseminated to their customers; The relevance of the laboratory programs to the needs of their customers; and The ability of the laboratories' facilities, equipment, and human resources to enable the laboratories to fulfill their mission and meet their customers' needs.