Optical Imaging And Metrology
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Optical Imaging And Metrology
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Author : Wolfgang Osten
language : en
Publisher: John Wiley & Sons
Release Date : 2012-09-10
Optical Imaging And Metrology written by Wolfgang Osten and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-10 with Science categories.
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Fringe 2013
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Author : Wolfgang Osten
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-08-15
Fringe 2013 written by Wolfgang Osten and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-08-15 with Technology & Engineering categories.
In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are: - New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution) - Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time) - High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano) - Hybrid technologies in Optical Imaging and Metrology (hybrid optics, sensor and data fusion, model-based solutions, multimodality) - New optical sensors, imaging and measurement systems (integrated, miniaturized, in-line, real-time, traceable, remote) Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.
Quantum Metrology Imaging And Communication
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Author : David S. Simon
language : en
Publisher: Springer
Release Date : 2016-11-02
Quantum Metrology Imaging And Communication written by David S. Simon and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-11-02 with Science categories.
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Handbook Of Optical Dimensional Metrology
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Author : Kevin Harding
language : en
Publisher: Taylor & Francis
Release Date : 2016-04-19
Handbook Of Optical Dimensional Metrology written by Kevin Harding and has been published by Taylor & Francis this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-04-19 with Science categories.
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Optical Imaging In Projection Microlithography
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Author : Alfred Kwok-Kit Wong
language : en
Publisher: SPIE Press
Release Date : 2005
Optical Imaging In Projection Microlithography written by Alfred Kwok-Kit Wong and has been published by SPIE Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with Technology & Engineering categories.
Here for the first time is an integrated mathematical view of the physics and numerical modeling of optical projection lithography that efficiently covers the full spectrum of the important concepts. Alfred Wong offers rigorous underpinning, clarity in systematic formulation, physical insight into emerging ideas, as well as a system level view of the parameter tolerances required in manufacturing. Readers with a good working knowledge of calculus can follow the step-by-step development, and technologists can gather general concepts and the key equations that result. Even the casual reader will gain a perspective on the key concepts, which will likely help facilitate dialog among technologists.
Optical Metrology
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Author : Kjell J. Gåsvik
language : en
Publisher: Wiley
Release Date : 2002-10-11
Optical Metrology written by Kjell J. Gåsvik and has been published by Wiley this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-10-11 with Technology & Engineering categories.
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.
Optical Imaging And Aberrations
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Author : Virendra N. Mahajan
language : en
Publisher: SPIE-International Society for Optical Engineering
Release Date : 2011
Optical Imaging And Aberrations written by Virendra N. Mahajan and has been published by SPIE-International Society for Optical Engineering this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with Aberration categories.
Ten years have passed since the publication of the first edition of this classic text in April 2001. Considerable new material amounting to 100 pages has been added in this second edition. Each chapter now contains a Summary section at the end. The new material in Chapter 4 consists of a detailed comparison of Gaussian apodization with a corresponding beam, determination of the optimum value of the Gaussian radius relative to that of the pupil to yield maximum focal-point irradiance, detailed discussion of standard deviation, aberration balancing, and Strehl ratio for primary aberrations, derivation of the aberration-free and defocused OTF, discussion of an aberrated beam yielding higher axial irradiance in a certain defocused region than its aberration-free focal-point value, illustration that aberrated PSFs lose the advantage of Gaussian apodizaton in reducing the secondary maxima of a PSF, and a brief description of the characterization of the width of a multimode beam. In Chapter 5, the effect of random longitudinal defocus on a PSF is included. The coherence length of atmospheric turbulence is calculated for looking both up and down through the atmosphere. Also discussed are the angle of arrival of a light wave propagating through turbulence, and lucky imaging where better-quality short-exposure images are selected, aligned, and added to obtain a high-quality image.
Advances In Optical Form And Coordinate Metrology
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Author : Richard Leach
language : en
Publisher:
Release Date : 2020
Advances In Optical Form And Coordinate Metrology written by Richard Leach and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020 with Metrology categories.
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Rgb Interferometry For Optical Metrology
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Author : Paul Kumar Upputuri
language : en
Publisher:
Release Date : 2019
Rgb Interferometry For Optical Metrology written by Paul Kumar Upputuri and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019 with Interferometry categories.
This Spotlight discusses the theoretical and experimental aspects of RGB interferometry. It also focuses on various advanced RGB interferometers and their applications for 3-D surface profiling, deformation measurements, non-destructive testing (NDT), refractive index profiling of biological cells/tissues, etc. RGB interferometry is a fast, simple, and cost-effective tool for optical metrology and imaging applications.
Advances In Optical Surface Texture Metrology
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Author : Richard Leach
language : en
Publisher: IOP Publishing Limited
Release Date : 2020-12-11
Advances In Optical Surface Texture Metrology written by Richard Leach and has been published by IOP Publishing Limited this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-12-11 with Science categories.
Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Key Features Cutting-edge advances in the field New ISO framework for calibration Includes advances in artificial intelligence Includes advances in in-process measurement