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Quantitative Image Analysis Of Microstructures


Quantitative Image Analysis Of Microstructures
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Quantitative Image Analysis Of Microstructures


Quantitative Image Analysis Of Microstructures
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Author : Hans Eckart Exner
language : en
Publisher: I R Publications, Limited
Release Date : 1988

Quantitative Image Analysis Of Microstructures written by Hans Eckart Exner and has been published by I R Publications, Limited this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Science categories.




Image Analysis Of Food Microstructure


Image Analysis Of Food Microstructure
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Author : John C Russ
language : en
Publisher: CRC Press
Release Date : 2019-08-30

Image Analysis Of Food Microstructure written by John C Russ and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-30 with categories.


Image Analysis of Food Microstructure offers a condensed guide to the most common procedures and techniques by which quantitative microstructural information about food can be obtained from images. The images are selected from a broad range of food items, including macroscopic images of meat and finished products such as pizza, and the microstructures of cheeses, dough and baked goods, ice cream, fruits and vegetables, emulsions, foams, and gels. The book informs food scientists about the image processing and measurement tools used to characterize a variety of microstructures in foods, using high-quality image techniques to illustrate chemical composition, thermo-mechanical processing, and genetic and structural properties. These different types of images used to measure various aspects of structure include: macroscopic light photography, confocal light microscopy, electron microscopy, atomic force microscope images, magnetic resonance, and computed tomography. Then the text explains how to interpret images to produce data, plot the results in different graphs, and identify trends. Examples using these image analysis techniques show typical results that researchers can expect and recreate. Image Analysis of Food Microstructure summarizes the basic procedures that can be useful in various aspects of food research, from nutraceuticals to cooking and food processing. It presents the processing of images and mathematical principles needed for image analyses in a step-by-step approach to extract key information from the images obtained.



Statistical Analysis Of Microstructures In Materials Science


Statistical Analysis Of Microstructures In Materials Science
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Author : Joachim Ohser
language : en
Publisher: John Wiley & Sons
Release Date : 2000-12-19

Statistical Analysis Of Microstructures In Materials Science written by Joachim Ohser and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-12-19 with Mathematics categories.


The investigation of the origin and formation of microstructures and the effect that microstructure has on the properties of materials are important issues in materials science and technology. Geometrical analysis is often the key to understanding the formation of microstructures and the resulting material properties. The authors make use of mathematical morphology, spatial statistics, image processing, stereology and stochastic geometry to analyze microstructures arising in materials science. * Quantitative microstructure analysis is one of the most successful experimental techniques in materials science * Uses examples to demonstrate the techniques * Program code included enables the reader to apply the numerous algorithms * Accessible to material scientists with limited statistical knowledge Primarily aimed at applied materials scientists, the book will also appeal to those working and researching in earth sciences, material technology, mineralogy, petrography, image analysis, cytology and biology.



Image Analysis In Earth Sciences


Image Analysis In Earth Sciences
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Author : Renée Heilbronner
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-07-03

Image Analysis In Earth Sciences written by Renée Heilbronner and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-07-03 with Science categories.


Image Analysis in Earth Sciences is a graduate level textbook for researchers and students interested in the quantitative microstructure and texture analysis of earth materials. Methods of analysis and applications are introduced using carefully worked examples. The input images are typically derived from earth materials, acquired at a wide range of scales, through digital photography, light and electron microscopy. The book focuses on image acquisition, pre- and post-processing, on the extraction of objects (segmentation), the analysis of volumes and grain size distributions, on shape fabric analysis (particle and surface fabrics) and the analysis of the frequency domain (FFT and ACF). The last chapters are dedicated to the analysis of crystallographic fabrics and orientation imaging. Throughout the book the free software Image SXM is used.



Practical Applications Of Quantitative Metallography


Practical Applications Of Quantitative Metallography
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Author : J. H. Steele
language : en
Publisher: ASTM International
Release Date : 1984

Practical Applications Of Quantitative Metallography written by J. H. Steele and has been published by ASTM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with Technology & Engineering categories.


An improved procedure based on the intercept method of measuring the grain size of single-phase microstructures has been developed that provides a quantitative description of the grain size yet is fast. The procedure combines the statistical advantage of using large numbers with the advantage of interpreting the data as a normal distribution, as verified by the chi square test. Application of the procedure to ferritic microstructures representative of best and worst case conditions indicates that accuracies on the order of 3 percent at a 95 percent confidence level can be achieved. In addition, the procedure is sensitive enough to distinguish a randomly mixed duplex grain structure. The measurements associated with a two-phase microstructure can be more precisely quantified through determination of volume fractions using a Pp measurement based on the use of an appropriate grid network, the coefficient of variation statistic, and the Poisson distribution. The analysis is demonstrated for an a priori system for which the percent accuracy and confidence level can be specified for the volume fraction measurement simply from calculation of the average value for Pp.



Image Based Fractal Description Of Microstructures


Image Based Fractal Description Of Microstructures
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Author : J.M. Li
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17

Image Based Fractal Description Of Microstructures written by J.M. Li and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Technology & Engineering categories.


Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes. This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book. Image-Based Fractal Description of Microstructures provides a comprehensive approach to materials characterization by fractal from theory to application.



Quantitative Microscopy And Image Analysis


Quantitative Microscopy And Image Analysis
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Author : David J. Diaz
language : en
Publisher: ASM International(OH)
Release Date : 1994

Quantitative Microscopy And Image Analysis written by David J. Diaz and has been published by ASM International(OH) this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Science categories.


Sponsored by Materials Characterization Committee of Materials Testing and Quality Control Division ASM Publication More precise data for quality control Accurate analysis of complex images Relationship between ultrasonic and metallographic measurements Correlation between 2- and 3- dimensional distributions. Sixteen selected papers examine theories, concepts and recent advances which will help you fill the need for more precise quality control and microstructure evaluation data through automatic image analysis. Computer-aided techniques now allow you to make fast, accurate quantification of morphological features recorded through optical metallography and scanning electron/transmission electron microscopy. Learn how accurate, reproducible measurements are being made from complex images which were previously difficult to analyze. Visual assessment of global properties and correlation with ultrasonic measurements are discussed. Subjects include: Mathematical Morphology Processing, Scanning Probe Microscopy, Infrared Sensing of Weld Penetration, Stereology of Anisotropic Microstructures Digital X-Ray Mapping.



The Quantitative Description Of The Microstructure Of Materials


The Quantitative Description Of The Microstructure Of Materials
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Author : Krzysztof Jan Kurzydlowski
language : en
Publisher: CRC Press
Release Date : 1995-07-21

The Quantitative Description Of The Microstructure Of Materials written by Krzysztof Jan Kurzydlowski and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-07-21 with Technology & Engineering categories.


This book, the product of a deep collaboration between the two authors, strikes a balance between the traditional approach and newly emerging techniques used to obtain a quantitative description of the microstructure of materials. The Quantitative Description of the Microstructure of Materials has a unique format that sets it apart from other books. The first half of the book gives a comprehensive account of the entire quantification process and presents material in a pedagogical style. Numerous examples appear throughout text to illustrate the methodology. A general introduction to the subject and basic concepts, definitions, techniques, and relationships are provided. Aspects of modern stereology are described in detail. Image processing, computer aided procedures of data analysis, and the elements of a system for image analysis also are discussed at length. The remaining chapters treat a series of significant examples in much more detail. This part of text offers information in an easy-to-access reference style, making it extremely useful as a guide to active researchers in the quantification guide. Topics include dislocations, internal and external surfaces, and quantitative characterization of thin film structures. The book covers geometry of grains and its effect on the properties of polycrystals. Particles, pores, and other isolated volumetric elements of the microstructure also are discussed.



Defect Recognition And Image Processing In Semiconductors 1997


Defect Recognition And Image Processing In Semiconductors 1997
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Author : J. Doneker
language : en
Publisher: Routledge
Release Date : 2017-11-22

Defect Recognition And Image Processing In Semiconductors 1997 written by J. Doneker and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-11-22 with Science categories.


Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.



Practical Guide To Image Analysis


Practical Guide To Image Analysis
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Author : ASM International
language : en
Publisher: ASM International(OH)
Release Date : 2000

Practical Guide To Image Analysis written by ASM International and has been published by ASM International(OH) this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Science categories.


Nine international specialists contribute information about the use of image analysis procedures to evaluate microstructural features. Coverage includes an historical overview of how quantitative image analysis developed; the evolution of current television computer-based analysis systems; the scien