Test Symposium 2006 Ats 06 15th Asian
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Test Symposium 2006 Ats 06 15th Asian
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Author : Oscar Wilde
language : en
Publisher:
Release Date : 2006
Test Symposium 2006 Ats 06 15th Asian written by Oscar Wilde and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with categories.
Asian Test Symposium
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Author :
language : en
Publisher:
Release Date : 2005
Asian Test Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with Electronic circuits categories.
Component Reliability For Electronic Systems
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Author : Titu I. Băjenescu
language : en
Publisher: Artech House
Release Date : 2010
Component Reliability For Electronic Systems written by Titu I. Băjenescu and has been published by Artech House this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Technology & Engineering categories.
The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.
Systems Cybernetics And Innovations
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Author : Matjaž Mulej
language : en
Publisher: Emerald Group Publishing
Release Date : 2006
Systems Cybernetics And Innovations written by Matjaž Mulej and has been published by Emerald Group Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with Cybernetics categories.
This e-book is a compilation of selected papers on the theme of "Systems, cybernetics and innovation" from the 13th International Congress of the World Organization of Systems and Cybernetics (WOSC), Slovenia, July 2005 and is guest edited by Professor Matjaz Mulej, University of Maribor. The articles present research and development in a number of areas: Artificial-Natural Dualism; Economic Systems; Education Systems; Engineering and Information Systems; Grey Systems; Management Systems; Mathematical Systems; Nature Systems; Tourism Cybernetics; Viable Organizations; and World Education Syste
Test And Diagnosis For Small Delay Defects
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Author : Mohammad Tehranipoor
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-09-08
Test And Diagnosis For Small Delay Defects written by Mohammad Tehranipoor and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-09-08 with Technology & Engineering categories.
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Nanometer Technology Designs
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Author : Nisar Ahmed
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-02-26
Nanometer Technology Designs written by Nisar Ahmed and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-02-26 with Technology & Engineering categories.
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
Test Pattern Generation Using Boolean Proof Engines
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Author : Rolf Drechsler
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-04-22
Test Pattern Generation Using Boolean Proof Engines written by Rolf Drechsler and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-04-22 with Technology & Engineering categories.
In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
Vlsi Design And Test
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Author : Anirban Sengupta
language : en
Publisher: Springer
Release Date : 2019-08-17
Vlsi Design And Test written by Anirban Sengupta and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-17 with Computers categories.
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Multi Run Memory Tests For Pattern Sensitive Faults
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Author : Ireneusz Mrozek
language : en
Publisher: Springer
Release Date : 2018-07-06
Multi Run Memory Tests For Pattern Sensitive Faults written by Ireneusz Mrozek and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-06 with Technology & Engineering categories.
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Design For Testability Debug And Reliability
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Author : Sebastian Huhn
language : en
Publisher: Springer Nature
Release Date : 2021-04-19
Design For Testability Debug And Reliability written by Sebastian Huhn and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-04-19 with Technology & Engineering categories.
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
