Workshop On The Physics And Modeling Of Submicron Structures
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Workshop On The Physics And Modeling Of Submicron Structures
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Author : Karl Hess
language : en
Publisher:
Release Date : 1983
Workshop On The Physics And Modeling Of Submicron Structures written by Karl Hess and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1983 with categories.
A Workshop on the Physics and Modeling of Submicron Structures has been held. The results and lectures of the Workshop are briefly described.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1995-05
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-05 with Aeronautics categories.
Atti Del Xvii Convegno Nazionale Del Gruppo Italiano Frattura
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Author :
language : en
Publisher: Gruppo Italiano Frattura
Release Date :
Atti Del Xvii Convegno Nazionale Del Gruppo Italiano Frattura written by and has been published by Gruppo Italiano Frattura this book supported file pdf, txt, epub, kindle and other format this book has been release on with categories.
High Speed Heterostructure Devices
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Author : Patrick Roblin
language : en
Publisher: Cambridge University Press
Release Date : 2002-03-07
High Speed Heterostructure Devices written by Patrick Roblin and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-03-07 with Technology & Engineering categories.
Fuelled by rapid growth in communications technology, silicon heterostructures and related high-speed semiconductors are spearheading the drive toward smaller, faster and lower power devices. High-Speed Heterostructure Devices is a textbook on modern high-speed semiconductor devices intended for both graduate students and practising engineers. This book is concerned with the underlying physics of heterostructures as well as some of the most recent techniques for modeling and simulating these devices. Emphasis is placed on heterostructure devices of the immediate future such as the MODFET, HBT and RTD. The principles of operation of other devices such as the Bloch Oscillator, RITD, Gunn diode, quantum cascade laser and SOI and LD MOSFETs are also introduced. Initially developed for a graduate course taught at Ohio State University, the book comes with a complete set of homework problems and a web link to MATLAB programs supporting the lecture material.
Government Reports Announcements Index
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Author :
language : en
Publisher:
Release Date : 1993-10
Government Reports Announcements Index written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993-10 with Science categories.
Government Reports Annual Index
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Author :
language : en
Publisher:
Release Date : 1984
Government Reports Annual Index written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with Government reports announcements & index categories.
Reliability Prediction For Microelectronics
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Author : Joseph B. Bernstein
language : en
Publisher: John Wiley & Sons
Release Date : 2024-02-13
Reliability Prediction For Microelectronics written by Joseph B. Bernstein and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-02-13 with Technology & Engineering categories.
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Energy Research Abstracts
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Author :
language : en
Publisher:
Release Date : 1990
Energy Research Abstracts written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Power resources categories.
Istfa 2013
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Author : A. S. M. International
language : en
Publisher: ASM International
Release Date : 2013-01-01
Istfa 2013 written by A. S. M. International and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-01-01 with Technology & Engineering categories.
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
February 16
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Author : Görlich
language : en
Publisher: Walter de Gruyter GmbH & Co KG
Release Date : 2022-01-19
February 16 written by Görlich and has been published by Walter de Gruyter GmbH & Co KG this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-01-19 with Science categories.
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