Circuit Design For Reliability
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Circuit Design For Reliability
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Author : Ricardo Reis
language : en
Publisher: Springer
Release Date : 2014-11-08
Circuit Design For Reliability written by Ricardo Reis and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-11-08 with Technology & Engineering categories.
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
Integrated Circuit Quality And Reliability
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Author : Eugene R. Hnatek
language : en
Publisher: CRC Press
Release Date : 2018-10-03
Integrated Circuit Quality And Reliability written by Eugene R. Hnatek and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-03 with Technology & Engineering categories.
Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.
Integrated Circuit Quality And Reliability
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Author : Eugene R. Hnatek
language : en
Publisher:
Release Date : 1987
Integrated Circuit Quality And Reliability written by Eugene R. Hnatek and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Technology & Engineering categories.
Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.
Design For Testability Debug And Reliability
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Author : Sebastian Huhn
language : en
Publisher: Springer Nature
Release Date : 2021-04-19
Design For Testability Debug And Reliability written by Sebastian Huhn and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-04-19 with Technology & Engineering categories.
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
Reliability Engineering For Electronic Design
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Author : Norman Fuqua
language : en
Publisher: CRC Press
Release Date : 2020-11-25
Reliability Engineering For Electronic Design written by Norman Fuqua and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-25 with Technology & Engineering categories.
This book addresses the needs of electronic design engineers, reliability engineers, and their respective managers, stressing a pragmatic viewpoint rather than a vigorous mathematical presentation.
Fundamentals Of Electromigration Aware Integrated Circuit Design
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Author : Jens Lienig
language : en
Publisher: Springer Nature
Release Date : 2025-02-25
Fundamentals Of Electromigration Aware Integrated Circuit Design written by Jens Lienig and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-02-25 with Technology & Engineering categories.
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
Hot Carrier Reliability Of Mos Vlsi Circuits
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Author : Yusuf Leblebici
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Hot Carrier Reliability Of Mos Vlsi Circuits written by Yusuf Leblebici and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits. Hot-carrier induced degrada tion of MOS transistor characteristics is one of the primary mechanisms affecting the long-term reliability of MOS VLSI circuits. It is likely to become even more important in future generation chips, since the down ward scaling of transistor dimensions without proportional scaling of the operating voltage aggravates this problem. A thorough understanding of the physical mechanisms leading to hot-carrier related degradation of MOS transistors is a prerequisite for accurate circuit reliability evaluation. It is also being recognized that important reliability concerns other than the post-manufacture reliability qualification need to be addressed rigorously early in the design phase. The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits. If the predicted reliability does not satisfy the requirements, appropriate design modifications may be carried out to improve the resistance of the devices to degradation.
Reliability By Design
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Author : A. C. Brombacher
language : en
Publisher:
Release Date : 1992-05-18
Reliability By Design written by A. C. Brombacher and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992-05-18 with Technology & Engineering categories.
Describes a method tested on three practical circuits--two switch mode power supplies and one motordrive--to use in reliably assessing the design process of electronic systems and circuits, focusing on high-volume consumer electronics. Coverage includes the development of susceptibility models for practical components such as the medium power Schottky diode, a high-voltage bipolar transistor and an integrated circuit; the use of stressor/susceptibility models in analyzing practical circuits; a technique for using stressor/susceptibility interaction in circuit optimization and much more.
Integrated Circuit Hybrid And Multichip Module Package Design Guidelines
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Author : Michael G. Pecht
language : en
Publisher: John Wiley & Sons
Release Date : 1994-03-31
Integrated Circuit Hybrid And Multichip Module Package Design Guidelines written by Michael G. Pecht and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-03-31 with Technology & Engineering categories.
Circuit designers, packaging engineers, printed board fabricators, and procurement personnel will find this book's microelectronic package design-for-reliability guidelines and approaches essential for achieving their life-cycle, cost-effectiveness, and on-time delivery goals. Its uniquely organized, time-phased approach to design, development, qualification, manufacture, and in-service management shows you step-by-step how to: Define realistic system requirements in terms of mission profile, operating life, performance expectations, size, weight, and cost Define the system usage environment so that all operating, shipping, and storage conditions, including electrical, thermal, radiation, and mechanical loads, are assessed using realistic data Identify potential failure modes, sites, mechanisms, and architecture-stress interactions--PLUS appropriate measures you can take to reduce, eliminate, or accommodate expected failures Characterize materials and processes by the key controllable factors, such as types and levels of defects, variations in material properties and dimensions, and the manufacturing and assembly processes involved Use experiment, step-stress, and accelerated methods to ensure optimum design before production begins Detailed design guidelines for substrate...wire and wire, tape automated, and flip-chip bonding...element attachment and case, lead, lead and lid seals--incorporating dimensional and geometric configurations of package elements, manufacturing and assembly conditions, materials selection, and loading conditions--round out this guide's comprehensive coverage. Detailed guidelines for substrate...wire and wire, tape automated, and flip-chip bonding...element attachment and case, lead, lead and lid seals--incorporating dimensional and geometric configurations of package elements, manufacturing and assembly conditions, materials selection, and loading conditions--round out this guide's comprehensive coverage.
Soft Error Reliability Of Vlsi Circuits
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Author : Behnam Ghavami
language : en
Publisher: Springer Nature
Release Date : 2020-10-13
Soft Error Reliability Of Vlsi Circuits written by Behnam Ghavami and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-10-13 with Technology & Engineering categories.
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.