Circuit Design For Reliability
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Circuit Design For Reliability
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Author : Ricardo Reis
language : en
Publisher: Springer
Release Date : 2014-11-08
Circuit Design For Reliability written by Ricardo Reis and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-11-08 with Technology & Engineering categories.
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
Cmos Rf Circuit Design For Reliability And Variability
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Author : Jiann-Shiun Yuan
language : en
Publisher: Springer
Release Date : 2016-04-13
Cmos Rf Circuit Design For Reliability And Variability written by Jiann-Shiun Yuan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-04-13 with Technology & Engineering categories.
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
Fundamentals Of Electromigration Aware Integrated Circuit Design
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Author : Jens Lienig
language : en
Publisher: Springer
Release Date : 2018-02-23
Fundamentals Of Electromigration Aware Integrated Circuit Design written by Jens Lienig and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-02-23 with Technology & Engineering categories.
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
Design Of Systems And Circuits For Maximum Reliability Or Maximum Production Yield
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Author : Peter W. Becker
language : en
Publisher: McGraw-Hill Companies
Release Date : 1977
Design Of Systems And Circuits For Maximum Reliability Or Maximum Production Yield written by Peter W. Becker and has been published by McGraw-Hill Companies this book supported file pdf, txt, epub, kindle and other format this book has been release on 1977 with Electronic apparatus and appliances categories.
Design For Testability Debug And Reliability
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Author : Sebastian Huhn
language : en
Publisher: Springer Nature
Release Date : 2021-04-19
Design For Testability Debug And Reliability written by Sebastian Huhn and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-04-19 with Technology & Engineering categories.
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
Reliability Of Nanoscale Circuits And Systems
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Author : Miloš Stanisavljević
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-10-20
Reliability Of Nanoscale Circuits And Systems written by Miloš Stanisavljević and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-10-20 with Technology & Engineering categories.
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
Design Of Systems And Circuits For Maximum Reliability Or Maximum Production Yield
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Author : Peter W. Becker
language : en
Publisher:
Release Date : 1977
Design Of Systems And Circuits For Maximum Reliability Or Maximum Production Yield written by Peter W. Becker and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1977 with Electronic circuit design categories.
Lifetime Reliability Aware Design Of Integrated Circuits
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Author : Mohsen Raji
language : en
Publisher: Springer Nature
Release Date : 2022-11-16
Lifetime Reliability Aware Design Of Integrated Circuits written by Mohsen Raji and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-11-16 with Technology & Engineering categories.
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Integrated Circuit Quality And Reliability
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Author : Eugene R. Hnatek
language : en
Publisher:
Release Date : 1987
Integrated Circuit Quality And Reliability written by Eugene R. Hnatek and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Technology & Engineering categories.
Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.
Practical Electronic Reliability Engineering
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Author : Jerome Klion
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Practical Electronic Reliability Engineering written by Jerome Klion and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
This book is intended for the engineer or engineering student with little or no prior background in reliability. Its purpose is to provide the background material and guidance necessary to comprehend and carry out all the tasks associated with a reliability program from specification generation to final demonstration of reliability achieved. Most available texts on reliability concentrate on the mathematics and statistics used for reliability analysis, evaluation, and demonstration. They are more often suited more for the professional with a heavier mathematical background that most engineers have, and more often than not, ignore or pay short-shrift to basic engineering design and organizational efforts associated with a reliability program. A reliability engineer must be familiar with both the mathematics and engineering aspects of a reliability program. This text: 1. Describes the mathematics needed for reliability analysis, evaluation, and demonstration commensurate with an engineer's background. 2. Provides background material, guidance, and references necessary to the structure and implementation of a reliability program including: • identification of the reliability standards in most common use • how to generate and respond to a reliability specification • how reliability can be increased • the tasks which make up a reliability program and how to judge the need and scope of each; how each is commonly performed; caution and comments about their application.