Digital Circuit Testing
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Digital Circuit Testing
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Author : Francis C. Wong
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Digital Circuit Testing written by Francis C. Wong and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
An Introduction To Logic Circuit Testing
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Author : Parag K. Lala
language : en
Publisher: Morgan & Claypool Publishers
Release Date : 2009
An Introduction To Logic Circuit Testing written by Parag K. Lala and has been published by Morgan & Claypool Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with Computers categories.
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Testing Of Digital Systems
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Author : N. K. Jha
language : en
Publisher: Cambridge University Press
Release Date : 2003-05-08
Testing Of Digital Systems written by N. K. Jha and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-05-08 with Computers categories.
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Random Testing Of Digital Circuits
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Author : Rene David
language : en
Publisher: CRC Press
Release Date : 2020-11-26
Random Testing Of Digital Circuits written by Rene David and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-26 with Technology & Engineering categories.
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Digital Logic Testing And Simulation
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Author : Alexander Miczo
language : en
Publisher: Wiley
Release Date : 1985-12
Digital Logic Testing And Simulation written by Alexander Miczo and has been published by Wiley this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985-12 with categories.
The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers designers and test engineers unique coverage of circuit design for testability, stressing the incorporation of hardware into designs that facilitate testing and diagnosis by allowing greater access to internal circuits. Examines various ways of representing a design, as well as external testing methods that apply this information.
Digital Circuit Testing And Testability
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Author : Parag K. Lala
language : en
Publisher: Academic Press
Release Date : 1997
Digital Circuit Testing And Testability written by Parag K. Lala and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with Computers categories.
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits
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Author : M. Bushnell
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-11
Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits written by M. Bushnell and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-11 with Technology & Engineering categories.
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Testing Digital Circuits
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Author : B. R. Wilkins
language : en
Publisher: John Wiley & Sons
Release Date : 1986
Testing Digital Circuits written by B. R. Wilkins and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Digital electronics categories.
Testing Digital Circuits
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Author : Brian Richard Wilkins
language : en
Publisher:
Release Date : 1994
Testing Digital Circuits written by Brian Richard Wilkins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Digital electronics categories.
Vlsi Testing
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Author : Stanley Leonard Hurst
language : en
Publisher: IET
Release Date : 1998
Vlsi Testing written by Stanley Leonard Hurst and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Computers categories.
Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR