Sequential Logic Testing And Verification
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Sequential Logic Testing And Verification
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Author : Abhijit Ghosh
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Sequential Logic Testing And Verification written by Abhijit Ghosh and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance.
Sequential Logic Testing And Verification
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Author : Abhijit Ghosh
language : en
Publisher:
Release Date : 1991-11-30
Sequential Logic Testing And Verification written by Abhijit Ghosh and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-11-30 with categories.
Computer Logic Testing And Verification
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Author : John Paul Roth
language : en
Publisher: Springer
Release Date : 1980
Computer Logic Testing And Verification written by John Paul Roth and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with Computers categories.
Testing And Diagnosis Of Vlsi And Ulsi
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Author : F. Lombardi
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Testing And Diagnosis Of Vlsi And Ulsi written by F. Lombardi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
An Introduction To Logic Circuit Testing
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Author : Parag K. Lala
language : en
Publisher: Springer Nature
Release Date : 2022-06-01
An Introduction To Logic Circuit Testing written by Parag K. Lala and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-06-01 with Technology & Engineering categories.
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Digital Logic Testing And Simulation
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Author : Alexander Miczo
language : en
Publisher: John Wiley & Sons
Release Date : 2003-10-24
Digital Logic Testing And Simulation written by Alexander Miczo and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-10-24 with Technology & Engineering categories.
Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Logic Verification And Test Generation For Vlsi Circuits
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Author : Ruey-sing Wei
language : en
Publisher:
Release Date : 1986
Logic Verification And Test Generation For Vlsi Circuits written by Ruey-sing Wei and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with categories.
Iddq Testing Of Vlsi Circuits
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Author : Ravi K. Gulati
language : en
Publisher: Springer Science & Business Media
Release Date : 1992-12-31
Iddq Testing Of Vlsi Circuits written by Ravi K. Gulati and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992-12-31 with Computers categories.
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.
Verification Techniques For System Level Design
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Author : Masahiro Fujita
language : en
Publisher: Morgan Kaufmann
Release Date : 2010-07-27
Verification Techniques For System Level Design written by Masahiro Fujita and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-27 with Computers categories.
This book will explain how to verify SoC (Systems on Chip) logic designs using "formal and "semiformal verification techniques. The critical issue to be addressed is whether the functionality of the design is the one that the designers intended. Simulation has been used for checking the correctness of SoC designs (as in "functional verification), but many subtle design errors cannot be caught by simulation. Recently, formal verification, giving mathematical proof of the correctness of designs, has been gaining popularity.For higher design productivity, it is essential to debug designs as early as possible, which this book facilitates. This book covers all aspects of high-level formal and semiformal verification techniques for system level designs.• First book that covers all aspects of formal and semiformal, high-level (higher than RTL) design verification targeting SoC designs.• Formal verification of high-level designs (RTL or higher).• Verification techniques are discussed with associated system-level design methodology.
Eda For Ic System Design Verification And Testing
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Author : Louis Scheffer
language : en
Publisher: CRC Press
Release Date : 2018-10-03
Eda For Ic System Design Verification And Testing written by Louis Scheffer and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-03 with Technology & Engineering categories.
Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.