Testing And Reliable Design Of Cmos Circuits

DOWNLOAD

Download Testing And Reliable Design Of Cmos Circuits PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Testing And Reliable Design Of Cmos Circuits book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page

Testing And Reliable Design Of Cmos Circuits

DOWNLOAD
Author : Niraj K. Jha
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Testing And Reliable Design Of Cmos Circuits written by Niraj K. Jha and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.

In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.

Cmos Electronics

DOWNLOAD
Author : Jaume Segura
language : en
Publisher: John Wiley & Sons
Release Date : 2004-03-26

Cmos Electronics written by Jaume Segura and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-03-26 with Technology & Engineering categories.

CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.

On Reliable Design Of Cmos Circuits

DOWNLOAD
Author : Sivaramakrishnan Subramanian
language : en
Publisher:
Release Date : 1992

On Reliable Design Of Cmos Circuits written by Sivaramakrishnan Subramanian and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Electrical engineering categories.

Techniques for hierarchical design of self-checking CMOS VLSIcircuits and BIST implementation for sequential VLSI circuits are presented.

Cmos Sram Circuit Design And Parametric Test In Nano Scaled Technologies

DOWNLOAD
Author : Andrei Pavlov
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-06-01

Cmos Sram Circuit Design And Parametric Test In Nano Scaled Technologies written by Andrei Pavlov and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-06-01 with Technology & Engineering categories.

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Cmos Test And Evaluation

DOWNLOAD
Author : Manjul Bhushan
language : en
Publisher: Springer
Release Date : 2014-12-03

Cmos Test And Evaluation written by Manjul Bhushan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-12-03 with Technology & Engineering categories.

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Circuit Design For Cmos Vlsi

DOWNLOAD
Author : John P. Uyemura
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Circuit Design For Cmos Vlsi written by John P. Uyemura and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

During the last decade, CMOS has become increasingly attractive as a basic integrated circuit technology due to its low power (at moderate frequencies), good scalability, and rail-to-rail operation. There are now a variety of CMOS circuit styles, some based on static complementary con ductance properties, but others borrowing from earlier NMOS techniques and the advantages of using clocking disciplines for precharge-evaluate se quencing. In this comprehensive book, the reader is led systematically through the entire range of CMOS circuit design. Starting with the in dividual MOSFET, basic circuit building blocks are described, leading to a broad view of both combinatorial and sequential circuits. Once these circuits are considered in the light of CMOS process technologies, impor tant topics in circuit performance are considered, including characteristics of interconnect, gate delay, device sizing, and I/O buffering. Basic circuits are then composed to form macro elements such as multipliers, where the reader acquires a unified view of architectural performance through par allelism, and circuit performance through careful attention to circuit-level and layout design optimization. Topics in analog circuit design reflect the growing tendency for both analog and digital circuit forms to be combined on the same chip, and a careful treatment of BiCMOS forms introduces the reader to the combination of both FET and bipolar technologies on the same chip to provide improved performance.

Testing And Design For Testability Of Cmos Logic Circuits

DOWNLOAD
Author : Qiao Tong
language : en
Publisher:
Release Date : 1990

Testing And Design For Testability Of Cmos Logic Circuits written by Qiao Tong and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with categories.

Iddq Testing Of Vlsi Circuits

DOWNLOAD
Author : Ravi K. Gulati
language : en
Publisher: Springer Science & Business Media
Release Date : 1992-12-31

Iddq Testing Of Vlsi Circuits written by Ravi K. Gulati and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992-12-31 with Computers categories.

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.

Cmos

DOWNLOAD
Author : R. Jacob Baker
language : en
Publisher: John Wiley & Sons
Release Date : 2008

Cmos written by R. Jacob Baker and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with Technology & Engineering categories.

This edition provides an important contemporary view of a wide range of analog/digital circuit blocks, the BSIM model, data converter architectures, and more. The authors develop design techniques for both long- and short-channel CMOS technologies and then compare the two.

Cmos Logic Circuit Design

DOWNLOAD
Author : John P. Uyemura
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-05-08

Cmos Logic Circuit Design written by John P. Uyemura and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-05-08 with Technology & Engineering categories.

This is an up-to-date treatment of the analysis and design of CMOS integrated digital logic circuits. The self-contained book covers all of the important digital circuit design styles found in modern CMOS chips, emphasizing solving design problems using the various logic styles available in CMOS.